Real-time observation of dynamic process of oxygen vacancy migration in cerium oxides under electric field

The dynamic process of oxygen vacancy migration driven by the external electric field is directly observed at atomic scale in the cerium oxides (CeO2) thin film by in-situ transmission electron microscopy method. When a bias voltage of a proper value is applied across the CeO2 film, the oxygen vacan...

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Veröffentlicht in:	Applied physics letters 2015-11, Vol.107 (21)
Hauptverfasser:	Li, Xiaomin, Qi, Kuo, Sun, Muhua, Huang, Qianming, Xu, Zhi, Wang, Wenlong, Bai, Xuedong
Format:	Artikel
Sprache:	eng
Schlagworte:	ANODES Applied physics CERIUM OXIDES CLASSICAL AND QUANTUM MECHANICS, GENERAL PHYSICS ELECTRIC FIELDS ELECTRIC POTENTIAL Gas sensors INTERFACES Migration OXYGEN Random access memory Scale (corrosion) THIN FILMS TRANSMISSION ELECTRON MICROSCOPY VACANCIES
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