Optical method for distance and displacement measurements of the probe-sample separation in a scanning near-field optical microscope
In this work, we present an alternative optical method to determine the probe-sample separation distance in a scanning near-field optical microscope. The experimental method is based in a Lloyd’s mirror interferometer and offers a measurement precision deviation of ∼100 nm using digital image proces...
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| Veröffentlicht in: | AIP advances 2016-04, Vol.6 (4), p.045007-045007-4 |
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| container_end_page | 045007-4 |
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| container_issue | 4 |
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| container_title | AIP advances |
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| creator | Santamaria, L. Garcia-Ortiz, C. E. Siller, H. R. Cortes, R. Coello, V. |
| description | In this work, we present an alternative optical method to determine the probe-sample separation distance in a scanning near-field optical microscope. The experimental method is based in a Lloyd’s mirror interferometer and offers a measurement precision deviation of ∼100 nm using digital image processing and numerical analysis. The technique can also be strategically combined with the characterization of piezoelectric actuators and stability evaluation of the optical system. It also opens the possibility for the development of an automatic approximation control system valid for probe-sample distances from 5 to 500 μm. |
| doi_str_mv | 10.1063/1.4947114 |
| format | Article |
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It also opens the possibility for the development of an automatic approximation control system valid for probe-sample distances from 5 to 500 μm.</description><subject>ACCURACY</subject><subject>APPROXIMATIONS</subject><subject>Automatic control</subject><subject>CLASSICAL AND QUANTUM MECHANICS, GENERAL PHYSICS</subject><subject>CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY</subject><subject>CONTROL SYSTEMS</subject><subject>Digital imaging</subject><subject>DISTANCE</subject><subject>IMAGE PROCESSING</subject><subject>INTERFEROMETERS</subject><subject>Microscopes</subject><subject>MIRRORS</subject><subject>Near field optical microscopes</subject><subject>NUMERICAL ANALYSIS</subject><subject>OPTICAL MICROSCOPES</subject><subject>OPTICAL SYSTEMS</subject><subject>Piezoelectric actuators</subject><subject>PIEZOELECTRICITY</subject><subject>Separation</subject><subject>STABILITY</subject><subject>Stability analysis</subject><issn>2158-3226</issn><issn>2158-3226</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2016</creationdate><recordtype>article</recordtype><sourceid>DOA</sourceid><recordid>eNqdkU2LFDEQhhtRcFn34D8IeFLoNV-d7hxl8WNhYS96DpV0ZSdDT9ImGcG7P9z0zOp6NpdUhYe33rzVda8ZvWZUiffsWmo5MiafdRecDVMvOFfP_6lfdlel7Gk7UjM6yYvu1_1ag4OFHLDu0kx8ymQOpUJ0SCDOW7Mu4PCAsTYIyjGf6kKSJ3WHZM3JYl_gsC5ICq6QoYYUSYgESHEQY4gPJCLk3gdcZpL-TAwup-LSiq-6Fx6WgleP92X37dPHrzdf-rv7z7c3H-56JwdVey8UOuR2dFYNWjvHJpRaMaZQUfRaKADUVvjZCuW8GLm2zlk-DhSGYfDisrs9684J9mbN4QD5p0kQzOkh5QcDuZlb0GjJqPZSWD1YCTO3E1DFnRy594NX0LTenLVSqcEUFyq6nUsxoqumRd1cSfZEtZS-H7FUs0_HHNsnDWecTVSPYqPenqktkJLR__XGqNk2a5h53Gxj353ZbeQp6f-Df6T8BJp19uI3oYGy2w</recordid><startdate>20160401</startdate><enddate>20160401</enddate><creator>Santamaria, L.</creator><creator>Garcia-Ortiz, C. 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R.</au><au>Cortes, R.</au><au>Coello, V.</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Optical method for distance and displacement measurements of the probe-sample separation in a scanning near-field optical microscope</atitle><jtitle>AIP advances</jtitle><date>2016-04-01</date><risdate>2016</risdate><volume>6</volume><issue>4</issue><spage>045007</spage><epage>045007-4</epage><pages>045007-045007-4</pages><issn>2158-3226</issn><eissn>2158-3226</eissn><coden>AAIDBI</coden><abstract>In this work, we present an alternative optical method to determine the probe-sample separation distance in a scanning near-field optical microscope. The experimental method is based in a Lloyd’s mirror interferometer and offers a measurement precision deviation of ∼100 nm using digital image processing and numerical analysis. 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| source | DOAJ Directory of Open Access Journals; EZB-FREE-00999 freely available EZB journals; Alma/SFX Local Collection; Free Full-Text Journals in Chemistry |
| subjects | ACCURACY APPROXIMATIONS Automatic control CLASSICAL AND QUANTUM MECHANICS, GENERAL PHYSICS CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY CONTROL SYSTEMS Digital imaging DISTANCE IMAGE PROCESSING INTERFEROMETERS Microscopes MIRRORS Near field optical microscopes NUMERICAL ANALYSIS OPTICAL MICROSCOPES OPTICAL SYSTEMS Piezoelectric actuators PIEZOELECTRICITY Separation STABILITY Stability analysis |
| title | Optical method for distance and displacement measurements of the probe-sample separation in a scanning near-field optical microscope |
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