Nano-compositional imaging of the lanthanum silicide system at THz wavelengths

Terahertz scattering-type scanning near-field optical microscopy (THz-sSNOM) provides a noninvasive way to probe the low frequency conductivity of materials and to characterize material compositions at the nanoscale. However, the potential capability of atomic compositional analysis with THz nanosco...

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Veröffentlicht in:	Optics express 2024-01, Vol.32 (2), p.2356-2363
Hauptverfasser:	Kim, R H J, Pathak, A K, Park, J-M, Imran, M, Haeuser, S J, Fei, Z, Mudryk, Y, Koschny, T, Wang, J
Format:	Artikel
Sprache:	eng
Schlagworte:	OTHER INSTRUMENTATION
Online-Zugang:	Volltext
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