Structural perfection in physisorbed films: A synchrotron x-ray diffraction study of xenon adsorbed on the Ag(111) surface
Synchrotron X-ray scattering has been used to investigate the structure and growth of xenon films physisorbed on the Ag(111) surface. For growth under quasiequilibrium conditions, the bulk Xe--Xe spacing is reached at monolayer completion and fcc films of thickness = > 220 A are observed. Under k...
Gespeichert in:
| Veröffentlicht in: | Physical review letters 1994-01, Vol.72 (5), p.685-688 |
|---|---|
| Hauptverfasser: | , , , , |
| Format: | Artikel |
| Sprache: | eng |
| Schlagworte: | |
| Online-Zugang: | Volltext |
| Tags: |
Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
|
| container_end_page | 688 |
|---|---|
| container_issue | 5 |
| container_start_page | 685 |
| container_title | Physical review letters |
| container_volume | 72 |
| creator | Dai, P Angot, T Ehrlich, SN Wang, S Taub, H |
| description | Synchrotron X-ray scattering has been used to investigate the structure and growth of xenon films physisorbed on the Ag(111) surface. For growth under quasiequilibrium conditions, the bulk Xe--Xe spacing is reached at monolayer completion and fcc films of thickness = > 220 A are observed. Under kinetic growth conditions, intensity oscillations in the specular reflectivity as a function of time demonstrate nearly layer-by-layer growth. Modeling of the intensity at a fixed coverage allows profiling of the xenon/vacuum interface as well as a direct determination of the film's thickness and layer spacings. |
| doi_str_mv | 10.1103/physrevlett.72.685 |
| format | Article |
| fullrecord | <record><control><sourceid>proquest_osti_</sourceid><recordid>TN_cdi_osti_scitechconnect_5226168</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>26607084</sourcerecordid><originalsourceid>FETCH-LOGICAL-c469t-3cb6b3dad066b82d328dd206fd750b994f90f5ac42ce70ce03b3275dcfa1c7ca3</originalsourceid><addsrcrecordid>eNp9kc1u1DAURq0K1E5LX6ALZLFAZZHh2k7shN2oooA0EgjateX4p2OUiQfbqRqevq4yC1asfC2d75PuPQhdEVgTAuzjYTenaB8Hm_Na0DVvmxO0IiC6ShBSv0IrAEaqDkCcofOUfgMAobw9RWcEoOF1J1bo768cJ52nqAZ8sNFZnX0YsR_xS7tPIfbWYOeHffqENzjNo97FkGNhnqqoZmy8c1EtqZQnM-Pg8JMdy1eZY7zMeWfx5uGaEPIBpyk6pe0b9NqpIdnL43uB7m8_3918rbbfv3y72WwrXfMuV0z3vGdGGeC8b6lhtDWGAndGNNB3Xe06cI3SNdVWgLbAekZFY7RTRAut2AV6t_SGlL1M2merdzqMY9lVNpRywtsCvV-gQwx_Jpuy3Puk7TCo0YYpSco5CGjrAl7_FyRt01HBWcsKShdUx5CKKScP0e9VnCUB-WJQ_ig3_mkft8WgFFQWgyX09tg_9Xtr_oksytgz0U6brQ</addsrcrecordid><sourcetype>Open Access Repository</sourcetype><iscdi>true</iscdi><recordtype>article</recordtype><pqid>1859276383</pqid></control><display><type>article</type><title>Structural perfection in physisorbed films: A synchrotron x-ray diffraction study of xenon adsorbed on the Ag(111) surface</title><source>American Physical Society Journals</source><creator>Dai, P ; Angot, T ; Ehrlich, SN ; Wang, S ; Taub, H</creator><creatorcontrib>Dai, P ; Angot, T ; Ehrlich, SN ; Wang, S ; Taub, H</creatorcontrib><description>Synchrotron X-ray scattering has been used to investigate the structure and growth of xenon films physisorbed on the Ag(111) surface. For growth under quasiequilibrium conditions, the bulk Xe--Xe spacing is reached at monolayer completion and fcc films of thickness = > 220 A are observed. Under kinetic growth conditions, intensity oscillations in the specular reflectivity as a function of time demonstrate nearly layer-by-layer growth. Modeling of the intensity at a fixed coverage allows profiling of the xenon/vacuum interface as well as a direct determination of the film's thickness and layer spacings.</description><identifier>ISSN: 0031-9007</identifier><identifier>EISSN: 1079-7114</identifier><identifier>DOI: 10.1103/physrevlett.72.685</identifier><identifier>PMID: 10056497</identifier><language>eng</language><publisher>United States</publisher><subject>360602 - Other Materials- Structure & Phase Studies ; ADSORPTION ; BREMSSTRAHLUNG ; COHERENT SCATTERING ; CRYSTAL GROWTH ; CRYSTAL LATTICES ; CRYSTAL STRUCTURE ; CUBIC LATTICES ; DIFFRACTION ; ELECTROMAGNETIC RADIATION ; ELEMENTS ; FCC LATTICES ; FLUIDS ; GASES ; INTERFACES ; LATTICE PARAMETERS ; MATERIALS SCIENCE ; NONMETALS ; OPTICAL PROPERTIES ; PHYSICAL PROPERTIES ; RADIATIONS ; RARE GASES ; REFLECTIVITY ; SCATTERING ; SORPTION ; SURFACE PROPERTIES ; SYNCHROTRON RADIATION ; TEMPERATURE DEPENDENCE ; TIME DEPENDENCE ; X-RAY DIFFRACTION ; XENON</subject><ispartof>Physical review letters, 1994-01, Vol.72 (5), p.685-688</ispartof><lds50>peer_reviewed</lds50><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-c469t-3cb6b3dad066b82d328dd206fd750b994f90f5ac42ce70ce03b3275dcfa1c7ca3</citedby><cites>FETCH-LOGICAL-c469t-3cb6b3dad066b82d328dd206fd750b994f90f5ac42ce70ce03b3275dcfa1c7ca3</cites></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><link.rule.ids>230,314,780,784,885,2876,2877,27924,27925</link.rule.ids><backlink>$$Uhttps://www.ncbi.nlm.nih.gov/pubmed/10056497$$D View this record in MEDLINE/PubMed$$Hfree_for_read</backlink><backlink>$$Uhttps://www.osti.gov/biblio/5226168$$D View this record in Osti.gov$$Hfree_for_read</backlink></links><search><creatorcontrib>Dai, P</creatorcontrib><creatorcontrib>Angot, T</creatorcontrib><creatorcontrib>Ehrlich, SN</creatorcontrib><creatorcontrib>Wang, S</creatorcontrib><creatorcontrib>Taub, H</creatorcontrib><title>Structural perfection in physisorbed films: A synchrotron x-ray diffraction study of xenon adsorbed on the Ag(111) surface</title><title>Physical review letters</title><addtitle>Phys Rev Lett</addtitle><description>Synchrotron X-ray scattering has been used to investigate the structure and growth of xenon films physisorbed on the Ag(111) surface. For growth under quasiequilibrium conditions, the bulk Xe--Xe spacing is reached at monolayer completion and fcc films of thickness = > 220 A are observed. Under kinetic growth conditions, intensity oscillations in the specular reflectivity as a function of time demonstrate nearly layer-by-layer growth. Modeling of the intensity at a fixed coverage allows profiling of the xenon/vacuum interface as well as a direct determination of the film's thickness and layer spacings.</description><subject>360602 - Other Materials- Structure & Phase Studies</subject><subject>ADSORPTION</subject><subject>BREMSSTRAHLUNG</subject><subject>COHERENT SCATTERING</subject><subject>CRYSTAL GROWTH</subject><subject>CRYSTAL LATTICES</subject><subject>CRYSTAL STRUCTURE</subject><subject>CUBIC LATTICES</subject><subject>DIFFRACTION</subject><subject>ELECTROMAGNETIC RADIATION</subject><subject>ELEMENTS</subject><subject>FCC LATTICES</subject><subject>FLUIDS</subject><subject>GASES</subject><subject>INTERFACES</subject><subject>LATTICE PARAMETERS</subject><subject>MATERIALS SCIENCE</subject><subject>NONMETALS</subject><subject>OPTICAL PROPERTIES</subject><subject>PHYSICAL PROPERTIES</subject><subject>RADIATIONS</subject><subject>RARE GASES</subject><subject>REFLECTIVITY</subject><subject>SCATTERING</subject><subject>SORPTION</subject><subject>SURFACE PROPERTIES</subject><subject>SYNCHROTRON RADIATION</subject><subject>TEMPERATURE DEPENDENCE</subject><subject>TIME DEPENDENCE</subject><subject>X-RAY DIFFRACTION</subject><subject>XENON</subject><issn>0031-9007</issn><issn>1079-7114</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>1994</creationdate><recordtype>article</recordtype><recordid>eNp9kc1u1DAURq0K1E5LX6ALZLFAZZHh2k7shN2oooA0EgjateX4p2OUiQfbqRqevq4yC1asfC2d75PuPQhdEVgTAuzjYTenaB8Hm_Na0DVvmxO0IiC6ShBSv0IrAEaqDkCcofOUfgMAobw9RWcEoOF1J1bo768cJ52nqAZ8sNFZnX0YsR_xS7tPIfbWYOeHffqENzjNo97FkGNhnqqoZmy8c1EtqZQnM-Pg8JMdy1eZY7zMeWfx5uGaEPIBpyk6pe0b9NqpIdnL43uB7m8_3918rbbfv3y72WwrXfMuV0z3vGdGGeC8b6lhtDWGAndGNNB3Xe06cI3SNdVWgLbAekZFY7RTRAut2AV6t_SGlL1M2merdzqMY9lVNpRywtsCvV-gQwx_Jpuy3Puk7TCo0YYpSco5CGjrAl7_FyRt01HBWcsKShdUx5CKKScP0e9VnCUB-WJQ_ig3_mkft8WgFFQWgyX09tg_9Xtr_oksytgz0U6brQ</recordid><startdate>19940131</startdate><enddate>19940131</enddate><creator>Dai, P</creator><creator>Angot, T</creator><creator>Ehrlich, SN</creator><creator>Wang, S</creator><creator>Taub, H</creator><scope>NPM</scope><scope>AAYXX</scope><scope>CITATION</scope><scope>7X8</scope><scope>8BQ</scope><scope>8FD</scope><scope>JG9</scope><scope>OTOTI</scope></search><sort><creationdate>19940131</creationdate><title>Structural perfection in physisorbed films: A synchrotron x-ray diffraction study of xenon adsorbed on the Ag(111) surface</title><author>Dai, P ; Angot, T ; Ehrlich, SN ; Wang, S ; Taub, H</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c469t-3cb6b3dad066b82d328dd206fd750b994f90f5ac42ce70ce03b3275dcfa1c7ca3</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>1994</creationdate><topic>360602 - Other Materials- Structure & Phase Studies</topic><topic>ADSORPTION</topic><topic>BREMSSTRAHLUNG</topic><topic>COHERENT SCATTERING</topic><topic>CRYSTAL GROWTH</topic><topic>CRYSTAL LATTICES</topic><topic>CRYSTAL STRUCTURE</topic><topic>CUBIC LATTICES</topic><topic>DIFFRACTION</topic><topic>ELECTROMAGNETIC RADIATION</topic><topic>ELEMENTS</topic><topic>FCC LATTICES</topic><topic>FLUIDS</topic><topic>GASES</topic><topic>INTERFACES</topic><topic>LATTICE PARAMETERS</topic><topic>MATERIALS SCIENCE</topic><topic>NONMETALS</topic><topic>OPTICAL PROPERTIES</topic><topic>PHYSICAL PROPERTIES</topic><topic>RADIATIONS</topic><topic>RARE GASES</topic><topic>REFLECTIVITY</topic><topic>SCATTERING</topic><topic>SORPTION</topic><topic>SURFACE PROPERTIES</topic><topic>SYNCHROTRON RADIATION</topic><topic>TEMPERATURE DEPENDENCE</topic><topic>TIME DEPENDENCE</topic><topic>X-RAY DIFFRACTION</topic><topic>XENON</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Dai, P</creatorcontrib><creatorcontrib>Angot, T</creatorcontrib><creatorcontrib>Ehrlich, SN</creatorcontrib><creatorcontrib>Wang, S</creatorcontrib><creatorcontrib>Taub, H</creatorcontrib><collection>PubMed</collection><collection>CrossRef</collection><collection>MEDLINE - Academic</collection><collection>METADEX</collection><collection>Technology Research Database</collection><collection>Materials Research Database</collection><collection>OSTI.GOV</collection><jtitle>Physical review letters</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Dai, P</au><au>Angot, T</au><au>Ehrlich, SN</au><au>Wang, S</au><au>Taub, H</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Structural perfection in physisorbed films: A synchrotron x-ray diffraction study of xenon adsorbed on the Ag(111) surface</atitle><jtitle>Physical review letters</jtitle><addtitle>Phys Rev Lett</addtitle><date>1994-01-31</date><risdate>1994</risdate><volume>72</volume><issue>5</issue><spage>685</spage><epage>688</epage><pages>685-688</pages><issn>0031-9007</issn><eissn>1079-7114</eissn><abstract>Synchrotron X-ray scattering has been used to investigate the structure and growth of xenon films physisorbed on the Ag(111) surface. For growth under quasiequilibrium conditions, the bulk Xe--Xe spacing is reached at monolayer completion and fcc films of thickness = > 220 A are observed. Under kinetic growth conditions, intensity oscillations in the specular reflectivity as a function of time demonstrate nearly layer-by-layer growth. Modeling of the intensity at a fixed coverage allows profiling of the xenon/vacuum interface as well as a direct determination of the film's thickness and layer spacings.</abstract><cop>United States</cop><pmid>10056497</pmid><doi>10.1103/physrevlett.72.685</doi><tpages>4</tpages><oa>free_for_read</oa></addata></record> |
| fulltext | fulltext |
| identifier | ISSN: 0031-9007 |
| ispartof | Physical review letters, 1994-01, Vol.72 (5), p.685-688 |
| issn | 0031-9007 1079-7114 |
| language | eng |
| recordid | cdi_osti_scitechconnect_5226168 |
| source | American Physical Society Journals |
| subjects | 360602 - Other Materials- Structure & Phase Studies ADSORPTION BREMSSTRAHLUNG COHERENT SCATTERING CRYSTAL GROWTH CRYSTAL LATTICES CRYSTAL STRUCTURE CUBIC LATTICES DIFFRACTION ELECTROMAGNETIC RADIATION ELEMENTS FCC LATTICES FLUIDS GASES INTERFACES LATTICE PARAMETERS MATERIALS SCIENCE NONMETALS OPTICAL PROPERTIES PHYSICAL PROPERTIES RADIATIONS RARE GASES REFLECTIVITY SCATTERING SORPTION SURFACE PROPERTIES SYNCHROTRON RADIATION TEMPERATURE DEPENDENCE TIME DEPENDENCE X-RAY DIFFRACTION XENON |
| title | Structural perfection in physisorbed films: A synchrotron x-ray diffraction study of xenon adsorbed on the Ag(111) surface |
| url | https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-01-01T02%3A17%3A43IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-proquest_osti_&rft_val_fmt=info:ofi/fmt:kev:mtx:journal&rft.genre=article&rft.atitle=Structural%20perfection%20in%20physisorbed%20films:%20A%20synchrotron%20x-ray%20diffraction%20study%20of%20xenon%20adsorbed%20on%20the%20Ag(111)%20surface&rft.jtitle=Physical%20review%20letters&rft.au=Dai,%20P&rft.date=1994-01-31&rft.volume=72&rft.issue=5&rft.spage=685&rft.epage=688&rft.pages=685-688&rft.issn=0031-9007&rft.eissn=1079-7114&rft_id=info:doi/10.1103/physrevlett.72.685&rft_dat=%3Cproquest_osti_%3E26607084%3C/proquest_osti_%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_pqid=1859276383&rft_id=info:pmid/10056497&rfr_iscdi=true |