$Imaging diffraction VLS spectrometer for a wavelength range λ > 120 Å$

Imaging diffraction VLS spectrometer for a wavelength range λ > 120 Å

A broadband stigmatic (imaging) soft X-ray (λ > 120 Å) spectrometer is experimentally realised. The optical configuration of the spectrometer comprises a plane grazing-incidence reflection grating with a spacing varying across its aperture according to a preassigned law [a so-called varied line-s...

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Veröffentlicht in:	Quantum electronics (Woodbury, N.Y.) N.Y.), 2017-02, Vol.47 (1), p.54-57
Hauptverfasser:	Vishnyakov, E.A., Kolesnikov, A.O., Kuzin, A.A., Negrov, D.V., Ragozin, E.N., Sasorov, P.V., Shatokhin, A.N.
Format:	Artikel
Sprache:	eng
Schlagworte:	aperiodic multilayer mirror APERTURES Broadband CHARGE-COUPLED DEVICES DIFFRACTION GRATINGS INCIDENCE ANGLE INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY Ions LASER-PRODUCED PLASMA LAYERS Line spectra MOLYBDENUM Multilayers Plates (structural members) REFLECTION Resolution SILICON SOFT X RADIATION Soft x rays soft X-ray range SPATIAL RESOLUTION SPHERICAL CONFIGURATION stigmatic (imaging) spectrometer VLS grating WAVELENGTHS X ray imagery X-RAY SPECTROMETERS
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