Inorganic monolayers formed at an organic template: A Langmuir-Blodgette route to monolayer and multilayer films of zirconium ocadecylphosphonate

Single-layer and multilayer films of zirconium octadecylphosphonate have been prepared on silicon oxide surfaces and characterized by Langmuir-Blodgett (LB) transfer data, contact angle, ATR-FTIR, XPS, ellipsometry and X-ray diffraction. The deposition method uses a preformed, organized organic temp...

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Veröffentlicht in:Chemistry of materials 1993-05, Vol.5:5
Hauptverfasser: Byrd, H., Pike, J.K., Talham, D.R.
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description Single-layer and multilayer films of zirconium octadecylphosphonate have been prepared on silicon oxide surfaces and characterized by Langmuir-Blodgett (LB) transfer data, contact angle, ATR-FTIR, XPS, ellipsometry and X-ray diffraction. The deposition method uses a preformed, organized organic template for assembling the inorganic lattice by combining LB and self-assembly (SA) techniques. First, an LB template of octadecylphosphonic acid is formed on an octadecyltrichlorosilane-covered substrate, then Zr[sup 4+] ions are [open quotes]self-assembled[close quotes] from solution. A capping octadecylphosphonic acid LB monolayer is added to complete the bilayer. Transfer of the phosphonic acid is continuous with transfer ratios ranging between 1.1 and 1.2. Contact angle measurements on a completed bilayer give an advancing contact angle of 112 [plus minus] 1[degrees]. The asymmetric methylene (v[sub a](CH[sub 2])) band remains unchanged in the progression from the template layer to bilayer to multilayers. XPS analysis of the zirconated LB template shows a 1:1 ratio Zr:P, while bilayer and multilayer films possess a Zr:P ratio of 1:2 consistent with the stoichiometry observed in solid zirconium phosphonate. Ellipsometry shows a layer-by-layer increase in film thickness corresponding to a bilayer thickness of 51 [angstrom], while X-ray diffraction reveals a d spacing 52 [angstrom] and thus demonstrates the layered nature of the films. The zirconium phosphonate films are quite insoluble in both water and organic solvents. 51 refs., 8 figs.
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Ellipsometry shows a layer-by-layer increase in film thickness corresponding to a bilayer thickness of 51 [angstrom], while X-ray diffraction reveals a d spacing 52 [angstrom] and thus demonstrates the layered nature of the films. The zirconium phosphonate films are quite insoluble in both water and organic solvents. 51 refs., 8 figs.</abstract><cop>United States</cop><doi>10.1021/cm00029a023</doi></addata></record>
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source American Chemical Society Journals
subjects 360601 - Other Materials- Preparation & Manufacture
ABSORPTION SPECTROSCOPY
CHALCOGENIDES
CHARGED PARTICLES
COHERENT SCATTERING
DEPOSITION
DIFFRACTION
ELLIPSOMETRY
IONS
MATERIALS SCIENCE
MEASURING METHODS
ORGANIC COMPOUNDS
ORGANIC PHOSPHORUS COMPOUNDS
ORGANIC SOLVENTS
OXIDES
OXYGEN COMPOUNDS
PHOSPHONATES
SCATTERING
SILICON COMPOUNDS
SILICON OXIDES
SOLVENTS
SPECTROSCOPY
STOICHIOMETRY
TRANSITION ELEMENT COMPOUNDS
X-RAY DIFFRACTION
ZIRCONIUM COMPOUNDS
title Inorganic monolayers formed at an organic template: A Langmuir-Blodgette route to monolayer and multilayer films of zirconium ocadecylphosphonate
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