Electron Energy-Loss Spectroscopy Study of the Change in the Free-Electron Density in Thin Superconducting NbN Films under Ion-Beam Irradiation
The change in the free-electron density in ultrathin (5 nm) superconducting NbN films in the initial state and after irradiation by O + ions to doses of (0.1–0.9) × 10 17 cm –2 has been studied by electron energy-loss spectroscopy (EELS). The analysis has been performed on cross section samples prep...
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| Veröffentlicht in: | Crystallography reports 2018-03, Vol.63 (2), p.241-244 |
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| creator | Prikhodko, K. E. Dementyeva, M. M. Gurovich, B. A. Komarov, D. A. Kutuzov, L. V. |
| description | The change in the free-electron density in ultrathin (5 nm) superconducting NbN films in the initial state and after irradiation by O
+
ions to doses of (0.1–0.9) × 10
17
cm
–2
has been studied by electron energy-loss spectroscopy (EELS). The analysis has been performed on cross section samples prepared by the focused ion beam method, using plasmon oscillations with energies up to 50 eV. The radiation-induced replacement of nitrogen atoms with oxygen atoms in niobium nitride is found to change the electrical properties of the material, which leads to a decrease in the free-electron density with an increase in the irradiation dose. |
| doi_str_mv | 10.1134/S1063774518020219 |
| format | Article |
| fullrecord | <record><control><sourceid>proquest_osti_</sourceid><recordid>TN_cdi_osti_scitechconnect_22758259</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>2023436624</sourcerecordid><originalsourceid>FETCH-LOGICAL-c296t-a4f1bc89fccc1e93ea54668fc773721c87bedefea2796dc70b76f79bd3bbee893</originalsourceid><addsrcrecordid>eNp1Ud1OwyAUbowm_j6AdyReV4G2QC91brpk0YvNxLuG0tONZYMK9KJP4SvLnFET4w0HzveTw3eS5JLga0Ky_GZOMMs4zwsiMMWUlAfJCSkYTZkoXw_jPcLpDj9OTr1fY4yFIPlJ8j7egArOGjQ24JZDOrPeo3n32fTKdgOah74ZkG1RWAEaraRZAtLm8zVxAOm3wz0Yr8OwAxereMz7DpyypulV0GaJnuonNNGbrUe9acChqTXpHcgtmjonGy2DtuY8OWrlxsPFVz1LXibjxegxnT0_TEe3s1TRkoVU5i2plShbpRSBMgNZ5IyJVnGecUqU4DU00IKkvGSN4rjmrOVl3WR1DSDK7Cy52vtaH3TllQ6gVnFWE_9SUcoLQYtfrM7Ztx58qNa2dyYOVsWQszxjjOaRRfYsFSPzDtqqc3or3VARXO22U_3ZTtTQvcZHbkzU_Tj_L_oADteS7w</addsrcrecordid><sourcetype>Open Access Repository</sourcetype><iscdi>true</iscdi><recordtype>article</recordtype><pqid>2023436624</pqid></control><display><type>article</type><title>Electron Energy-Loss Spectroscopy Study of the Change in the Free-Electron Density in Thin Superconducting NbN Films under Ion-Beam Irradiation</title><source>SpringerNature Journals</source><creator>Prikhodko, K. E. ; Dementyeva, M. M. ; Gurovich, B. A. ; Komarov, D. A. ; Kutuzov, L. V.</creator><creatorcontrib>Prikhodko, K. E. ; Dementyeva, M. M. ; Gurovich, B. A. ; Komarov, D. A. ; Kutuzov, L. V.</creatorcontrib><description>The change in the free-electron density in ultrathin (5 nm) superconducting NbN films in the initial state and after irradiation by O
+
ions to doses of (0.1–0.9) × 10
17
cm
–2
has been studied by electron energy-loss spectroscopy (EELS). The analysis has been performed on cross section samples prepared by the focused ion beam method, using plasmon oscillations with energies up to 50 eV. The radiation-induced replacement of nitrogen atoms with oxygen atoms in niobium nitride is found to change the electrical properties of the material, which leads to a decrease in the free-electron density with an increase in the irradiation dose.</description><identifier>ISSN: 1063-7745</identifier><identifier>EISSN: 1562-689X</identifier><identifier>DOI: 10.1134/S1063774518020219</identifier><language>eng</language><publisher>Moscow: Pleiades Publishing</publisher><subject>ATOMS ; CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY ; CROSS SECTIONS ; Crystallography and Scattering Methods ; ELECTRICAL PROPERTIES ; ELECTRON DENSITY ; Electron energy ; Electron energy loss spectroscopy ; Electrons ; ENERGY-LOSS SPECTROSCOPY ; ION BEAMS ; IRRADIATION ; Niobium nitride ; NIOBIUM NITRIDES ; NITROGEN ; Nitrogen atoms ; OXYGEN ; Oxygen atoms ; OXYGEN IONS ; Physics ; Physics and Astronomy ; PLASMONS ; Radiation dosage ; RADIATION DOSES ; Radiation effects ; Spectroscopic analysis ; Spectrum analysis ; SUPERCONDUCTING FILMS ; Superconductivity ; Surface and Thin Films ; Thin films</subject><ispartof>Crystallography reports, 2018-03, Vol.63 (2), p.241-244</ispartof><rights>Pleiades Publishing, Inc. 2018</rights><rights>Copyright Springer Science & Business Media 2018</rights><lds50>peer_reviewed</lds50><woscitedreferencessubscribed>false</woscitedreferencessubscribed><cites>FETCH-LOGICAL-c296t-a4f1bc89fccc1e93ea54668fc773721c87bedefea2796dc70b76f79bd3bbee893</cites></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktopdf>$$Uhttps://link.springer.com/content/pdf/10.1134/S1063774518020219$$EPDF$$P50$$Gspringer$$H</linktopdf><linktohtml>$$Uhttps://link.springer.com/10.1134/S1063774518020219$$EHTML$$P50$$Gspringer$$H</linktohtml><link.rule.ids>230,315,782,786,887,27933,27934,41497,42566,51328</link.rule.ids><backlink>$$Uhttps://www.osti.gov/biblio/22758259$$D View this record in Osti.gov$$Hfree_for_read</backlink></links><search><creatorcontrib>Prikhodko, K. E.</creatorcontrib><creatorcontrib>Dementyeva, M. M.</creatorcontrib><creatorcontrib>Gurovich, B. A.</creatorcontrib><creatorcontrib>Komarov, D. A.</creatorcontrib><creatorcontrib>Kutuzov, L. V.</creatorcontrib><title>Electron Energy-Loss Spectroscopy Study of the Change in the Free-Electron Density in Thin Superconducting NbN Films under Ion-Beam Irradiation</title><title>Crystallography reports</title><addtitle>Crystallogr. Rep</addtitle><description>The change in the free-electron density in ultrathin (5 nm) superconducting NbN films in the initial state and after irradiation by O
+
ions to doses of (0.1–0.9) × 10
17
cm
–2
has been studied by electron energy-loss spectroscopy (EELS). The analysis has been performed on cross section samples prepared by the focused ion beam method, using plasmon oscillations with energies up to 50 eV. The radiation-induced replacement of nitrogen atoms with oxygen atoms in niobium nitride is found to change the electrical properties of the material, which leads to a decrease in the free-electron density with an increase in the irradiation dose.</description><subject>ATOMS</subject><subject>CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY</subject><subject>CROSS SECTIONS</subject><subject>Crystallography and Scattering Methods</subject><subject>ELECTRICAL PROPERTIES</subject><subject>ELECTRON DENSITY</subject><subject>Electron energy</subject><subject>Electron energy loss spectroscopy</subject><subject>Electrons</subject><subject>ENERGY-LOSS SPECTROSCOPY</subject><subject>ION BEAMS</subject><subject>IRRADIATION</subject><subject>Niobium nitride</subject><subject>NIOBIUM NITRIDES</subject><subject>NITROGEN</subject><subject>Nitrogen atoms</subject><subject>OXYGEN</subject><subject>Oxygen atoms</subject><subject>OXYGEN IONS</subject><subject>Physics</subject><subject>Physics and Astronomy</subject><subject>PLASMONS</subject><subject>Radiation dosage</subject><subject>RADIATION DOSES</subject><subject>Radiation effects</subject><subject>Spectroscopic analysis</subject><subject>Spectrum analysis</subject><subject>SUPERCONDUCTING FILMS</subject><subject>Superconductivity</subject><subject>Surface and Thin Films</subject><subject>Thin films</subject><issn>1063-7745</issn><issn>1562-689X</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2018</creationdate><recordtype>article</recordtype><recordid>eNp1Ud1OwyAUbowm_j6AdyReV4G2QC91brpk0YvNxLuG0tONZYMK9KJP4SvLnFET4w0HzveTw3eS5JLga0Ky_GZOMMs4zwsiMMWUlAfJCSkYTZkoXw_jPcLpDj9OTr1fY4yFIPlJ8j7egArOGjQ24JZDOrPeo3n32fTKdgOah74ZkG1RWAEaraRZAtLm8zVxAOm3wz0Yr8OwAxereMz7DpyypulV0GaJnuonNNGbrUe9acChqTXpHcgtmjonGy2DtuY8OWrlxsPFVz1LXibjxegxnT0_TEe3s1TRkoVU5i2plShbpRSBMgNZ5IyJVnGecUqU4DU00IKkvGSN4rjmrOVl3WR1DSDK7Cy52vtaH3TllQ6gVnFWE_9SUcoLQYtfrM7Ztx58qNa2dyYOVsWQszxjjOaRRfYsFSPzDtqqc3or3VARXO22U_3ZTtTQvcZHbkzU_Tj_L_oADteS7w</recordid><startdate>20180301</startdate><enddate>20180301</enddate><creator>Prikhodko, K. E.</creator><creator>Dementyeva, M. M.</creator><creator>Gurovich, B. A.</creator><creator>Komarov, D. A.</creator><creator>Kutuzov, L. V.</creator><general>Pleiades Publishing</general><general>Springer Nature B.V</general><scope>AAYXX</scope><scope>CITATION</scope><scope>OTOTI</scope></search><sort><creationdate>20180301</creationdate><title>Electron Energy-Loss Spectroscopy Study of the Change in the Free-Electron Density in Thin Superconducting NbN Films under Ion-Beam Irradiation</title><author>Prikhodko, K. E. ; Dementyeva, M. M. ; Gurovich, B. A. ; Komarov, D. A. ; Kutuzov, L. V.</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c296t-a4f1bc89fccc1e93ea54668fc773721c87bedefea2796dc70b76f79bd3bbee893</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2018</creationdate><topic>ATOMS</topic><topic>CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY</topic><topic>CROSS SECTIONS</topic><topic>Crystallography and Scattering Methods</topic><topic>ELECTRICAL PROPERTIES</topic><topic>ELECTRON DENSITY</topic><topic>Electron energy</topic><topic>Electron energy loss spectroscopy</topic><topic>Electrons</topic><topic>ENERGY-LOSS SPECTROSCOPY</topic><topic>ION BEAMS</topic><topic>IRRADIATION</topic><topic>Niobium nitride</topic><topic>NIOBIUM NITRIDES</topic><topic>NITROGEN</topic><topic>Nitrogen atoms</topic><topic>OXYGEN</topic><topic>Oxygen atoms</topic><topic>OXYGEN IONS</topic><topic>Physics</topic><topic>Physics and Astronomy</topic><topic>PLASMONS</topic><topic>Radiation dosage</topic><topic>RADIATION DOSES</topic><topic>Radiation effects</topic><topic>Spectroscopic analysis</topic><topic>Spectrum analysis</topic><topic>SUPERCONDUCTING FILMS</topic><topic>Superconductivity</topic><topic>Surface and Thin Films</topic><topic>Thin films</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Prikhodko, K. E.</creatorcontrib><creatorcontrib>Dementyeva, M. M.</creatorcontrib><creatorcontrib>Gurovich, B. A.</creatorcontrib><creatorcontrib>Komarov, D. A.</creatorcontrib><creatorcontrib>Kutuzov, L. V.</creatorcontrib><collection>CrossRef</collection><collection>OSTI.GOV</collection><jtitle>Crystallography reports</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Prikhodko, K. E.</au><au>Dementyeva, M. M.</au><au>Gurovich, B. A.</au><au>Komarov, D. A.</au><au>Kutuzov, L. V.</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Electron Energy-Loss Spectroscopy Study of the Change in the Free-Electron Density in Thin Superconducting NbN Films under Ion-Beam Irradiation</atitle><jtitle>Crystallography reports</jtitle><stitle>Crystallogr. Rep</stitle><date>2018-03-01</date><risdate>2018</risdate><volume>63</volume><issue>2</issue><spage>241</spage><epage>244</epage><pages>241-244</pages><issn>1063-7745</issn><eissn>1562-689X</eissn><abstract>The change in the free-electron density in ultrathin (5 nm) superconducting NbN films in the initial state and after irradiation by O
+
ions to doses of (0.1–0.9) × 10
17
cm
–2
has been studied by electron energy-loss spectroscopy (EELS). The analysis has been performed on cross section samples prepared by the focused ion beam method, using plasmon oscillations with energies up to 50 eV. The radiation-induced replacement of nitrogen atoms with oxygen atoms in niobium nitride is found to change the electrical properties of the material, which leads to a decrease in the free-electron density with an increase in the irradiation dose.</abstract><cop>Moscow</cop><pub>Pleiades Publishing</pub><doi>10.1134/S1063774518020219</doi><tpages>4</tpages></addata></record> |
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| subjects | ATOMS CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY CROSS SECTIONS Crystallography and Scattering Methods ELECTRICAL PROPERTIES ELECTRON DENSITY Electron energy Electron energy loss spectroscopy Electrons ENERGY-LOSS SPECTROSCOPY ION BEAMS IRRADIATION Niobium nitride NIOBIUM NITRIDES NITROGEN Nitrogen atoms OXYGEN Oxygen atoms OXYGEN IONS Physics Physics and Astronomy PLASMONS Radiation dosage RADIATION DOSES Radiation effects Spectroscopic analysis Spectrum analysis SUPERCONDUCTING FILMS Superconductivity Surface and Thin Films Thin films |
| title | Electron Energy-Loss Spectroscopy Study of the Change in the Free-Electron Density in Thin Superconducting NbN Films under Ion-Beam Irradiation |
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