Thickness-dependent dispersion parameters, energy gap and nonlinear refractive index of ZnSe thin films
[Display omitted] •Combined experimental and theoretical researches on ZnSe Thin Films.•The film thickness and refractive index were determined using envelope method.•The absorption coefficient and the energy gap were calculated.•Dispersion parameters were determined using Wemple-DiDomenico relation...
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Veröffentlicht in: | Materials research bulletin 2016-08, Vol.80, p.120-126 |
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creator | Prakash, Deo Shaaban, E.R. Shapaan, M. Mohamed, S.H. Othman, A.A. Verma, K.D. |
description | [Display omitted]
•Combined experimental and theoretical researches on ZnSe Thin Films.•The film thickness and refractive index were determined using envelope method.•The absorption coefficient and the energy gap were calculated.•Dispersion parameters were determined using Wemple-DiDomenico relation.•The third order susceptibility and nonlinear refractive index were calculated.
Zinc selenide (ZnSe) thin films with different thicknesses were evaporated onto glass substrates using the thermal evaporation technique. X-ray diffraction analysis confirmed that both the film and powder have cubic zinc-blende structure. The fundamental optical parameters like absorption coefficient, extinction coefficient and band gap were evaluated in transparent region of transmittance and reflectance spectrum. The optical transition of the films was found to be allowed, where the energy gap increased from 2.576 to 2.702eV with increasing film thickness. Also, the refractive index value increase with increasing film thickness. The refractive indices evaluated through envelope method were extrapolated by Cauchy dispersion relationship over the whole spectra range. Additionally, the dispersion of refractive index was determined in terms of Wemple-DiDomenico single oscillator model. Third order susceptibility and nonlinear refractive index were determined for different thickness of ZnSe thin films. |
doi_str_mv | 10.1016/j.materresbull.2016.03.039 |
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•Combined experimental and theoretical researches on ZnSe Thin Films.•The film thickness and refractive index were determined using envelope method.•The absorption coefficient and the energy gap were calculated.•Dispersion parameters were determined using Wemple-DiDomenico relation.•The third order susceptibility and nonlinear refractive index were calculated.
Zinc selenide (ZnSe) thin films with different thicknesses were evaporated onto glass substrates using the thermal evaporation technique. X-ray diffraction analysis confirmed that both the film and powder have cubic zinc-blende structure. The fundamental optical parameters like absorption coefficient, extinction coefficient and band gap were evaluated in transparent region of transmittance and reflectance spectrum. The optical transition of the films was found to be allowed, where the energy gap increased from 2.576 to 2.702eV with increasing film thickness. Also, the refractive index value increase with increasing film thickness. The refractive indices evaluated through envelope method were extrapolated by Cauchy dispersion relationship over the whole spectra range. Additionally, the dispersion of refractive index was determined in terms of Wemple-DiDomenico single oscillator model. Third order susceptibility and nonlinear refractive index were determined for different thickness of ZnSe thin films.</description><identifier>ISSN: 0025-5408</identifier><identifier>EISSN: 1873-4227</identifier><identifier>DOI: 10.1016/j.materresbull.2016.03.039</identifier><language>eng</language><publisher>United States: Elsevier Ltd</publisher><subject>A. Semiconductors ; A. Thin films ; ABSORPTION ; ABSORPTION SPECTRA ; B. Microstructure ; B. Optical properties ; C. X-ray diffraction ; CUBIC LATTICES ; ENERGY GAP ; EVAPORATION ; MATERIALS SCIENCE ; MICROSTRUCTURE ; OSCILLATORS ; POWDERS ; REFRACTIVE INDEX ; SEMICONDUCTOR MATERIALS ; SUBSTRATES ; THICKNESS ; THIN FILMS ; X-RAY DIFFRACTION ; ZINC SELENIDES ; ZINC SULFIDES</subject><ispartof>Materials research bulletin, 2016-08, Vol.80, p.120-126</ispartof><rights>2016</rights><lds50>peer_reviewed</lds50><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-c352t-4e3d2e888965cf528ca4e8e09f21b568c3351e416cbe014e7899433aab5b96043</citedby><cites>FETCH-LOGICAL-c352t-4e3d2e888965cf528ca4e8e09f21b568c3351e416cbe014e7899433aab5b96043</cites></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://dx.doi.org/10.1016/j.materresbull.2016.03.039$$EHTML$$P50$$Gelsevier$$H</linktohtml><link.rule.ids>230,314,780,784,885,3550,27924,27925,45995</link.rule.ids><backlink>$$Uhttps://www.osti.gov/biblio/22581591$$D View this record in Osti.gov$$Hfree_for_read</backlink></links><search><creatorcontrib>Prakash, Deo</creatorcontrib><creatorcontrib>Shaaban, E.R.</creatorcontrib><creatorcontrib>Shapaan, M.</creatorcontrib><creatorcontrib>Mohamed, S.H.</creatorcontrib><creatorcontrib>Othman, A.A.</creatorcontrib><creatorcontrib>Verma, K.D.</creatorcontrib><title>Thickness-dependent dispersion parameters, energy gap and nonlinear refractive index of ZnSe thin films</title><title>Materials research bulletin</title><description>[Display omitted]
•Combined experimental and theoretical researches on ZnSe Thin Films.•The film thickness and refractive index were determined using envelope method.•The absorption coefficient and the energy gap were calculated.•Dispersion parameters were determined using Wemple-DiDomenico relation.•The third order susceptibility and nonlinear refractive index were calculated.
Zinc selenide (ZnSe) thin films with different thicknesses were evaporated onto glass substrates using the thermal evaporation technique. X-ray diffraction analysis confirmed that both the film and powder have cubic zinc-blende structure. The fundamental optical parameters like absorption coefficient, extinction coefficient and band gap were evaluated in transparent region of transmittance and reflectance spectrum. The optical transition of the films was found to be allowed, where the energy gap increased from 2.576 to 2.702eV with increasing film thickness. Also, the refractive index value increase with increasing film thickness. The refractive indices evaluated through envelope method were extrapolated by Cauchy dispersion relationship over the whole spectra range. Additionally, the dispersion of refractive index was determined in terms of Wemple-DiDomenico single oscillator model. Third order susceptibility and nonlinear refractive index were determined for different thickness of ZnSe thin films.</description><subject>A. Semiconductors</subject><subject>A. Thin films</subject><subject>ABSORPTION</subject><subject>ABSORPTION SPECTRA</subject><subject>B. Microstructure</subject><subject>B. Optical properties</subject><subject>C. X-ray diffraction</subject><subject>CUBIC LATTICES</subject><subject>ENERGY GAP</subject><subject>EVAPORATION</subject><subject>MATERIALS SCIENCE</subject><subject>MICROSTRUCTURE</subject><subject>OSCILLATORS</subject><subject>POWDERS</subject><subject>REFRACTIVE INDEX</subject><subject>SEMICONDUCTOR MATERIALS</subject><subject>SUBSTRATES</subject><subject>THICKNESS</subject><subject>THIN FILMS</subject><subject>X-RAY DIFFRACTION</subject><subject>ZINC SELENIDES</subject><subject>ZINC SULFIDES</subject><issn>0025-5408</issn><issn>1873-4227</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2016</creationdate><recordtype>article</recordtype><recordid>eNqNUMtKAzEUDaJgrf5D0K1T85zJuJP6hIIL68ZNyGTutKnTzJCMxf69GerCpXDgwuU87j0IXVIyo4TmN5vZ1gwQAsTqq21nLO1mhCeUR2hCVcEzwVhxjCaEMJlJQdQpOotxQwgRqigmaLVcO_vpIcashh58DX7AtYs9hOg6j3sTzBZSRLzG4CGs9nhlemx8jX3nW-fBBBygCcYObgfYJYdv3DX4w78BHtbO48a123iOThrTRrj4nVP0_viwnD9ni9enl_ndIrNcsiETwGsGSqkyl7aRTFkjQAEpG0YrmSvLuaQgaG4rIFRAocpScG5MJasyJ4JP0dXBt4uD09G6Aezadt6DHTRjUlFZ0sS6PbBs6GJM5-s-uK0Je02JHovVG_23WD0WqwlPKJP4_iCG9MfOQRhjwFuoXRhT6s79x-YHls6KHg</recordid><startdate>20160801</startdate><enddate>20160801</enddate><creator>Prakash, Deo</creator><creator>Shaaban, E.R.</creator><creator>Shapaan, M.</creator><creator>Mohamed, S.H.</creator><creator>Othman, A.A.</creator><creator>Verma, K.D.</creator><general>Elsevier Ltd</general><scope>AAYXX</scope><scope>CITATION</scope><scope>OTOTI</scope></search><sort><creationdate>20160801</creationdate><title>Thickness-dependent dispersion parameters, energy gap and nonlinear refractive index of ZnSe thin films</title><author>Prakash, Deo ; Shaaban, E.R. ; Shapaan, M. ; Mohamed, S.H. ; Othman, A.A. ; Verma, K.D.</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c352t-4e3d2e888965cf528ca4e8e09f21b568c3351e416cbe014e7899433aab5b96043</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2016</creationdate><topic>A. Semiconductors</topic><topic>A. Thin films</topic><topic>ABSORPTION</topic><topic>ABSORPTION SPECTRA</topic><topic>B. Microstructure</topic><topic>B. Optical properties</topic><topic>C. X-ray diffraction</topic><topic>CUBIC LATTICES</topic><topic>ENERGY GAP</topic><topic>EVAPORATION</topic><topic>MATERIALS SCIENCE</topic><topic>MICROSTRUCTURE</topic><topic>OSCILLATORS</topic><topic>POWDERS</topic><topic>REFRACTIVE INDEX</topic><topic>SEMICONDUCTOR MATERIALS</topic><topic>SUBSTRATES</topic><topic>THICKNESS</topic><topic>THIN FILMS</topic><topic>X-RAY DIFFRACTION</topic><topic>ZINC SELENIDES</topic><topic>ZINC SULFIDES</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Prakash, Deo</creatorcontrib><creatorcontrib>Shaaban, E.R.</creatorcontrib><creatorcontrib>Shapaan, M.</creatorcontrib><creatorcontrib>Mohamed, S.H.</creatorcontrib><creatorcontrib>Othman, A.A.</creatorcontrib><creatorcontrib>Verma, K.D.</creatorcontrib><collection>CrossRef</collection><collection>OSTI.GOV</collection><jtitle>Materials research bulletin</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Prakash, Deo</au><au>Shaaban, E.R.</au><au>Shapaan, M.</au><au>Mohamed, S.H.</au><au>Othman, A.A.</au><au>Verma, K.D.</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Thickness-dependent dispersion parameters, energy gap and nonlinear refractive index of ZnSe thin films</atitle><jtitle>Materials research bulletin</jtitle><date>2016-08-01</date><risdate>2016</risdate><volume>80</volume><spage>120</spage><epage>126</epage><pages>120-126</pages><issn>0025-5408</issn><eissn>1873-4227</eissn><abstract>[Display omitted]
•Combined experimental and theoretical researches on ZnSe Thin Films.•The film thickness and refractive index were determined using envelope method.•The absorption coefficient and the energy gap were calculated.•Dispersion parameters were determined using Wemple-DiDomenico relation.•The third order susceptibility and nonlinear refractive index were calculated.
Zinc selenide (ZnSe) thin films with different thicknesses were evaporated onto glass substrates using the thermal evaporation technique. X-ray diffraction analysis confirmed that both the film and powder have cubic zinc-blende structure. The fundamental optical parameters like absorption coefficient, extinction coefficient and band gap were evaluated in transparent region of transmittance and reflectance spectrum. The optical transition of the films was found to be allowed, where the energy gap increased from 2.576 to 2.702eV with increasing film thickness. Also, the refractive index value increase with increasing film thickness. The refractive indices evaluated through envelope method were extrapolated by Cauchy dispersion relationship over the whole spectra range. Additionally, the dispersion of refractive index was determined in terms of Wemple-DiDomenico single oscillator model. Third order susceptibility and nonlinear refractive index were determined for different thickness of ZnSe thin films.</abstract><cop>United States</cop><pub>Elsevier Ltd</pub><doi>10.1016/j.materresbull.2016.03.039</doi><tpages>7</tpages></addata></record> |
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subjects | A. Semiconductors A. Thin films ABSORPTION ABSORPTION SPECTRA B. Microstructure B. Optical properties C. X-ray diffraction CUBIC LATTICES ENERGY GAP EVAPORATION MATERIALS SCIENCE MICROSTRUCTURE OSCILLATORS POWDERS REFRACTIVE INDEX SEMICONDUCTOR MATERIALS SUBSTRATES THICKNESS THIN FILMS X-RAY DIFFRACTION ZINC SELENIDES ZINC SULFIDES |
title | Thickness-dependent dispersion parameters, energy gap and nonlinear refractive index of ZnSe thin films |
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