Inorganic monolayers formed at an organic template: A Langmuir-Blodgette route to monolayer and multilayer films of zirconium ocadecylphosphonate
Single-layer and multilayer films of zirconium octadecylphosphonate have been prepared on silicon oxide surfaces and characterized by Langmuir-Blodgett (LB) transfer data, contact angle, ATR-FTIR, XPS, ellipsometry and X-ray diffraction. The deposition method uses a preformed, organized organic temp...
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Veröffentlicht in: | Chemistry of materials 1993-05, Vol.5:5 |
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creator | Byrd, H. Pike, J.K. Talham, D.R. |
description | Single-layer and multilayer films of zirconium octadecylphosphonate have been prepared on silicon oxide surfaces and characterized by Langmuir-Blodgett (LB) transfer data, contact angle, ATR-FTIR, XPS, ellipsometry and X-ray diffraction. The deposition method uses a preformed, organized organic template for assembling the inorganic lattice by combining LB and self-assembly (SA) techniques. First, an LB template of octadecylphosphonic acid is formed on an octadecyltrichlorosilane-covered substrate, then Zr[sup 4+] ions are [open quotes]self-assembled[close quotes] from solution. A capping octadecylphosphonic acid LB monolayer is added to complete the bilayer. Transfer of the phosphonic acid is continuous with transfer ratios ranging between 1.1 and 1.2. Contact angle measurements on a completed bilayer give an advancing contact angle of 112 [plus minus] 1[degrees]. The asymmetric methylene (v[sub a](CH[sub 2])) band remains unchanged in the progression from the template layer to bilayer to multilayers. XPS analysis of the zirconated LB template shows a 1:1 ratio Zr:P, while bilayer and multilayer films possess a Zr:P ratio of 1:2 consistent with the stoichiometry observed in solid zirconium phosphonate. Ellipsometry shows a layer-by-layer increase in film thickness corresponding to a bilayer thickness of 51 [angstrom], while X-ray diffraction reveals a d spacing 52 [angstrom] and thus demonstrates the layered nature of the films. The zirconium phosphonate films are quite insoluble in both water and organic solvents. 51 refs., 8 figs. |
doi_str_mv | 10.1021/cm00029a023 |
format | Article |
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The deposition method uses a preformed, organized organic template for assembling the inorganic lattice by combining LB and self-assembly (SA) techniques. First, an LB template of octadecylphosphonic acid is formed on an octadecyltrichlorosilane-covered substrate, then Zr[sup 4+] ions are [open quotes]self-assembled[close quotes] from solution. A capping octadecylphosphonic acid LB monolayer is added to complete the bilayer. Transfer of the phosphonic acid is continuous with transfer ratios ranging between 1.1 and 1.2. Contact angle measurements on a completed bilayer give an advancing contact angle of 112 [plus minus] 1[degrees]. The asymmetric methylene (v[sub a](CH[sub 2])) band remains unchanged in the progression from the template layer to bilayer to multilayers. XPS analysis of the zirconated LB template shows a 1:1 ratio Zr:P, while bilayer and multilayer films possess a Zr:P ratio of 1:2 consistent with the stoichiometry observed in solid zirconium phosphonate. Ellipsometry shows a layer-by-layer increase in film thickness corresponding to a bilayer thickness of 51 [angstrom], while X-ray diffraction reveals a d spacing 52 [angstrom] and thus demonstrates the layered nature of the films. The zirconium phosphonate films are quite insoluble in both water and organic solvents. 51 refs., 8 figs.</description><identifier>ISSN: 0897-4756</identifier><identifier>EISSN: 1520-5002</identifier><identifier>DOI: 10.1021/cm00029a023</identifier><language>eng</language><publisher>United States</publisher><subject>360601 - Other Materials- Preparation & Manufacture ; ABSORPTION SPECTROSCOPY ; CHALCOGENIDES ; CHARGED PARTICLES ; COHERENT SCATTERING ; DEPOSITION ; DIFFRACTION ; ELLIPSOMETRY ; IONS ; MATERIALS SCIENCE ; MEASURING METHODS ; ORGANIC COMPOUNDS ; ORGANIC PHOSPHORUS COMPOUNDS ; ORGANIC SOLVENTS ; OXIDES ; OXYGEN COMPOUNDS ; PHOSPHONATES ; SCATTERING ; SILICON COMPOUNDS ; SILICON OXIDES ; SOLVENTS ; SPECTROSCOPY ; STOICHIOMETRY ; TRANSITION ELEMENT COMPOUNDS ; X-RAY DIFFRACTION ; ZIRCONIUM COMPOUNDS</subject><ispartof>Chemistry of materials, 1993-05, Vol.5:5</ispartof><lds50>peer_reviewed</lds50><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><link.rule.ids>230,314,780,784,885,27924,27925</link.rule.ids><backlink>$$Uhttps://www.osti.gov/biblio/6252620$$D View this record in Osti.gov$$Hfree_for_read</backlink></links><search><creatorcontrib>Byrd, H.</creatorcontrib><creatorcontrib>Pike, J.K.</creatorcontrib><creatorcontrib>Talham, D.R.</creatorcontrib><title>Inorganic monolayers formed at an organic template: A Langmuir-Blodgette route to monolayer and multilayer films of zirconium ocadecylphosphonate</title><title>Chemistry of materials</title><description>Single-layer and multilayer films of zirconium octadecylphosphonate have been prepared on silicon oxide surfaces and characterized by Langmuir-Blodgett (LB) transfer data, contact angle, ATR-FTIR, XPS, ellipsometry and X-ray diffraction. The deposition method uses a preformed, organized organic template for assembling the inorganic lattice by combining LB and self-assembly (SA) techniques. First, an LB template of octadecylphosphonic acid is formed on an octadecyltrichlorosilane-covered substrate, then Zr[sup 4+] ions are [open quotes]self-assembled[close quotes] from solution. A capping octadecylphosphonic acid LB monolayer is added to complete the bilayer. Transfer of the phosphonic acid is continuous with transfer ratios ranging between 1.1 and 1.2. Contact angle measurements on a completed bilayer give an advancing contact angle of 112 [plus minus] 1[degrees]. The asymmetric methylene (v[sub a](CH[sub 2])) band remains unchanged in the progression from the template layer to bilayer to multilayers. XPS analysis of the zirconated LB template shows a 1:1 ratio Zr:P, while bilayer and multilayer films possess a Zr:P ratio of 1:2 consistent with the stoichiometry observed in solid zirconium phosphonate. Ellipsometry shows a layer-by-layer increase in film thickness corresponding to a bilayer thickness of 51 [angstrom], while X-ray diffraction reveals a d spacing 52 [angstrom] and thus demonstrates the layered nature of the films. The zirconium phosphonate films are quite insoluble in both water and organic solvents. 51 refs., 8 figs.</description><subject>360601 - Other Materials- Preparation & Manufacture</subject><subject>ABSORPTION SPECTROSCOPY</subject><subject>CHALCOGENIDES</subject><subject>CHARGED PARTICLES</subject><subject>COHERENT SCATTERING</subject><subject>DEPOSITION</subject><subject>DIFFRACTION</subject><subject>ELLIPSOMETRY</subject><subject>IONS</subject><subject>MATERIALS SCIENCE</subject><subject>MEASURING METHODS</subject><subject>ORGANIC COMPOUNDS</subject><subject>ORGANIC PHOSPHORUS COMPOUNDS</subject><subject>ORGANIC SOLVENTS</subject><subject>OXIDES</subject><subject>OXYGEN COMPOUNDS</subject><subject>PHOSPHONATES</subject><subject>SCATTERING</subject><subject>SILICON COMPOUNDS</subject><subject>SILICON OXIDES</subject><subject>SOLVENTS</subject><subject>SPECTROSCOPY</subject><subject>STOICHIOMETRY</subject><subject>TRANSITION ELEMENT COMPOUNDS</subject><subject>X-RAY DIFFRACTION</subject><subject>ZIRCONIUM COMPOUNDS</subject><issn>0897-4756</issn><issn>1520-5002</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>1993</creationdate><recordtype>article</recordtype><recordid>eNqNjL1OBDEMhCMEEstPxQtY9AtOjt27owMEAomS_hRlvXtBSXxKvMXxFrwxkQDRUnisGfsbpS40Xmk0-tpFRDRri2ZxoBrdGWy7GhyqBlfrZXuz7PpjdVLKO6KuwKpRny-J82STdxA5cbB7ygVGzpEGsAI2we9dKO6CFbqFO3i1aYqzz-194GEiEYLMc1Xhv54KDxDnIP7bjj7EAjzCh8-Ok58jsLMDuX3YbbnUSbX-TB2NNhQ6_9mn6vLp8e3hueUiflOcF3LbiidysulNZ3qDi389fQFTQ13r</recordid><startdate>19930501</startdate><enddate>19930501</enddate><creator>Byrd, H.</creator><creator>Pike, J.K.</creator><creator>Talham, D.R.</creator><scope>OTOTI</scope></search><sort><creationdate>19930501</creationdate><title>Inorganic monolayers formed at an organic template: A Langmuir-Blodgette route to monolayer and multilayer films of zirconium ocadecylphosphonate</title><author>Byrd, H. ; Pike, J.K. ; Talham, D.R.</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-osti_scitechconnect_62526203</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>1993</creationdate><topic>360601 - Other Materials- Preparation & Manufacture</topic><topic>ABSORPTION SPECTROSCOPY</topic><topic>CHALCOGENIDES</topic><topic>CHARGED PARTICLES</topic><topic>COHERENT SCATTERING</topic><topic>DEPOSITION</topic><topic>DIFFRACTION</topic><topic>ELLIPSOMETRY</topic><topic>IONS</topic><topic>MATERIALS SCIENCE</topic><topic>MEASURING METHODS</topic><topic>ORGANIC COMPOUNDS</topic><topic>ORGANIC PHOSPHORUS COMPOUNDS</topic><topic>ORGANIC SOLVENTS</topic><topic>OXIDES</topic><topic>OXYGEN COMPOUNDS</topic><topic>PHOSPHONATES</topic><topic>SCATTERING</topic><topic>SILICON COMPOUNDS</topic><topic>SILICON OXIDES</topic><topic>SOLVENTS</topic><topic>SPECTROSCOPY</topic><topic>STOICHIOMETRY</topic><topic>TRANSITION ELEMENT COMPOUNDS</topic><topic>X-RAY DIFFRACTION</topic><topic>ZIRCONIUM COMPOUNDS</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Byrd, H.</creatorcontrib><creatorcontrib>Pike, J.K.</creatorcontrib><creatorcontrib>Talham, D.R.</creatorcontrib><collection>OSTI.GOV</collection><jtitle>Chemistry of materials</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Byrd, H.</au><au>Pike, J.K.</au><au>Talham, D.R.</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Inorganic monolayers formed at an organic template: A Langmuir-Blodgette route to monolayer and multilayer films of zirconium ocadecylphosphonate</atitle><jtitle>Chemistry of materials</jtitle><date>1993-05-01</date><risdate>1993</risdate><volume>5:5</volume><issn>0897-4756</issn><eissn>1520-5002</eissn><abstract>Single-layer and multilayer films of zirconium octadecylphosphonate have been prepared on silicon oxide surfaces and characterized by Langmuir-Blodgett (LB) transfer data, contact angle, ATR-FTIR, XPS, ellipsometry and X-ray diffraction. The deposition method uses a preformed, organized organic template for assembling the inorganic lattice by combining LB and self-assembly (SA) techniques. First, an LB template of octadecylphosphonic acid is formed on an octadecyltrichlorosilane-covered substrate, then Zr[sup 4+] ions are [open quotes]self-assembled[close quotes] from solution. A capping octadecylphosphonic acid LB monolayer is added to complete the bilayer. Transfer of the phosphonic acid is continuous with transfer ratios ranging between 1.1 and 1.2. Contact angle measurements on a completed bilayer give an advancing contact angle of 112 [plus minus] 1[degrees]. The asymmetric methylene (v[sub a](CH[sub 2])) band remains unchanged in the progression from the template layer to bilayer to multilayers. XPS analysis of the zirconated LB template shows a 1:1 ratio Zr:P, while bilayer and multilayer films possess a Zr:P ratio of 1:2 consistent with the stoichiometry observed in solid zirconium phosphonate. Ellipsometry shows a layer-by-layer increase in film thickness corresponding to a bilayer thickness of 51 [angstrom], while X-ray diffraction reveals a d spacing 52 [angstrom] and thus demonstrates the layered nature of the films. The zirconium phosphonate films are quite insoluble in both water and organic solvents. 51 refs., 8 figs.</abstract><cop>United States</cop><doi>10.1021/cm00029a023</doi></addata></record> |
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subjects | 360601 - Other Materials- Preparation & Manufacture ABSORPTION SPECTROSCOPY CHALCOGENIDES CHARGED PARTICLES COHERENT SCATTERING DEPOSITION DIFFRACTION ELLIPSOMETRY IONS MATERIALS SCIENCE MEASURING METHODS ORGANIC COMPOUNDS ORGANIC PHOSPHORUS COMPOUNDS ORGANIC SOLVENTS OXIDES OXYGEN COMPOUNDS PHOSPHONATES SCATTERING SILICON COMPOUNDS SILICON OXIDES SOLVENTS SPECTROSCOPY STOICHIOMETRY TRANSITION ELEMENT COMPOUNDS X-RAY DIFFRACTION ZIRCONIUM COMPOUNDS |
title | Inorganic monolayers formed at an organic template: A Langmuir-Blodgette route to monolayer and multilayer films of zirconium ocadecylphosphonate |
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