Multilevel structure of reinforcing silica and carbon

Using small‐angle x‐ray (SAXS), neutron (SANS), x‐ray diffraction and light scattering, we study the structure of colloidal silica and carbon on length scales from 4 Å < q−1 < 107 Å where q is the magnitude of the scattering vector. These materials consist of primary particles of the order of...

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Veröffentlicht in:	Journal of applied crystallography 2000-06, Vol.33 (3-1), p.587-591
Hauptverfasser:	Schaefer, D.W., Rieker, T., Agamalian, M., Lin, J.S., Fischer, D., Sukumaran, S., Chen, C., Beaucage, G., Herd, C., Ivie, J.
Format:	Artikel
Sprache:	eng
Schlagworte:	CARBON Chemistry Clusters, nanoparticles, and nanocrystalline materials Colloidal state and disperse state Condensed matter: structure, mechanical and thermal properties CRYSTALLOGRAPHY Disperse systems Exact sciences and technology General and physical chemistry MATERIALS SCIENCE Nanoscale materials: clusters, nanoparticles, nanotubes, and nanocrystals Neutron diffraction and scattering Neutron scattering techniques (including small-angle scattering) Physics Porous materials SILICA Structure of solids and liquids crystallography X-ray diffraction and scattering X-ray scattering (including small-angle scattering)
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