Minimum fluence for laser blow-off of thin gold films at 248 and 532 nm
The minimum 248 nm, 25 ns, and 532 nm, 15 ns laser fluences required to blow off thin gold films from optical quartz have been measured as a function of film thickness. The films apparently blow off when the gold-quartz interface reaches the normal boiling point of gold. Even though the initial refl...
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| Veröffentlicht in: | Applied physics letters 1990-04, Vol.56 (15), p.1412-1414 |
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| container_end_page | 1414 |
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| container_issue | 15 |
| container_start_page | 1412 |
| container_title | Applied physics letters |
| container_volume | 56 |
| creator | BASEMAN, R. J FROBERG, N. M ANDRESHAK, J. C SCHLESINGER, Z |
| description | The minimum 248 nm, 25 ns, and 532 nm, 15 ns laser fluences required to blow off thin gold films from optical quartz have been measured as a function of film thickness. The films apparently blow off when the gold-quartz interface reaches the normal boiling point of gold. Even though the initial reflectivities at the two wavelengths are very different, the actual laser fluences required to blow off the films are very similar. While the reflectivities above the melting point appear to be very low, as expected, large decreases in the reflectivity at 532 nm may also occur prior to film melting. |
| doi_str_mv | 10.1063/1.102484 |
| format | Article |
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While the reflectivities above the melting point appear to be very low, as expected, large decreases in the reflectivity at 532 nm may also occur prior to film melting.</description><identifier>ISSN: 0003-6951</identifier><identifier>EISSN: 1077-3118</identifier><identifier>DOI: 10.1063/1.102484</identifier><identifier>CODEN: APPLAB</identifier><language>eng</language><publisher>Melville, NY: American Institute of Physics</publisher><subject>ABLATION ; CHALCOGENIDES ; ELECTROMAGNETIC RADIATION ; ELEMENTS ; Exact sciences and technology ; FREQUENCY DEPENDENCE ; Fundamental areas of phenomenology (including applications) ; GOLD ; LASER RADIATION ; Lasers ; MATERIALS SCIENCE ; METALS ; MINERALS ; OPTICAL PROPERTIES ; Optics ; OXIDE MINERALS ; OXIDES ; OXYGEN COMPOUNDS ; PHYSICAL PROPERTIES ; PHYSICAL RADIATION EFFECTS ; Physics ; QUARTZ ; RADIATION EFFECTS ; RADIATIONS ; REFLECTIVITY ; SILICON COMPOUNDS ; SILICON OXIDES ; SURFACE PROPERTIES ; THIN FILMS ; TRANSITION ELEMENTS 360106 -- Metals & Alloys-- Radiation Effects</subject><ispartof>Applied physics letters, 1990-04, Vol.56 (15), p.1412-1414</ispartof><rights>1993 INIST-CNRS</rights><lds50>peer_reviewed</lds50><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-c262t-258bf91d40c23df9bdf9ec328f1293a6d51fba53b96e30d18a7f677830cd53273</citedby><cites>FETCH-LOGICAL-c262t-258bf91d40c23df9bdf9ec328f1293a6d51fba53b96e30d18a7f677830cd53273</cites></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><link.rule.ids>230,314,780,784,885,27924,27925</link.rule.ids><backlink>$$Uhttp://pascal-francis.inist.fr/vibad/index.php?action=getRecordDetail&idt=4425279$$DView record in Pascal Francis$$Hfree_for_read</backlink><backlink>$$Uhttps://www.osti.gov/biblio/6906036$$D View this record in Osti.gov$$Hfree_for_read</backlink></links><search><creatorcontrib>BASEMAN, R. J</creatorcontrib><creatorcontrib>FROBERG, N. M</creatorcontrib><creatorcontrib>ANDRESHAK, J. C</creatorcontrib><creatorcontrib>SCHLESINGER, Z</creatorcontrib><title>Minimum fluence for laser blow-off of thin gold films at 248 and 532 nm</title><title>Applied physics letters</title><description>The minimum 248 nm, 25 ns, and 532 nm, 15 ns laser fluences required to blow off thin gold films from optical quartz have been measured as a function of film thickness. The films apparently blow off when the gold-quartz interface reaches the normal boiling point of gold. Even though the initial reflectivities at the two wavelengths are very different, the actual laser fluences required to blow off the films are very similar. While the reflectivities above the melting point appear to be very low, as expected, large decreases in the reflectivity at 532 nm may also occur prior to film melting.</description><subject>ABLATION</subject><subject>CHALCOGENIDES</subject><subject>ELECTROMAGNETIC RADIATION</subject><subject>ELEMENTS</subject><subject>Exact sciences and technology</subject><subject>FREQUENCY DEPENDENCE</subject><subject>Fundamental areas of phenomenology (including applications)</subject><subject>GOLD</subject><subject>LASER RADIATION</subject><subject>Lasers</subject><subject>MATERIALS SCIENCE</subject><subject>METALS</subject><subject>MINERALS</subject><subject>OPTICAL PROPERTIES</subject><subject>Optics</subject><subject>OXIDE MINERALS</subject><subject>OXIDES</subject><subject>OXYGEN COMPOUNDS</subject><subject>PHYSICAL PROPERTIES</subject><subject>PHYSICAL RADIATION EFFECTS</subject><subject>Physics</subject><subject>QUARTZ</subject><subject>RADIATION EFFECTS</subject><subject>RADIATIONS</subject><subject>REFLECTIVITY</subject><subject>SILICON COMPOUNDS</subject><subject>SILICON OXIDES</subject><subject>SURFACE PROPERTIES</subject><subject>THIN FILMS</subject><subject>TRANSITION ELEMENTS 360106 -- Metals & Alloys-- Radiation Effects</subject><issn>0003-6951</issn><issn>1077-3118</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>1990</creationdate><recordtype>article</recordtype><recordid>eNo9kEFLxDAUhIMoWFfBnxDEg5dqktckzVEWXYUVL3ouaZrnRtpkabqI_95KxcMwDHzMwBByydktZwru-GyiqqsjUnCmdQmc18ekYIxBqYzkp-Qs5885SgFQkM1LiGE4DBT7g4_OU0wj7W32I2379FUmRJqQTrsQ6UfqO4qhHzK1E51HqI0dlSBoHM7JCdo--4s_X5H3x4e39VO5fd08r--3pRNKTKWQdYuGdxVzAjo07SzvQNTIhQGrOsmxtRJaozywjtdWo9K6Bua6eUjDilwtvSlPockuTN7tXIrRu6lRhikGaoZuFsiNKefRY7Mfw2DH74az5velhjfLSzN6vaB7m53tcbTRhfzPV5WQQhv4AVMaYtw</recordid><startdate>19900409</startdate><enddate>19900409</enddate><creator>BASEMAN, R. 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C ; SCHLESINGER, Z</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c262t-258bf91d40c23df9bdf9ec328f1293a6d51fba53b96e30d18a7f677830cd53273</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>1990</creationdate><topic>ABLATION</topic><topic>CHALCOGENIDES</topic><topic>ELECTROMAGNETIC RADIATION</topic><topic>ELEMENTS</topic><topic>Exact sciences and technology</topic><topic>FREQUENCY DEPENDENCE</topic><topic>Fundamental areas of phenomenology (including applications)</topic><topic>GOLD</topic><topic>LASER RADIATION</topic><topic>Lasers</topic><topic>MATERIALS SCIENCE</topic><topic>METALS</topic><topic>MINERALS</topic><topic>OPTICAL PROPERTIES</topic><topic>Optics</topic><topic>OXIDE MINERALS</topic><topic>OXIDES</topic><topic>OXYGEN COMPOUNDS</topic><topic>PHYSICAL PROPERTIES</topic><topic>PHYSICAL RADIATION EFFECTS</topic><topic>Physics</topic><topic>QUARTZ</topic><topic>RADIATION EFFECTS</topic><topic>RADIATIONS</topic><topic>REFLECTIVITY</topic><topic>SILICON COMPOUNDS</topic><topic>SILICON OXIDES</topic><topic>SURFACE PROPERTIES</topic><topic>THIN FILMS</topic><topic>TRANSITION ELEMENTS 360106 -- Metals & Alloys-- Radiation Effects</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>BASEMAN, R. J</creatorcontrib><creatorcontrib>FROBERG, N. M</creatorcontrib><creatorcontrib>ANDRESHAK, J. C</creatorcontrib><creatorcontrib>SCHLESINGER, Z</creatorcontrib><collection>Pascal-Francis</collection><collection>CrossRef</collection><collection>OSTI.GOV</collection><jtitle>Applied physics letters</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>BASEMAN, R. J</au><au>FROBERG, N. M</au><au>ANDRESHAK, J. C</au><au>SCHLESINGER, Z</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Minimum fluence for laser blow-off of thin gold films at 248 and 532 nm</atitle><jtitle>Applied physics letters</jtitle><date>1990-04-09</date><risdate>1990</risdate><volume>56</volume><issue>15</issue><spage>1412</spage><epage>1414</epage><pages>1412-1414</pages><issn>0003-6951</issn><eissn>1077-3118</eissn><coden>APPLAB</coden><abstract>The minimum 248 nm, 25 ns, and 532 nm, 15 ns laser fluences required to blow off thin gold films from optical quartz have been measured as a function of film thickness. The films apparently blow off when the gold-quartz interface reaches the normal boiling point of gold. Even though the initial reflectivities at the two wavelengths are very different, the actual laser fluences required to blow off the films are very similar. While the reflectivities above the melting point appear to be very low, as expected, large decreases in the reflectivity at 532 nm may also occur prior to film melting.</abstract><cop>Melville, NY</cop><pub>American Institute of Physics</pub><doi>10.1063/1.102484</doi><tpages>3</tpages></addata></record> |
| fulltext | fulltext |
| identifier | ISSN: 0003-6951 |
| ispartof | Applied physics letters, 1990-04, Vol.56 (15), p.1412-1414 |
| issn | 0003-6951 1077-3118 |
| language | eng |
| recordid | cdi_osti_scitechconnect_6906036 |
| source | AIP Digital Archive |
| subjects | ABLATION CHALCOGENIDES ELECTROMAGNETIC RADIATION ELEMENTS Exact sciences and technology FREQUENCY DEPENDENCE Fundamental areas of phenomenology (including applications) GOLD LASER RADIATION Lasers MATERIALS SCIENCE METALS MINERALS OPTICAL PROPERTIES Optics OXIDE MINERALS OXIDES OXYGEN COMPOUNDS PHYSICAL PROPERTIES PHYSICAL RADIATION EFFECTS Physics QUARTZ RADIATION EFFECTS RADIATIONS REFLECTIVITY SILICON COMPOUNDS SILICON OXIDES SURFACE PROPERTIES THIN FILMS TRANSITION ELEMENTS 360106 -- Metals & Alloys-- Radiation Effects |
| title | Minimum fluence for laser blow-off of thin gold films at 248 and 532 nm |
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