Advanced processing of EBSD data to distinguish the complex microstructure evolution of a Cu-Ni-Si alloy induced by fatigue

The present work aims at identifying the evolution of the microstructure of a Cu-Ni-Si (Corson alloy) alloy after low cycle fatigue by means of advanced electron microscopy analysis techniques (SEM-ECCI, Orientation Imaging Microscopy by means of SEM-EBSD and TEM). Deep attention is paid on the mate...

Ausführliche Beschreibung

Gespeichert in:

Bibliographische Detailangaben
Veröffentlicht in:	Materials characterization 2018-11, Vol.145, p.556-562
Hauptverfasser:	Bouquerel, Jérémie, Delbove, Maxime, Vogt, Jean-Bernard
Format:	Artikel
Sprache:	eng
Schlagworte:	BACKSCATTERING Chemical Sciences Condensed Matter COPPER COMPOUNDS Cu-Ni-Si DISLOCATIONS ELECTRON DIFFRACTION Low Cycle Fatigue Material chemistry MATERIALS SCIENCE MICROSTRUCTURE NICKEL COMPOUNDS ORIENTATION Orientation Imaging Microscopy Physics Precipitates free zones PRECIPITATION PROCESSING SCANNING ELECTRON MICROSCOPY SILICON COMPOUNDS TERNARY ALLOY SYSTEMS TRANSMISSION ELECTRON MICROSCOPY
Online-Zugang:	Volltext
Tags:	Tag hinzufügen Keine Tags, Fügen Sie den ersten Tag hinzu!

Schreiben Sie den ersten Kommentar!