Microstructure of superconducting YBa sub 2 Cu sub 3 O sub 7 minus. delta. thin films on Si and alumina substrates with buffer layers
The microstructure of YBa{sub 2}Cu{sub 3}O{sub 7{minus}{delta}} (YBCO) films grown on silicon and alumina substrates with yttria-stabilized zirconia (YSZ) buffer layers has been studied by transmission electron microscopy (TEM) and x-ray diffraction. The as-deposited films are not amorphous, but are...
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| Veröffentlicht in: | Journal of applied physics 1989-11, Vol.66:10 |
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| container_title | Journal of applied physics |
| container_volume | 66:10 |
| creator | Lee, J. Migliuolo, M. Stamper, A.K. Greve, D.W. Laughlin, D.E. Schlesinger, T.E. |
| description | The microstructure of YBa{sub 2}Cu{sub 3}O{sub 7{minus}{delta}} (YBCO) films grown on silicon and alumina substrates with yttria-stabilized zirconia (YSZ) buffer layers has been studied by transmission electron microscopy (TEM) and x-ray diffraction. The as-deposited films are not amorphous, but are in fact composed of small crystalline grains. The top surface of the post-annealed YBCO film consists mainly of the orthorhombic structure of YBCO with large grains. Other phases are present within the films and have been identified. The presence of a very thin interdiffused layer of BaZrO{sub 3} between the YSZ and the YBCO has been shown by cross-sectional TEM. |
| doi_str_mv | 10.1063/1.343807 |
| format | Article |
| fullrecord | <record><control><sourceid>osti</sourceid><recordid>TN_cdi_osti_scitechconnect_5301381</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>5301381</sourcerecordid><originalsourceid>FETCH-osti_scitechconnect_53013813</originalsourceid><addsrcrecordid>eNqNjsFKAzEYhIMouNaCj_Djfbd_mq6bvVoUL6UHvfRU0mziRtKs5E8QH8D3Niw-gKcZho-ZYeyOY8PxQax4IzZCYnfBKo6yr7u2xUtWIa55Lfuuv2Y3RB-InEvRV-xn53ScKMWsU44GJguUP03UUxhK5MI7HB5VyU6whm2ejYD9rB2cXcjUwGB8Ug2k0QWwzp8JpgCvDlQYQPlcqLmhrKhkCL5cGuGUrTURvPo2kW7ZlVWezPJPF-z--elt-1KXZ-5I2iWjx3IpGJ2OrUAuJBf_gn4B8ThVaA</addsrcrecordid><sourcetype>Open Access Repository</sourcetype><iscdi>true</iscdi><recordtype>article</recordtype></control><display><type>article</type><title>Microstructure of superconducting YBa sub 2 Cu sub 3 O sub 7 minus. delta. thin films on Si and alumina substrates with buffer layers</title><source>AIP Digital Archive</source><creator>Lee, J. ; Migliuolo, M. ; Stamper, A.K. ; Greve, D.W. ; Laughlin, D.E. ; Schlesinger, T.E.</creator><creatorcontrib>Lee, J. ; Migliuolo, M. ; Stamper, A.K. ; Greve, D.W. ; Laughlin, D.E. ; Schlesinger, T.E.</creatorcontrib><description>The microstructure of YBa{sub 2}Cu{sub 3}O{sub 7{minus}{delta}} (YBCO) films grown on silicon and alumina substrates with yttria-stabilized zirconia (YSZ) buffer layers has been studied by transmission electron microscopy (TEM) and x-ray diffraction. The as-deposited films are not amorphous, but are in fact composed of small crystalline grains. The top surface of the post-annealed YBCO film consists mainly of the orthorhombic structure of YBCO with large grains. Other phases are present within the films and have been identified. The presence of a very thin interdiffused layer of BaZrO{sub 3} between the YSZ and the YBCO has been shown by cross-sectional TEM.</description><identifier>ISSN: 0021-8979</identifier><identifier>EISSN: 1089-7550</identifier><identifier>DOI: 10.1063/1.343807</identifier><language>eng</language><publisher>United States</publisher><subject>360202 - Ceramics, Cermets, & Refractories- Structure & Phase Studies ; 656100 - Condensed Matter Physics- Superconductivity ; ALKALINE EARTH METAL COMPOUNDS ; ALUMINIUM COMPOUNDS ; ALUMINIUM OXIDES ; BARIUM COMPOUNDS ; BARIUM OXIDES ; BUFFERS ; CHALCOGENIDES ; COHERENT SCATTERING ; CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY ; COPPER COMPOUNDS ; COPPER OXIDES ; CRYSTAL STRUCTURE ; DIFFRACTION ; ELECTRON DIFFRACTION ; ELECTRON MICROSCOPY ; ELEMENTS ; LAYERS ; MATERIALS SCIENCE ; MICROSCOPY ; MICROSTRUCTURE ; OXIDES ; OXYGEN COMPOUNDS ; SCATTERING ; SEMIMETALS ; SILICON ; SUBSTRATES ; SUPERCONDUCTING FILMS ; TRANSITION ELEMENT COMPOUNDS ; TRANSMISSION ELECTRON MICROSCOPY ; YTTRIUM COMPOUNDS ; YTTRIUM OXIDES</subject><ispartof>Journal of applied physics, 1989-11, Vol.66:10</ispartof><lds50>peer_reviewed</lds50><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><link.rule.ids>230,315,782,786,887,27933,27934</link.rule.ids><backlink>$$Uhttps://www.osti.gov/biblio/5301381$$D View this record in Osti.gov$$Hfree_for_read</backlink></links><search><creatorcontrib>Lee, J.</creatorcontrib><creatorcontrib>Migliuolo, M.</creatorcontrib><creatorcontrib>Stamper, A.K.</creatorcontrib><creatorcontrib>Greve, D.W.</creatorcontrib><creatorcontrib>Laughlin, D.E.</creatorcontrib><creatorcontrib>Schlesinger, T.E.</creatorcontrib><title>Microstructure of superconducting YBa sub 2 Cu sub 3 O sub 7 minus. delta. thin films on Si and alumina substrates with buffer layers</title><title>Journal of applied physics</title><description>The microstructure of YBa{sub 2}Cu{sub 3}O{sub 7{minus}{delta}} (YBCO) films grown on silicon and alumina substrates with yttria-stabilized zirconia (YSZ) buffer layers has been studied by transmission electron microscopy (TEM) and x-ray diffraction. The as-deposited films are not amorphous, but are in fact composed of small crystalline grains. The top surface of the post-annealed YBCO film consists mainly of the orthorhombic structure of YBCO with large grains. Other phases are present within the films and have been identified. The presence of a very thin interdiffused layer of BaZrO{sub 3} between the YSZ and the YBCO has been shown by cross-sectional TEM.</description><subject>360202 - Ceramics, Cermets, & Refractories- Structure & Phase Studies</subject><subject>656100 - Condensed Matter Physics- Superconductivity</subject><subject>ALKALINE EARTH METAL COMPOUNDS</subject><subject>ALUMINIUM COMPOUNDS</subject><subject>ALUMINIUM OXIDES</subject><subject>BARIUM COMPOUNDS</subject><subject>BARIUM OXIDES</subject><subject>BUFFERS</subject><subject>CHALCOGENIDES</subject><subject>COHERENT SCATTERING</subject><subject>CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY</subject><subject>COPPER COMPOUNDS</subject><subject>COPPER OXIDES</subject><subject>CRYSTAL STRUCTURE</subject><subject>DIFFRACTION</subject><subject>ELECTRON DIFFRACTION</subject><subject>ELECTRON MICROSCOPY</subject><subject>ELEMENTS</subject><subject>LAYERS</subject><subject>MATERIALS SCIENCE</subject><subject>MICROSCOPY</subject><subject>MICROSTRUCTURE</subject><subject>OXIDES</subject><subject>OXYGEN COMPOUNDS</subject><subject>SCATTERING</subject><subject>SEMIMETALS</subject><subject>SILICON</subject><subject>SUBSTRATES</subject><subject>SUPERCONDUCTING FILMS</subject><subject>TRANSITION ELEMENT COMPOUNDS</subject><subject>TRANSMISSION ELECTRON MICROSCOPY</subject><subject>YTTRIUM COMPOUNDS</subject><subject>YTTRIUM OXIDES</subject><issn>0021-8979</issn><issn>1089-7550</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>1989</creationdate><recordtype>article</recordtype><recordid>eNqNjsFKAzEYhIMouNaCj_Djfbd_mq6bvVoUL6UHvfRU0mziRtKs5E8QH8D3Niw-gKcZho-ZYeyOY8PxQax4IzZCYnfBKo6yr7u2xUtWIa55Lfuuv2Y3RB-InEvRV-xn53ScKMWsU44GJguUP03UUxhK5MI7HB5VyU6whm2ejYD9rB2cXcjUwGB8Ug2k0QWwzp8JpgCvDlQYQPlcqLmhrKhkCL5cGuGUrTURvPo2kW7ZlVWezPJPF-z--elt-1KXZ-5I2iWjx3IpGJ2OrUAuJBf_gn4B8ThVaA</recordid><startdate>19891115</startdate><enddate>19891115</enddate><creator>Lee, J.</creator><creator>Migliuolo, M.</creator><creator>Stamper, A.K.</creator><creator>Greve, D.W.</creator><creator>Laughlin, D.E.</creator><creator>Schlesinger, T.E.</creator><scope>OTOTI</scope></search><sort><creationdate>19891115</creationdate><title>Microstructure of superconducting YBa sub 2 Cu sub 3 O sub 7 minus. delta. thin films on Si and alumina substrates with buffer layers</title><author>Lee, J. ; Migliuolo, M. ; Stamper, A.K. ; Greve, D.W. ; Laughlin, D.E. ; Schlesinger, T.E.</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-osti_scitechconnect_53013813</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>1989</creationdate><topic>360202 - Ceramics, Cermets, & Refractories- Structure & Phase Studies</topic><topic>656100 - Condensed Matter Physics- Superconductivity</topic><topic>ALKALINE EARTH METAL COMPOUNDS</topic><topic>ALUMINIUM COMPOUNDS</topic><topic>ALUMINIUM OXIDES</topic><topic>BARIUM COMPOUNDS</topic><topic>BARIUM OXIDES</topic><topic>BUFFERS</topic><topic>CHALCOGENIDES</topic><topic>COHERENT SCATTERING</topic><topic>CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY</topic><topic>COPPER COMPOUNDS</topic><topic>COPPER OXIDES</topic><topic>CRYSTAL STRUCTURE</topic><topic>DIFFRACTION</topic><topic>ELECTRON DIFFRACTION</topic><topic>ELECTRON MICROSCOPY</topic><topic>ELEMENTS</topic><topic>LAYERS</topic><topic>MATERIALS SCIENCE</topic><topic>MICROSCOPY</topic><topic>MICROSTRUCTURE</topic><topic>OXIDES</topic><topic>OXYGEN COMPOUNDS</topic><topic>SCATTERING</topic><topic>SEMIMETALS</topic><topic>SILICON</topic><topic>SUBSTRATES</topic><topic>SUPERCONDUCTING FILMS</topic><topic>TRANSITION ELEMENT COMPOUNDS</topic><topic>TRANSMISSION ELECTRON MICROSCOPY</topic><topic>YTTRIUM COMPOUNDS</topic><topic>YTTRIUM OXIDES</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Lee, J.</creatorcontrib><creatorcontrib>Migliuolo, M.</creatorcontrib><creatorcontrib>Stamper, A.K.</creatorcontrib><creatorcontrib>Greve, D.W.</creatorcontrib><creatorcontrib>Laughlin, D.E.</creatorcontrib><creatorcontrib>Schlesinger, T.E.</creatorcontrib><collection>OSTI.GOV</collection><jtitle>Journal of applied physics</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Lee, J.</au><au>Migliuolo, M.</au><au>Stamper, A.K.</au><au>Greve, D.W.</au><au>Laughlin, D.E.</au><au>Schlesinger, T.E.</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Microstructure of superconducting YBa sub 2 Cu sub 3 O sub 7 minus. delta. thin films on Si and alumina substrates with buffer layers</atitle><jtitle>Journal of applied physics</jtitle><date>1989-11-15</date><risdate>1989</risdate><volume>66:10</volume><issn>0021-8979</issn><eissn>1089-7550</eissn><abstract>The microstructure of YBa{sub 2}Cu{sub 3}O{sub 7{minus}{delta}} (YBCO) films grown on silicon and alumina substrates with yttria-stabilized zirconia (YSZ) buffer layers has been studied by transmission electron microscopy (TEM) and x-ray diffraction. The as-deposited films are not amorphous, but are in fact composed of small crystalline grains. The top surface of the post-annealed YBCO film consists mainly of the orthorhombic structure of YBCO with large grains. Other phases are present within the films and have been identified. The presence of a very thin interdiffused layer of BaZrO{sub 3} between the YSZ and the YBCO has been shown by cross-sectional TEM.</abstract><cop>United States</cop><doi>10.1063/1.343807</doi></addata></record> |
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| identifier | ISSN: 0021-8979 |
| ispartof | Journal of applied physics, 1989-11, Vol.66:10 |
| issn | 0021-8979 1089-7550 |
| language | eng |
| recordid | cdi_osti_scitechconnect_5301381 |
| source | AIP Digital Archive |
| subjects | 360202 - Ceramics, Cermets, & Refractories- Structure & Phase Studies 656100 - Condensed Matter Physics- Superconductivity ALKALINE EARTH METAL COMPOUNDS ALUMINIUM COMPOUNDS ALUMINIUM OXIDES BARIUM COMPOUNDS BARIUM OXIDES BUFFERS CHALCOGENIDES COHERENT SCATTERING CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY COPPER COMPOUNDS COPPER OXIDES CRYSTAL STRUCTURE DIFFRACTION ELECTRON DIFFRACTION ELECTRON MICROSCOPY ELEMENTS LAYERS MATERIALS SCIENCE MICROSCOPY MICROSTRUCTURE OXIDES OXYGEN COMPOUNDS SCATTERING SEMIMETALS SILICON SUBSTRATES SUPERCONDUCTING FILMS TRANSITION ELEMENT COMPOUNDS TRANSMISSION ELECTRON MICROSCOPY YTTRIUM COMPOUNDS YTTRIUM OXIDES |
| title | Microstructure of superconducting YBa sub 2 Cu sub 3 O sub 7 minus. delta. thin films on Si and alumina substrates with buffer layers |
| url | https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2024-12-02T18%3A51%3A15IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-osti&rft_val_fmt=info:ofi/fmt:kev:mtx:journal&rft.genre=article&rft.atitle=Microstructure%20of%20superconducting%20YBa%20sub%202%20Cu%20sub%203%20O%20sub%207%20minus.%20delta.%20thin%20films%20on%20Si%20and%20alumina%20substrates%20with%20buffer%20layers&rft.jtitle=Journal%20of%20applied%20physics&rft.au=Lee,%20J.&rft.date=1989-11-15&rft.volume=66:10&rft.issn=0021-8979&rft.eissn=1089-7550&rft_id=info:doi/10.1063/1.343807&rft_dat=%3Costi%3E5301381%3C/osti%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_id=info:pmid/&rfr_iscdi=true |