A new generation of x-ray spectrometry UHV instruments at the SR facilities BESSY II, ELETTRA and SOLEIL
A novel type of ultra-high vacuum instrument for X-ray reflectometry and spectrometry-related techniques for nanoanalytics by means of synchrotron radiation (SR) has been constructed and commissioned at BESSY II. This versa-tile instrument was developed by the PTB, Germany’s national metrology insti...
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| creator | Lubeck, J. Bogovac, M. Boyer, B. Detlefs, B. Eichert, D. Fliegauf, R. Grötzsch, D. Holfelder, I. Hönicke, P. Jark, W. Kaiser, R. B. Kanngießer, B. Karydas, A. G. Leani, J. J. Lépy, M. C. Lühl, L. Ménesguen, Y. Migliori, A. Müller, M. Pollakowski, B. Spanier, M. Sghaier, H. Ulm, G. Weser, J. Beckhoff, B. |
| description | A novel type of ultra-high vacuum instrument for X-ray reflectometry and spectrometry-related techniques for nanoanalytics by means of synchrotron radiation (SR) has been constructed and commissioned at BESSY II. This versa-tile instrument was developed by the PTB, Germany’s national metrology institute, and includes a 9-axis manipulator that allows for an independent alignment of the samples with respect to all degrees of freedom. In addition, it integrates a ro-tational and translational movement of several photodiodes as well as a translational movement of a beam-geometry-defining aperture system. Thus, the new instrument enables various analytical techniques based on energy dispersive X-ray detectors such as reference-free X-Ray Fluorescence (XRF) analysis, total-reflection XRF, grazing-incidence XRF, in addition to optional X-Ray Reflectometry (XRR) measurements or polarization-dependent X-ray absorption fine structure analyses (XAFS). Samples having a size of up to (100 × 100) mm2; can be analyzed with respect to their mass depo-sition, elemental, spatial or species composition. Surface contamination, nanolayer composition and thickness, depth pro-file of matrix elements or implants, nanoparticles or buried interfaces as well as molecular orientation of bonds can be accessed. Three technology transfer projects of adapted instruments have enhanced X-Ray Spectrometry (XRS) research activities within Europe at the synchrotron radiation facilities ELETTRA (IAEA) and SOLEIL (CEA/LNE-LNHB) as well as at the X-ray innovation laboratory BLiX (TU Berlin) where different laboratory sources are used. Here, smaller chamber requirements led PTB in cooperation with TU Berlin to develop a modified instrument equipped with a 7-axis manipulator: reduced freedom in the choice of experimental geometry modifications (absence of out-of-SR-plane and reference-free XRS options) has been compensated by encoder-enhanced angular accuracy for GIXRF and XRR. |
| doi_str_mv | 10.1063/1.4952834 |
| format | Conference Proceeding |
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B. ; Kanngießer, B. ; Karydas, A. G. ; Leani, J. J. ; Lépy, M. C. ; Lühl, L. ; Ménesguen, Y. ; Migliori, A. ; Müller, M. ; Pollakowski, B. ; Spanier, M. ; Sghaier, H. ; Ulm, G. ; Weser, J. ; Beckhoff, B.</creator><contributor>Nelson, Christie ; Shen, Qun</contributor><creatorcontrib>Lubeck, J. ; Bogovac, M. ; Boyer, B. ; Detlefs, B. ; Eichert, D. ; Fliegauf, R. ; Grötzsch, D. ; Holfelder, I. ; Hönicke, P. ; Jark, W. ; Kaiser, R. B. ; Kanngießer, B. ; Karydas, A. G. ; Leani, J. J. ; Lépy, M. C. ; Lühl, L. ; Ménesguen, Y. ; Migliori, A. ; Müller, M. ; Pollakowski, B. ; Spanier, M. ; Sghaier, H. ; Ulm, G. ; Weser, J. ; Beckhoff, B. ; Nelson, Christie ; Shen, Qun</creatorcontrib><description>A novel type of ultra-high vacuum instrument for X-ray reflectometry and spectrometry-related techniques for nanoanalytics by means of synchrotron radiation (SR) has been constructed and commissioned at BESSY II. This versa-tile instrument was developed by the PTB, Germany’s national metrology institute, and includes a 9-axis manipulator that allows for an independent alignment of the samples with respect to all degrees of freedom. In addition, it integrates a ro-tational and translational movement of several photodiodes as well as a translational movement of a beam-geometry-defining aperture system. Thus, the new instrument enables various analytical techniques based on energy dispersive X-ray detectors such as reference-free X-Ray Fluorescence (XRF) analysis, total-reflection XRF, grazing-incidence XRF, in addition to optional X-Ray Reflectometry (XRR) measurements or polarization-dependent X-ray absorption fine structure analyses (XAFS). Samples having a size of up to (100 × 100) mm2; can be analyzed with respect to their mass depo-sition, elemental, spatial or species composition. Surface contamination, nanolayer composition and thickness, depth pro-file of matrix elements or implants, nanoparticles or buried interfaces as well as molecular orientation of bonds can be accessed. Three technology transfer projects of adapted instruments have enhanced X-Ray Spectrometry (XRS) research activities within Europe at the synchrotron radiation facilities ELETTRA (IAEA) and SOLEIL (CEA/LNE-LNHB) as well as at the X-ray innovation laboratory BLiX (TU Berlin) where different laboratory sources are used. Here, smaller chamber requirements led PTB in cooperation with TU Berlin to develop a modified instrument equipped with a 7-axis manipulator: reduced freedom in the choice of experimental geometry modifications (absence of out-of-SR-plane and reference-free XRS options) has been compensated by encoder-enhanced angular accuracy for GIXRF and XRR.</description><identifier>ISSN: 0094-243X</identifier><identifier>EISSN: 1551-7616</identifier><identifier>DOI: 10.1063/1.4952834</identifier><identifier>CODEN: APCPCS</identifier><language>eng</language><publisher>United States: AIP Publishing</publisher><subject>ABSORPTION ; ABSORPTION SPECTROSCOPY ; ACCURACY ; Analytical chemistry ; APERTURES ; BESSY STORAGE RING ; Chemical Sciences ; DEGREES OF FREEDOM ; Engineering Sciences ; FINE STRUCTURE ; FLUORESCENCE ; Instrumentation and Detectors ; INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY ; INTERFACES ; MASS ; METROLOGY ; Nuclear Experiment ; Optics ; PHOTODIODES ; Photonic ; Physics ; POLARIZATION ; REFLECTION ; SURFACE CONTAMINATION ; SYNCHROTRON RADIATION ; X RADIATION ; X-RAY FLUORESCENCE ANALYSIS ; X-RAY SPECTROSCOPY</subject><ispartof>AIP conference proceedings, 2016, Vol.1741 (1)</ispartof><rights>Author(s)</rights><rights>Distributed under a Creative Commons Attribution 4.0 International License</rights><lds50>peer_reviewed</lds50><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-c362t-d8eb97e12b13057d03e81692dc6dddb195f7f647ca06bdd82e26623fe5c62caa3</citedby><orcidid>0000-0001-6427-9491 ; 0000-0003-2505-979X</orcidid></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://pubs.aip.org/acp/article-lookup/doi/10.1063/1.4952834$$EHTML$$P50$$Gscitation$$H</linktohtml><link.rule.ids>230,309,310,314,776,780,790,881,4498,27901,27902,76126</link.rule.ids><backlink>$$Uhttps://hal.science/hal-01891765$$DView record in HAL$$Hfree_for_read</backlink><backlink>$$Uhttps://www.osti.gov/biblio/22608348$$D View this record in Osti.gov$$Hfree_for_read</backlink></links><search><contributor>Nelson, Christie</contributor><contributor>Shen, Qun</contributor><creatorcontrib>Lubeck, J.</creatorcontrib><creatorcontrib>Bogovac, M.</creatorcontrib><creatorcontrib>Boyer, B.</creatorcontrib><creatorcontrib>Detlefs, B.</creatorcontrib><creatorcontrib>Eichert, D.</creatorcontrib><creatorcontrib>Fliegauf, R.</creatorcontrib><creatorcontrib>Grötzsch, D.</creatorcontrib><creatorcontrib>Holfelder, I.</creatorcontrib><creatorcontrib>Hönicke, P.</creatorcontrib><creatorcontrib>Jark, W.</creatorcontrib><creatorcontrib>Kaiser, R. B.</creatorcontrib><creatorcontrib>Kanngießer, B.</creatorcontrib><creatorcontrib>Karydas, A. G.</creatorcontrib><creatorcontrib>Leani, J. J.</creatorcontrib><creatorcontrib>Lépy, M. C.</creatorcontrib><creatorcontrib>Lühl, L.</creatorcontrib><creatorcontrib>Ménesguen, Y.</creatorcontrib><creatorcontrib>Migliori, A.</creatorcontrib><creatorcontrib>Müller, M.</creatorcontrib><creatorcontrib>Pollakowski, B.</creatorcontrib><creatorcontrib>Spanier, M.</creatorcontrib><creatorcontrib>Sghaier, H.</creatorcontrib><creatorcontrib>Ulm, G.</creatorcontrib><creatorcontrib>Weser, J.</creatorcontrib><creatorcontrib>Beckhoff, B.</creatorcontrib><title>A new generation of x-ray spectrometry UHV instruments at the SR facilities BESSY II, ELETTRA and SOLEIL</title><title>AIP conference proceedings</title><description>A novel type of ultra-high vacuum instrument for X-ray reflectometry and spectrometry-related techniques for nanoanalytics by means of synchrotron radiation (SR) has been constructed and commissioned at BESSY II. This versa-tile instrument was developed by the PTB, Germany’s national metrology institute, and includes a 9-axis manipulator that allows for an independent alignment of the samples with respect to all degrees of freedom. In addition, it integrates a ro-tational and translational movement of several photodiodes as well as a translational movement of a beam-geometry-defining aperture system. Thus, the new instrument enables various analytical techniques based on energy dispersive X-ray detectors such as reference-free X-Ray Fluorescence (XRF) analysis, total-reflection XRF, grazing-incidence XRF, in addition to optional X-Ray Reflectometry (XRR) measurements or polarization-dependent X-ray absorption fine structure analyses (XAFS). Samples having a size of up to (100 × 100) mm2; can be analyzed with respect to their mass depo-sition, elemental, spatial or species composition. Surface contamination, nanolayer composition and thickness, depth pro-file of matrix elements or implants, nanoparticles or buried interfaces as well as molecular orientation of bonds can be accessed. Three technology transfer projects of adapted instruments have enhanced X-Ray Spectrometry (XRS) research activities within Europe at the synchrotron radiation facilities ELETTRA (IAEA) and SOLEIL (CEA/LNE-LNHB) as well as at the X-ray innovation laboratory BLiX (TU Berlin) where different laboratory sources are used. Here, smaller chamber requirements led PTB in cooperation with TU Berlin to develop a modified instrument equipped with a 7-axis manipulator: reduced freedom in the choice of experimental geometry modifications (absence of out-of-SR-plane and reference-free XRS options) has been compensated by encoder-enhanced angular accuracy for GIXRF and XRR.</description><subject>ABSORPTION</subject><subject>ABSORPTION SPECTROSCOPY</subject><subject>ACCURACY</subject><subject>Analytical chemistry</subject><subject>APERTURES</subject><subject>BESSY STORAGE RING</subject><subject>Chemical Sciences</subject><subject>DEGREES OF FREEDOM</subject><subject>Engineering Sciences</subject><subject>FINE STRUCTURE</subject><subject>FLUORESCENCE</subject><subject>Instrumentation and Detectors</subject><subject>INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY</subject><subject>INTERFACES</subject><subject>MASS</subject><subject>METROLOGY</subject><subject>Nuclear Experiment</subject><subject>Optics</subject><subject>PHOTODIODES</subject><subject>Photonic</subject><subject>Physics</subject><subject>POLARIZATION</subject><subject>REFLECTION</subject><subject>SURFACE CONTAMINATION</subject><subject>SYNCHROTRON RADIATION</subject><subject>X RADIATION</subject><subject>X-RAY FLUORESCENCE ANALYSIS</subject><subject>X-RAY SPECTROSCOPY</subject><issn>0094-243X</issn><issn>1551-7616</issn><fulltext>true</fulltext><rsrctype>conference_proceeding</rsrctype><creationdate>2016</creationdate><recordtype>conference_proceeding</recordtype><recordid>eNp9kF1LwzAYhYMoOKcX_oOAV4qd-WjT9nKO6goFYd1Er0KapDaytSOJ0_17Ozf0zqsDL8974DwAXGI0wojROzwK04gkNDwCAxxFOIgZZsdggFAaBiSkL6fgzLl3hEgax8kANGPY6k_4pltthTddC7safgVWbKFba-ltt9LebuFi-gxN67z9WOnWOyg89I2G5QzWQpql8UY7eJ-V5SvM81uYFdl8PhtD0SpYPhVZXpyDk1osnb445BAsHrL5ZBoUT4_5ZFwEkjLiA5XoKo01JhWmKIoVojrBLCVKMqVUhdOojmsWxlIgVimVEE0YI7TWkWRECkGH4Grf2zlvuJPGa9nIrm37MZwQhno3SU9d76lGLPnampWwW94Jw6fjgu9uCCcpjlm0wT17s2d3ZT-Ofj8w4jvrHPOD9f_gTWf_QL5WNf0GaWCANg</recordid><startdate>20160727</startdate><enddate>20160727</enddate><creator>Lubeck, J.</creator><creator>Bogovac, M.</creator><creator>Boyer, B.</creator><creator>Detlefs, B.</creator><creator>Eichert, D.</creator><creator>Fliegauf, R.</creator><creator>Grötzsch, D.</creator><creator>Holfelder, I.</creator><creator>Hönicke, P.</creator><creator>Jark, W.</creator><creator>Kaiser, R. B.</creator><creator>Kanngießer, B.</creator><creator>Karydas, A. G.</creator><creator>Leani, J. J.</creator><creator>Lépy, M. C.</creator><creator>Lühl, L.</creator><creator>Ménesguen, Y.</creator><creator>Migliori, A.</creator><creator>Müller, M.</creator><creator>Pollakowski, B.</creator><creator>Spanier, M.</creator><creator>Sghaier, H.</creator><creator>Ulm, G.</creator><creator>Weser, J.</creator><creator>Beckhoff, B.</creator><general>AIP Publishing</general><scope>1XC</scope><scope>VOOES</scope><scope>OTOTI</scope><orcidid>https://orcid.org/0000-0001-6427-9491</orcidid><orcidid>https://orcid.org/0000-0003-2505-979X</orcidid></search><sort><creationdate>20160727</creationdate><title>A new generation of x-ray spectrometry UHV instruments at the SR facilities BESSY II, ELETTRA and SOLEIL</title><author>Lubeck, J. ; Bogovac, M. ; Boyer, B. ; Detlefs, B. ; Eichert, D. ; Fliegauf, R. ; Grötzsch, D. ; Holfelder, I. ; Hönicke, P. ; Jark, W. ; Kaiser, R. B. ; Kanngießer, B. ; Karydas, A. G. ; Leani, J. J. ; Lépy, M. C. ; Lühl, L. ; Ménesguen, Y. ; Migliori, A. ; Müller, M. ; Pollakowski, B. ; Spanier, M. ; Sghaier, H. ; Ulm, G. ; Weser, J. ; Beckhoff, B.</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c362t-d8eb97e12b13057d03e81692dc6dddb195f7f647ca06bdd82e26623fe5c62caa3</frbrgroupid><rsrctype>conference_proceedings</rsrctype><prefilter>conference_proceedings</prefilter><language>eng</language><creationdate>2016</creationdate><topic>ABSORPTION</topic><topic>ABSORPTION SPECTROSCOPY</topic><topic>ACCURACY</topic><topic>Analytical chemistry</topic><topic>APERTURES</topic><topic>BESSY STORAGE RING</topic><topic>Chemical Sciences</topic><topic>DEGREES OF FREEDOM</topic><topic>Engineering Sciences</topic><topic>FINE STRUCTURE</topic><topic>FLUORESCENCE</topic><topic>Instrumentation and Detectors</topic><topic>INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY</topic><topic>INTERFACES</topic><topic>MASS</topic><topic>METROLOGY</topic><topic>Nuclear Experiment</topic><topic>Optics</topic><topic>PHOTODIODES</topic><topic>Photonic</topic><topic>Physics</topic><topic>POLARIZATION</topic><topic>REFLECTION</topic><topic>SURFACE CONTAMINATION</topic><topic>SYNCHROTRON RADIATION</topic><topic>X RADIATION</topic><topic>X-RAY FLUORESCENCE ANALYSIS</topic><topic>X-RAY SPECTROSCOPY</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Lubeck, J.</creatorcontrib><creatorcontrib>Bogovac, M.</creatorcontrib><creatorcontrib>Boyer, B.</creatorcontrib><creatorcontrib>Detlefs, B.</creatorcontrib><creatorcontrib>Eichert, D.</creatorcontrib><creatorcontrib>Fliegauf, R.</creatorcontrib><creatorcontrib>Grötzsch, D.</creatorcontrib><creatorcontrib>Holfelder, I.</creatorcontrib><creatorcontrib>Hönicke, P.</creatorcontrib><creatorcontrib>Jark, W.</creatorcontrib><creatorcontrib>Kaiser, R. 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G.</au><au>Leani, J. J.</au><au>Lépy, M. C.</au><au>Lühl, L.</au><au>Ménesguen, Y.</au><au>Migliori, A.</au><au>Müller, M.</au><au>Pollakowski, B.</au><au>Spanier, M.</au><au>Sghaier, H.</au><au>Ulm, G.</au><au>Weser, J.</au><au>Beckhoff, B.</au><au>Nelson, Christie</au><au>Shen, Qun</au><format>book</format><genre>proceeding</genre><ristype>CONF</ristype><atitle>A new generation of x-ray spectrometry UHV instruments at the SR facilities BESSY II, ELETTRA and SOLEIL</atitle><btitle>AIP conference proceedings</btitle><date>2016-07-27</date><risdate>2016</risdate><volume>1741</volume><issue>1</issue><issn>0094-243X</issn><eissn>1551-7616</eissn><coden>APCPCS</coden><abstract>A novel type of ultra-high vacuum instrument for X-ray reflectometry and spectrometry-related techniques for nanoanalytics by means of synchrotron radiation (SR) has been constructed and commissioned at BESSY II. This versa-tile instrument was developed by the PTB, Germany’s national metrology institute, and includes a 9-axis manipulator that allows for an independent alignment of the samples with respect to all degrees of freedom. In addition, it integrates a ro-tational and translational movement of several photodiodes as well as a translational movement of a beam-geometry-defining aperture system. Thus, the new instrument enables various analytical techniques based on energy dispersive X-ray detectors such as reference-free X-Ray Fluorescence (XRF) analysis, total-reflection XRF, grazing-incidence XRF, in addition to optional X-Ray Reflectometry (XRR) measurements or polarization-dependent X-ray absorption fine structure analyses (XAFS). Samples having a size of up to (100 × 100) mm2; can be analyzed with respect to their mass depo-sition, elemental, spatial or species composition. Surface contamination, nanolayer composition and thickness, depth pro-file of matrix elements or implants, nanoparticles or buried interfaces as well as molecular orientation of bonds can be accessed. Three technology transfer projects of adapted instruments have enhanced X-Ray Spectrometry (XRS) research activities within Europe at the synchrotron radiation facilities ELETTRA (IAEA) and SOLEIL (CEA/LNE-LNHB) as well as at the X-ray innovation laboratory BLiX (TU Berlin) where different laboratory sources are used. Here, smaller chamber requirements led PTB in cooperation with TU Berlin to develop a modified instrument equipped with a 7-axis manipulator: reduced freedom in the choice of experimental geometry modifications (absence of out-of-SR-plane and reference-free XRS options) has been compensated by encoder-enhanced angular accuracy for GIXRF and XRR.</abstract><cop>United States</cop><pub>AIP Publishing</pub><doi>10.1063/1.4952834</doi><tpages>4</tpages><orcidid>https://orcid.org/0000-0001-6427-9491</orcidid><orcidid>https://orcid.org/0000-0003-2505-979X</orcidid><oa>free_for_read</oa></addata></record> |
| fulltext | fulltext |
| identifier | ISSN: 0094-243X |
| ispartof | AIP conference proceedings, 2016, Vol.1741 (1) |
| issn | 0094-243X 1551-7616 |
| language | eng |
| recordid | cdi_osti_scitechconnect_22608348 |
| source | AIP Journals Complete |
| subjects | ABSORPTION ABSORPTION SPECTROSCOPY ACCURACY Analytical chemistry APERTURES BESSY STORAGE RING Chemical Sciences DEGREES OF FREEDOM Engineering Sciences FINE STRUCTURE FLUORESCENCE Instrumentation and Detectors INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY INTERFACES MASS METROLOGY Nuclear Experiment Optics PHOTODIODES Photonic Physics POLARIZATION REFLECTION SURFACE CONTAMINATION SYNCHROTRON RADIATION X RADIATION X-RAY FLUORESCENCE ANALYSIS X-RAY SPECTROSCOPY |
| title | A new generation of x-ray spectrometry UHV instruments at the SR facilities BESSY II, ELETTRA and SOLEIL |
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