Ultrathin vanadium films on Cu(001): structure and magnetism

X-ray photoelectron diffraction (XPD), low energy electron diffraction (LEED), and magnetic linear dichroism in angular distributions of photoelectrons (MLDAD) have been used to study the structural and magnetic properties of V thin films on Cu(001). For room-temperature growth, XPD and LEED data in...

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Veröffentlicht in:	Surface science 2000-03, Vol.449 (1), p.31-42
Hauptverfasser:	Moore, D.P., Ozturk, O., Schumann, F.O., Morton, S.A., Waddill, G.D.
Format:	Artikel
Sprache:	eng
Schlagworte:	ADVANCED LIGHT SOURCE ADVANCED LIGHT SOURCE ALS Applied sciences Condensed matter: electronic structure, electrical, magnetic, and optical properties Condensed matter: structure, mechanical and thermal properties Exact sciences and technology Growth Low energy electron diffraction (LEED) Magnetic properties and materials Magnetic properties of monolayers and thin films Magnetic properties of surface, thin films and multilayers MAGNETISM Metallic films Metals. Metallurgy PARTICLE ACCELERATORS Photoelectron diffraction Physics Structure and morphology thickness Surfaces and interfaces thin films and whiskers (structure and nonelectronic properties) Thin film structure and morphology VANADIUM
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