Dielectric relaxation studies in Se{sub 90}Cd{sub 8}Sb{sub 2} glassy alloy
Se{sub 90}Cd{sub 8}Sb{sub 2} chalcogenide semiconducting alloy was prepared by melt quench technique. The prepared glassy alloy has been characterized by techniques such as scanning electron microscopy (SEM) and energy dispersive X-ray (EDAX).Dielectric properties of Se{sub 90}Cd{sub 8}Sb{sub 2} cha...
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| Veröffentlicht in: | AIP conference proceedings 2016-05, Vol.1728 (1) |
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| creator | Shukla, Nitesh Rao, Vandita Dwivedi, D. K. |
| description | Se{sub 90}Cd{sub 8}Sb{sub 2} chalcogenide semiconducting alloy was prepared by melt quench technique. The prepared glassy alloy has been characterized by techniques such as scanning electron microscopy (SEM) and energy dispersive X-ray (EDAX).Dielectric properties of Se{sub 90}Cd{sub 8}Sb{sub 2} chalcogenide semiconductor have been studied using impedance spectroscopic technique in the frequency range 5×10{sup 2}Hz - 1×10{sup 5}Hz and in temperature range 303-318K. It is found that dielectric constant ε′ and dielectric loss factor ε″ are dependent on frequency and temperature. |
| doi_str_mv | 10.1063/1.4946434 |
| format | Article |
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K.</creatorcontrib><description>Se{sub 90}Cd{sub 8}Sb{sub 2} chalcogenide semiconducting alloy was prepared by melt quench technique. The prepared glassy alloy has been characterized by techniques such as scanning electron microscopy (SEM) and energy dispersive X-ray (EDAX).Dielectric properties of Se{sub 90}Cd{sub 8}Sb{sub 2} chalcogenide semiconductor have been studied using impedance spectroscopic technique in the frequency range 5×10{sup 2}Hz - 1×10{sup 5}Hz and in temperature range 303-318K. 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K.</creatorcontrib><title>Dielectric relaxation studies in Se{sub 90}Cd{sub 8}Sb{sub 2} glassy alloy</title><title>AIP conference proceedings</title><description>Se{sub 90}Cd{sub 8}Sb{sub 2} chalcogenide semiconducting alloy was prepared by melt quench technique. The prepared glassy alloy has been characterized by techniques such as scanning electron microscopy (SEM) and energy dispersive X-ray (EDAX).Dielectric properties of Se{sub 90}Cd{sub 8}Sb{sub 2} chalcogenide semiconductor have been studied using impedance spectroscopic technique in the frequency range 5×10{sup 2}Hz - 1×10{sup 5}Hz and in temperature range 303-318K. It is found that dielectric constant ε′ and dielectric loss factor ε″ are dependent on frequency and temperature.</description><subject>ALLOYS</subject><subject>ANTIMONY COMPOUNDS</subject><subject>CADMIUM COMPOUNDS</subject><subject>CHALCOGENIDES</subject><subject>CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY</subject><subject>DIELECTRIC MATERIALS</subject><subject>ELECTRON SCANNING</subject><subject>FREQUENCY RANGE</subject><subject>METALLIC GLASSES</subject><subject>PERMITTIVITY</subject><subject>RELAXATION</subject><subject>SCANNING ELECTRON MICROSCOPY</subject><subject>SELENIUM COMPOUNDS</subject><subject>SEMICONDUCTOR MATERIALS</subject><subject>X RADIATION</subject><issn>0094-243X</issn><issn>1551-7616</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2016</creationdate><recordtype>article</recordtype><recordid>eNqNjU8LgjAcQEcUZH8OfYNBZ22bc-rZiuhqh24y56rFUPA3IQm_eyF9gE7vHR48hDaUBJSIcEcDnnLBQz5BHo0i6seCiinyCEm5z3h4naMFwJMQlsZx4qHz3mirlWuNwq228iWdaWoMrquMBmxqnOs3dCVOyZBVoyVDXo7CBny3EqDH0tqmX6HZTVrQ6x-XaHs8XLKT34AzBSjjtHqopq6_u4IxQQSPo_C_6gPJz0Hm</recordid><startdate>20160506</startdate><enddate>20160506</enddate><creator>Shukla, Nitesh</creator><creator>Rao, Vandita</creator><creator>Dwivedi, D. K.</creator><scope>OTOTI</scope></search><sort><creationdate>20160506</creationdate><title>Dielectric relaxation studies in Se{sub 90}Cd{sub 8}Sb{sub 2} glassy alloy</title><author>Shukla, Nitesh ; Rao, Vandita ; Dwivedi, D. K.</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-osti_scitechconnect_226064753</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2016</creationdate><topic>ALLOYS</topic><topic>ANTIMONY COMPOUNDS</topic><topic>CADMIUM COMPOUNDS</topic><topic>CHALCOGENIDES</topic><topic>CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY</topic><topic>DIELECTRIC MATERIALS</topic><topic>ELECTRON SCANNING</topic><topic>FREQUENCY RANGE</topic><topic>METALLIC GLASSES</topic><topic>PERMITTIVITY</topic><topic>RELAXATION</topic><topic>SCANNING ELECTRON MICROSCOPY</topic><topic>SELENIUM COMPOUNDS</topic><topic>SEMICONDUCTOR MATERIALS</topic><topic>X RADIATION</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Shukla, Nitesh</creatorcontrib><creatorcontrib>Rao, Vandita</creatorcontrib><creatorcontrib>Dwivedi, D. K.</creatorcontrib><collection>OSTI.GOV</collection><jtitle>AIP conference proceedings</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Shukla, Nitesh</au><au>Rao, Vandita</au><au>Dwivedi, D. K.</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Dielectric relaxation studies in Se{sub 90}Cd{sub 8}Sb{sub 2} glassy alloy</atitle><jtitle>AIP conference proceedings</jtitle><date>2016-05-06</date><risdate>2016</risdate><volume>1728</volume><issue>1</issue><issn>0094-243X</issn><eissn>1551-7616</eissn><abstract>Se{sub 90}Cd{sub 8}Sb{sub 2} chalcogenide semiconducting alloy was prepared by melt quench technique. The prepared glassy alloy has been characterized by techniques such as scanning electron microscopy (SEM) and energy dispersive X-ray (EDAX).Dielectric properties of Se{sub 90}Cd{sub 8}Sb{sub 2} chalcogenide semiconductor have been studied using impedance spectroscopic technique in the frequency range 5×10{sup 2}Hz - 1×10{sup 5}Hz and in temperature range 303-318K. It is found that dielectric constant ε′ and dielectric loss factor ε″ are dependent on frequency and temperature.</abstract><cop>United States</cop><doi>10.1063/1.4946434</doi></addata></record> |
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| source | AIP Journals Complete |
| subjects | ALLOYS ANTIMONY COMPOUNDS CADMIUM COMPOUNDS CHALCOGENIDES CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY DIELECTRIC MATERIALS ELECTRON SCANNING FREQUENCY RANGE METALLIC GLASSES PERMITTIVITY RELAXATION SCANNING ELECTRON MICROSCOPY SELENIUM COMPOUNDS SEMICONDUCTOR MATERIALS X RADIATION |
| title | Dielectric relaxation studies in Se{sub 90}Cd{sub 8}Sb{sub 2} glassy alloy |
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