Forward scattering in hard X-ray photoelectron spectroscopy: Structural investigation of buried Mn–Ga films

X-ray photoelectron diffraction (XPD) in combination with hard X-ray photoelectron spectroscopy (HAXPES) has been used to study the structure of buried layers in thin multilayer films. A detailed layer-by-layer investigation was performed using the element-specific, local-probe character of XPD. In...

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