High temperature Langmuir vaporization mass spectrometer
A high temperature Langmuir vaporization mass spectrometer (HTMS) for the analysis of solid and molten materials from room temperature up to 1700 °C was designed, built, and tested. Volatilizing species are analyzed by electron impact (EI) and by surface ionization (SI) modes. Non-volatile surface s...
Gespeichert in:
| Veröffentlicht in: | International journal of mass spectrometry 2003-02, Vol.225 (1), p.1-10 |
|---|---|
| Hauptverfasser: | , , , |
| Format: | Artikel |
| Sprache: | eng |
| Schlagworte: | |
| Online-Zugang: | Volltext |
| Tags: |
Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
|
| container_end_page | 10 |
|---|---|
| container_issue | 1 |
| container_start_page | 1 |
| container_title | International journal of mass spectrometry |
| container_volume | 225 |
| creator | Delmore, J.E. Kessinger, G.F. Dahl, D.A. Olson, J.E. |
| description | A high temperature Langmuir vaporization mass spectrometer (HTMS) for the analysis of solid and molten materials from room temperature up to 1700
°C was designed, built, and tested. Volatilizing species are analyzed by electron impact (EI) and by surface ionization (SI) modes. Non-volatile surface species are analyzed by the static secondary ion mass spectrometry (SIMS) mode. In addition, it is equipped with an Ar
+ dynamic SIMS gun for an elemental analysis mode and for sample cleaning. The ion source has a unified design so a single sample can be analyzed by EI, SI or SIMS modes in rapid sequence at constant or variable temperatures. The instrument and data system were designed with particular emphasis placed on the ability of the instrument to perform EI ionization of neutral species prior to condensation and reactive species prior to reaction, and on giving the user the ability to correlate data from different ionization modes with changing sample chemistry. The HTMS has been successfully applied to the analysis of ion-emitting molten glasses. Large samples mounted in small rhenium tubes have been studied at temperatures up to 1150
°C, while smaller samples on flat rhenium filaments have been analyzed at temperatures as high as 1700
°C. |
| doi_str_mv | 10.1016/S1387-3806(02)01001-1 |
| format | Article |
| fullrecord | <record><control><sourceid>elsevier_osti_</sourceid><recordid>TN_cdi_osti_scitechconnect_912097</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><els_id>S1387380602010011</els_id><sourcerecordid>S1387380602010011</sourcerecordid><originalsourceid>FETCH-LOGICAL-c333t-6d2ed485800d0c843c2fae729c4f2b37f5b1d07e6412888a5cb4a9efd1a66e163</originalsourceid><addsrcrecordid>eNqFkM1OwzAQhC0EEqXwCEjhBofArp3Yzgmhij-pEgfgbLnOpjUiSWW7leDpSVo4c9o5zHzaGcbOEa4RUN68otAqFxrkJfArQADM8YBNUCuRc1Xpw0H_WY7ZSYwfAKBEKSdMP_nlKkvUrinYtAmUzW23bDc-ZFu77oP_tsn3XdbaGLO4JpdC31KicMqOGvsZ6ez3Ttn7w_3b7Cmfvzw-z-7muRNCpFzWnOpClxqgBqcL4XhjSfHKFQ1fCNWUC6xBkSyQa61t6RaFraip0UpJKMWUXey5fUzeROcTuZXru254xVTIoVKDp9x7XOhjDNSYdfCtDV8GwYwTmd1EZuxvgJvdRAaH3O0-R0OBracw8qlzVPsw4uve_0P4ATsGbgc</addsrcrecordid><sourcetype>Open Access Repository</sourcetype><iscdi>true</iscdi><recordtype>article</recordtype></control><display><type>article</type><title>High temperature Langmuir vaporization mass spectrometer</title><source>ScienceDirect Journals (5 years ago - present)</source><creator>Delmore, J.E. ; Kessinger, G.F. ; Dahl, D.A. ; Olson, J.E.</creator><creatorcontrib>Delmore, J.E. ; Kessinger, G.F. ; Dahl, D.A. ; Olson, J.E. ; Idaho National Laboratory (INL)</creatorcontrib><description>A high temperature Langmuir vaporization mass spectrometer (HTMS) for the analysis of solid and molten materials from room temperature up to 1700
°C was designed, built, and tested. Volatilizing species are analyzed by electron impact (EI) and by surface ionization (SI) modes. Non-volatile surface species are analyzed by the static secondary ion mass spectrometry (SIMS) mode. In addition, it is equipped with an Ar
+ dynamic SIMS gun for an elemental analysis mode and for sample cleaning. The ion source has a unified design so a single sample can be analyzed by EI, SI or SIMS modes in rapid sequence at constant or variable temperatures. The instrument and data system were designed with particular emphasis placed on the ability of the instrument to perform EI ionization of neutral species prior to condensation and reactive species prior to reaction, and on giving the user the ability to correlate data from different ionization modes with changing sample chemistry. The HTMS has been successfully applied to the analysis of ion-emitting molten glasses. Large samples mounted in small rhenium tubes have been studied at temperatures up to 1150
°C, while smaller samples on flat rhenium filaments have been analyzed at temperatures as high as 1700
°C.</description><identifier>ISSN: 1387-3806</identifier><identifier>EISSN: 1873-2798</identifier><identifier>DOI: 10.1016/S1387-3806(02)01001-1</identifier><language>eng</language><publisher>United States: Elsevier B.V</publisher><subject>CHEMISTRY ; CLEANING ; DESIGN ; Electron bombardment ; ELECTRONS ; EVAPORATION ; GENERAL AND MISCELLANEOUS//MATHEMATICS, COMPUTING, AND INFORMATION SCIENCE ; High temperature mass spectrometry ; ION SOURCES ; IONIZATION ; Langmuir vaporization ; MASS SPECTROMETERS ; MASS SPECTROSCOPY ; RHENIUM ; SIMS ; SURFACE IONIZATION</subject><ispartof>International journal of mass spectrometry, 2003-02, Vol.225 (1), p.1-10</ispartof><rights>2002 Elsevier Science B.V.</rights><lds50>peer_reviewed</lds50><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-c333t-6d2ed485800d0c843c2fae729c4f2b37f5b1d07e6412888a5cb4a9efd1a66e163</citedby><cites>FETCH-LOGICAL-c333t-6d2ed485800d0c843c2fae729c4f2b37f5b1d07e6412888a5cb4a9efd1a66e163</cites></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://dx.doi.org/10.1016/S1387-3806(02)01001-1$$EHTML$$P50$$Gelsevier$$H</linktohtml><link.rule.ids>230,314,780,784,885,3550,27924,27925,45995</link.rule.ids><backlink>$$Uhttps://www.osti.gov/biblio/912097$$D View this record in Osti.gov$$Hfree_for_read</backlink></links><search><creatorcontrib>Delmore, J.E.</creatorcontrib><creatorcontrib>Kessinger, G.F.</creatorcontrib><creatorcontrib>Dahl, D.A.</creatorcontrib><creatorcontrib>Olson, J.E.</creatorcontrib><creatorcontrib>Idaho National Laboratory (INL)</creatorcontrib><title>High temperature Langmuir vaporization mass spectrometer</title><title>International journal of mass spectrometry</title><description>A high temperature Langmuir vaporization mass spectrometer (HTMS) for the analysis of solid and molten materials from room temperature up to 1700
°C was designed, built, and tested. Volatilizing species are analyzed by electron impact (EI) and by surface ionization (SI) modes. Non-volatile surface species are analyzed by the static secondary ion mass spectrometry (SIMS) mode. In addition, it is equipped with an Ar
+ dynamic SIMS gun for an elemental analysis mode and for sample cleaning. The ion source has a unified design so a single sample can be analyzed by EI, SI or SIMS modes in rapid sequence at constant or variable temperatures. The instrument and data system were designed with particular emphasis placed on the ability of the instrument to perform EI ionization of neutral species prior to condensation and reactive species prior to reaction, and on giving the user the ability to correlate data from different ionization modes with changing sample chemistry. The HTMS has been successfully applied to the analysis of ion-emitting molten glasses. Large samples mounted in small rhenium tubes have been studied at temperatures up to 1150
°C, while smaller samples on flat rhenium filaments have been analyzed at temperatures as high as 1700
°C.</description><subject>CHEMISTRY</subject><subject>CLEANING</subject><subject>DESIGN</subject><subject>Electron bombardment</subject><subject>ELECTRONS</subject><subject>EVAPORATION</subject><subject>GENERAL AND MISCELLANEOUS//MATHEMATICS, COMPUTING, AND INFORMATION SCIENCE</subject><subject>High temperature mass spectrometry</subject><subject>ION SOURCES</subject><subject>IONIZATION</subject><subject>Langmuir vaporization</subject><subject>MASS SPECTROMETERS</subject><subject>MASS SPECTROSCOPY</subject><subject>RHENIUM</subject><subject>SIMS</subject><subject>SURFACE IONIZATION</subject><issn>1387-3806</issn><issn>1873-2798</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2003</creationdate><recordtype>article</recordtype><recordid>eNqFkM1OwzAQhC0EEqXwCEjhBofArp3Yzgmhij-pEgfgbLnOpjUiSWW7leDpSVo4c9o5zHzaGcbOEa4RUN68otAqFxrkJfArQADM8YBNUCuRc1Xpw0H_WY7ZSYwfAKBEKSdMP_nlKkvUrinYtAmUzW23bDc-ZFu77oP_tsn3XdbaGLO4JpdC31KicMqOGvsZ6ez3Ttn7w_3b7Cmfvzw-z-7muRNCpFzWnOpClxqgBqcL4XhjSfHKFQ1fCNWUC6xBkSyQa61t6RaFraip0UpJKMWUXey5fUzeROcTuZXru254xVTIoVKDp9x7XOhjDNSYdfCtDV8GwYwTmd1EZuxvgJvdRAaH3O0-R0OBracw8qlzVPsw4uve_0P4ATsGbgc</recordid><startdate>20030201</startdate><enddate>20030201</enddate><creator>Delmore, J.E.</creator><creator>Kessinger, G.F.</creator><creator>Dahl, D.A.</creator><creator>Olson, J.E.</creator><general>Elsevier B.V</general><scope>AAYXX</scope><scope>CITATION</scope><scope>OTOTI</scope></search><sort><creationdate>20030201</creationdate><title>High temperature Langmuir vaporization mass spectrometer</title><author>Delmore, J.E. ; Kessinger, G.F. ; Dahl, D.A. ; Olson, J.E.</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c333t-6d2ed485800d0c843c2fae729c4f2b37f5b1d07e6412888a5cb4a9efd1a66e163</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2003</creationdate><topic>CHEMISTRY</topic><topic>CLEANING</topic><topic>DESIGN</topic><topic>Electron bombardment</topic><topic>ELECTRONS</topic><topic>EVAPORATION</topic><topic>GENERAL AND MISCELLANEOUS//MATHEMATICS, COMPUTING, AND INFORMATION SCIENCE</topic><topic>High temperature mass spectrometry</topic><topic>ION SOURCES</topic><topic>IONIZATION</topic><topic>Langmuir vaporization</topic><topic>MASS SPECTROMETERS</topic><topic>MASS SPECTROSCOPY</topic><topic>RHENIUM</topic><topic>SIMS</topic><topic>SURFACE IONIZATION</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Delmore, J.E.</creatorcontrib><creatorcontrib>Kessinger, G.F.</creatorcontrib><creatorcontrib>Dahl, D.A.</creatorcontrib><creatorcontrib>Olson, J.E.</creatorcontrib><creatorcontrib>Idaho National Laboratory (INL)</creatorcontrib><collection>CrossRef</collection><collection>OSTI.GOV</collection><jtitle>International journal of mass spectrometry</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Delmore, J.E.</au><au>Kessinger, G.F.</au><au>Dahl, D.A.</au><au>Olson, J.E.</au><aucorp>Idaho National Laboratory (INL)</aucorp><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>High temperature Langmuir vaporization mass spectrometer</atitle><jtitle>International journal of mass spectrometry</jtitle><date>2003-02-01</date><risdate>2003</risdate><volume>225</volume><issue>1</issue><spage>1</spage><epage>10</epage><pages>1-10</pages><issn>1387-3806</issn><eissn>1873-2798</eissn><abstract>A high temperature Langmuir vaporization mass spectrometer (HTMS) for the analysis of solid and molten materials from room temperature up to 1700
°C was designed, built, and tested. Volatilizing species are analyzed by electron impact (EI) and by surface ionization (SI) modes. Non-volatile surface species are analyzed by the static secondary ion mass spectrometry (SIMS) mode. In addition, it is equipped with an Ar
+ dynamic SIMS gun for an elemental analysis mode and for sample cleaning. The ion source has a unified design so a single sample can be analyzed by EI, SI or SIMS modes in rapid sequence at constant or variable temperatures. The instrument and data system were designed with particular emphasis placed on the ability of the instrument to perform EI ionization of neutral species prior to condensation and reactive species prior to reaction, and on giving the user the ability to correlate data from different ionization modes with changing sample chemistry. The HTMS has been successfully applied to the analysis of ion-emitting molten glasses. Large samples mounted in small rhenium tubes have been studied at temperatures up to 1150
°C, while smaller samples on flat rhenium filaments have been analyzed at temperatures as high as 1700
°C.</abstract><cop>United States</cop><pub>Elsevier B.V</pub><doi>10.1016/S1387-3806(02)01001-1</doi><tpages>10</tpages></addata></record> |
| fulltext | fulltext |
| identifier | ISSN: 1387-3806 |
| ispartof | International journal of mass spectrometry, 2003-02, Vol.225 (1), p.1-10 |
| issn | 1387-3806 1873-2798 |
| language | eng |
| recordid | cdi_osti_scitechconnect_912097 |
| source | ScienceDirect Journals (5 years ago - present) |
| subjects | CHEMISTRY CLEANING DESIGN Electron bombardment ELECTRONS EVAPORATION GENERAL AND MISCELLANEOUS//MATHEMATICS, COMPUTING, AND INFORMATION SCIENCE High temperature mass spectrometry ION SOURCES IONIZATION Langmuir vaporization MASS SPECTROMETERS MASS SPECTROSCOPY RHENIUM SIMS SURFACE IONIZATION |
| title | High temperature Langmuir vaporization mass spectrometer |
| url | https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-01-07T05%3A32%3A09IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-elsevier_osti_&rft_val_fmt=info:ofi/fmt:kev:mtx:journal&rft.genre=article&rft.atitle=High%20temperature%20Langmuir%20vaporization%20mass%20spectrometer&rft.jtitle=International%20journal%20of%20mass%20spectrometry&rft.au=Delmore,%20J.E.&rft.aucorp=Idaho%20National%20Laboratory%20(INL)&rft.date=2003-02-01&rft.volume=225&rft.issue=1&rft.spage=1&rft.epage=10&rft.pages=1-10&rft.issn=1387-3806&rft.eissn=1873-2798&rft_id=info:doi/10.1016/S1387-3806(02)01001-1&rft_dat=%3Celsevier_osti_%3ES1387380602010011%3C/elsevier_osti_%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_id=info:pmid/&rft_els_id=S1387380602010011&rfr_iscdi=true |