Optical phonons in PbTe/CdTe multilayer heterostructures

The infrared reflection spectra of PbTe/CdTe multilayer nanostructures grown by molecular-beam epitaxy are measured in the frequency range of 20–5000 cm −1 at room temperature. The thicknesses and high-frequency dielectric constants of the PbTe and CdTe layers and the frequencies of the transverse o...

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Veröffentlicht in:	Semiconductors (Woodbury, N.Y.) N.Y.), 2015-05, Vol.49 (5), p.644-648
Hauptverfasser:	Novikova, N. N., Yakovlev, V. A., Kucherenko, I. V., Karczewski, G., Aleshchenko, Yu. A., Muratov, A. V., Zavaritskaya, T. N., Melnik, N. N.
Format:	Artikel
Sprache:	eng
Schlagworte:	ARGON IONS CADMIUM TELLURIDES Electric properties Epitaxy EXCITATION FREQUENCY DEPENDENCE INTERFACES LASERS LAYERS LEAD TELLURIDES LIQUIDS Low-Dimensional Systems Magnetic Materials Magnetism MATERIALS SCIENCE MOLECULAR BEAM EPITAXY NANOSTRUCTURES NITROGEN OPTICAL MODES PALLADIUM TELLURIDES PERMITTIVITY PHONONS Physics Physics and Astronomy Quantum Phenomena RAMAN EFFECT RAMAN SPECTROSCOPY REFLECTION Semiconductor Structures TEMPERATURE RANGE 0273-0400 K
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