Comparison of semiclassical calculations to experiment for spin valve films grown on oxide surfaces

The physical properties of spin valve films grown on the surface of nano-oxide layers were studied as a function of Cu spacer layer thickness. In comparison to identical structures without the oxide surface, the films exhibited an increase in ΔR/R of 30% accompanied by a reduction of only 5% in resi...

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Veröffentlicht in:	Journal of applied physics 2001-06, Vol.89 (11), p.6949-6951
Hauptverfasser:	Gibbons, Matthew R., Mao, Ming, Chien, Chester
Format:	Artikel
Sprache:	eng
Schlagworte:	CLASSICAL AND QUANTUM MECHANICS, GENERAL PHYSICS EFFICIENCY MAGNETORESISTANCE OXIDES PHYSICAL PROPERTIES PHYSICS REFLECTION SPACERS SPIN THICKNESS VALVES
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