Photoionized plasmas induced in neon with extreme ultraviolet and soft X-ray pulses produced using low and high energy laser systems

A comparative study of photoionized plasmas created by two soft X-ray and extreme ultraviolet (SXR/EUV) laser plasma sources with different parameters is presented. The two sources are based on double-stream Xe/He gas-puff targets irradiated with high (500 J/0.3 ns) and low energy (10 J/1 ns) laser...

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Veröffentlicht in:Physics of plasmas 2015-04, Vol.22 (4)
Hauptverfasser: Bartnik, A., Wachulak, P., Fok, T., Węgrzyński, Ł., Fiedorowicz, H., Pisarczyk, T., Chodukowski, T., Kalinowska, Z., Dudzak, R., Dostal, J., Krousky, E., Skala, J., Ullschmied, J., Hrebicek, J., Medrik, T.
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container_issue 4
container_start_page
container_title Physics of plasmas
container_volume 22
creator Bartnik, A.
Wachulak, P.
Fok, T.
Węgrzyński, Ł.
Fiedorowicz, H.
Pisarczyk, T.
Chodukowski, T.
Kalinowska, Z.
Dudzak, R.
Dostal, J.
Krousky, E.
Skala, J.
Ullschmied, J.
Hrebicek, J.
Medrik, T.
description A comparative study of photoionized plasmas created by two soft X-ray and extreme ultraviolet (SXR/EUV) laser plasma sources with different parameters is presented. The two sources are based on double-stream Xe/He gas-puff targets irradiated with high (500 J/0.3 ns) and low energy (10 J/1 ns) laser pulses. In both cases, the SXR/EUV beam irradiated the gas stream, injected into a vacuum chamber synchronously with the radiation pulse. Irradiation of gases resulted in formation of photoionized plasmas emitting radiation in the SXR/EUV range. The measured Ne plasma radiation spectra are dominated by emission lines corresponding to radiative transitions in singly charged ions. A significant difference concerns origin of the lines: K-shell or L-shell emissions occur in case of the high and low energy irradiating system, respectively. In high energy system, the electron density measurements were also performed by laser interferometry, employing a femtosecond laser system. A maximum electron density for Ne plasma reached the value of 2·1018 cm−3. For the low energy system, a detection limit was too high for the interferometric measurements, thus only an upper estimation for electron density could be made.
doi_str_mv 10.1063/1.4919024
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For the low energy system, a detection limit was too high for the interferometric measurements, thus only an upper estimation for electron density could be made.</abstract><cop>Melville</cop><pub>American Institute of Physics</pub><doi>10.1063/1.4919024</doi><orcidid>https://orcid.org/0000-0002-2012-7450</orcidid><orcidid>https://orcid.org/0000-0001-9971-7201</orcidid><orcidid>https://orcid.org/0000-0001-9853-7946</orcidid></addata></record>
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source AIP Journals Complete; Alma/SFX Local Collection
subjects 70 PLASMA PHYSICS AND FUSION TECHNOLOGY
Comparative studies
ELECTRON DENSITY
Electron density measurement
Emission spectra
EXTREME ULTRAVIOLET RADIATION
Femtosecond pulsed lasers
HELIUM
INTERFEROMETRY
IONS
Irradiation
K SHELL
L SHELL
Laser beams
Laser interferometry
Laser plasmas
LASER-PRODUCED PLASMA
Lasers
NEON
PHOTOIONIZATION
PHOTON BEAMS
Plasma
Plasma physics
Plasma radiation
PULSED IRRADIATION
Radiation spectra
Rangefinding
SENSITIVITY
SOFT X RADIATION
Soft x rays
SPECTRA
Vacuum chambers
X ray spectra
X-RAY LASERS
XENON
title Photoionized plasmas induced in neon with extreme ultraviolet and soft X-ray pulses produced using low and high energy laser systems
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