Identification of sub-grains and low angle boundaries beyond the angular resolution of EBSD maps
A new method called ALGrId (Anti-Leak GRain IDentification) is proposed for the detection of sub-grains beyond the relative angular resolution of Electron Backscatter Diffraction maps. It does not use any additional information such as Kikuchi Pattern Quality map nor need data filtering. It uses a m...
Gespeichert in:
| Veröffentlicht in: | Materials characterization 2014-12, Vol.98, p.66-72 |
|---|---|
| Hauptverfasser: | , , , |
| Format: | Artikel |
| Sprache: | eng |
| Schlagworte: | |
| Online-Zugang: | Volltext |
| Tags: |
Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
|
| container_end_page | 72 |
|---|---|
| container_issue | |
| container_start_page | 66 |
| container_title | Materials characterization |
| container_volume | 98 |
| creator | Germain, L. Kratsch, D. Salib, M. Gey, N. |
| description | A new method called ALGrId (Anti-Leak GRain IDentification) is proposed for the detection of sub-grains beyond the relative angular resolution of Electron Backscatter Diffraction maps. It does not use any additional information such as Kikuchi Pattern Quality map nor need data filtering. It uses a modified Dijkstra algorithm which seeks the continuous set of boundaries having the highest average disorientation angle.
[Display omitted]
•ALGrId is a new method to identify sub-grains and low angle boundaries in EBSD maps.•Unlike classical methods, ALGrId works even beyond the relative angular resolution.•If the orientation noise peaks at 0.7°, ALGrid detects 0.4°-boundaries correctly.•In the same example, the classical algorithm identifies 1.1°-boundaries only. |
| doi_str_mv | 10.1016/j.matchar.2014.10.007 |
| format | Article |
| fullrecord | <record><control><sourceid>proquest_osti_</sourceid><recordid>TN_cdi_osti_scitechconnect_22403603</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><els_id>S104458031400299X</els_id><sourcerecordid>1660075466</sourcerecordid><originalsourceid>FETCH-LOGICAL-c481t-f12523741946a2ce08443ee87e2b15de7e73897633751b741b636eac4ddb67cf3</originalsourceid><addsrcrecordid>eNqFkU1v1DAQhiMEEqXwE5AiISQ4ZPFXbOeESmlppZU4AGczcSZdr7L2YjtF_fd1lKVXTjN655l3NDNV9ZaSDSVUftpvDpDtDuKGESqKtiFEPavOqFa8EVR3z0tOhGhaTfjL6lVKe0KI1FSdVb9vB_TZjc5CdsHXYazT3Dd3EZxPNfihnsLfEu8mrPsw-wGiw1T3-BBKLe9wqc0TxDpiCtP8z-Tqy4-v9QGO6XX1YoQp4ZtTPK9-XV_9vLxptt-_3V5ebBsrNM3NSFnLuBK0ExKYRaKF4IhaIetpO6BCxXWnJOeqpX3hesklghXD0EtlR35evVt9Q8rOJOsy2p0N3qPNhjFBuCS8UB9XageTOUZ3gPhgAjhzc7E1i0ZoS7jW-p4W9sPKHmP4M2PK5uCSxWkCj2FOhkpZ7twKKQvarqiNIaWI45M3JWb5kdmb04_M8qNFLr2l7_1pBCQL0xjBW5eemllHWsFYV7jPK4flgvcO47IgeouDi8t-Q3D_mfQIDLOoAQ</addsrcrecordid><sourcetype>Open Access Repository</sourcetype><iscdi>true</iscdi><recordtype>article</recordtype><pqid>1660075466</pqid></control><display><type>article</type><title>Identification of sub-grains and low angle boundaries beyond the angular resolution of EBSD maps</title><source>Elsevier ScienceDirect Journals</source><creator>Germain, L. ; Kratsch, D. ; Salib, M. ; Gey, N.</creator><creatorcontrib>Germain, L. ; Kratsch, D. ; Salib, M. ; Gey, N.</creatorcontrib><description>A new method called ALGrId (Anti-Leak GRain IDentification) is proposed for the detection of sub-grains beyond the relative angular resolution of Electron Backscatter Diffraction maps. It does not use any additional information such as Kikuchi Pattern Quality map nor need data filtering. It uses a modified Dijkstra algorithm which seeks the continuous set of boundaries having the highest average disorientation angle.
[Display omitted]
•ALGrId is a new method to identify sub-grains and low angle boundaries in EBSD maps.•Unlike classical methods, ALGrId works even beyond the relative angular resolution.•If the orientation noise peaks at 0.7°, ALGrid detects 0.4°-boundaries correctly.•In the same example, the classical algorithm identifies 1.1°-boundaries only.</description><identifier>ISSN: 1044-5803</identifier><identifier>EISSN: 1873-4189</identifier><identifier>DOI: 10.1016/j.matchar.2014.10.007</identifier><language>eng</language><publisher>New York, NY: Elsevier Inc</publisher><subject>ALGORITHMS ; ALGrId ; Angular resolution ; BACKSCATTERING ; Boundaries ; Chemical Sciences ; Cross-disciplinary physics: materials science; rheology ; DETECTION ; Dijkstra algorithm ; Disorientation ; EBSD ; Electron back scatter diffraction ; ELECTRON DIFFRACTION ; Engineering Sciences ; Exact sciences and technology ; Filtering ; Filtration ; GRAIN BOUNDARIES ; Grain Boundary Completion ; KIKUCHI LINES ; low-angle boundaries ; Material chemistry ; MATERIALS SCIENCE ; NOISE ; ORIENTATION ; Phase diagrams and microstructures developed by solidification and solid-solid phase transformations ; Physics ; RESOLUTION ; Solidification ; Sub-grain</subject><ispartof>Materials characterization, 2014-12, Vol.98, p.66-72</ispartof><rights>2014 Elsevier Inc.</rights><rights>2015 INIST-CNRS</rights><rights>Distributed under a Creative Commons Attribution 4.0 International License</rights><lds50>peer_reviewed</lds50><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-c481t-f12523741946a2ce08443ee87e2b15de7e73897633751b741b636eac4ddb67cf3</citedby><cites>FETCH-LOGICAL-c481t-f12523741946a2ce08443ee87e2b15de7e73897633751b741b636eac4ddb67cf3</cites><orcidid>0000-0002-7738-6445 ; 0009-0004-0266-0499</orcidid></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://www.sciencedirect.com/science/article/pii/S104458031400299X$$EHTML$$P50$$Gelsevier$$H</linktohtml><link.rule.ids>230,314,776,780,881,3537,27901,27902,65306</link.rule.ids><backlink>$$Uhttp://pascal-francis.inist.fr/vibad/index.php?action=getRecordDetail&idt=29054229$$DView record in Pascal Francis$$Hfree_for_read</backlink><backlink>$$Uhttps://hal.univ-lorraine.fr/hal-01503888$$DView record in HAL$$Hfree_for_read</backlink><backlink>$$Uhttps://www.osti.gov/biblio/22403603$$D View this record in Osti.gov$$Hfree_for_read</backlink></links><search><creatorcontrib>Germain, L.</creatorcontrib><creatorcontrib>Kratsch, D.</creatorcontrib><creatorcontrib>Salib, M.</creatorcontrib><creatorcontrib>Gey, N.</creatorcontrib><title>Identification of sub-grains and low angle boundaries beyond the angular resolution of EBSD maps</title><title>Materials characterization</title><description>A new method called ALGrId (Anti-Leak GRain IDentification) is proposed for the detection of sub-grains beyond the relative angular resolution of Electron Backscatter Diffraction maps. It does not use any additional information such as Kikuchi Pattern Quality map nor need data filtering. It uses a modified Dijkstra algorithm which seeks the continuous set of boundaries having the highest average disorientation angle.
[Display omitted]
•ALGrId is a new method to identify sub-grains and low angle boundaries in EBSD maps.•Unlike classical methods, ALGrId works even beyond the relative angular resolution.•If the orientation noise peaks at 0.7°, ALGrid detects 0.4°-boundaries correctly.•In the same example, the classical algorithm identifies 1.1°-boundaries only.</description><subject>ALGORITHMS</subject><subject>ALGrId</subject><subject>Angular resolution</subject><subject>BACKSCATTERING</subject><subject>Boundaries</subject><subject>Chemical Sciences</subject><subject>Cross-disciplinary physics: materials science; rheology</subject><subject>DETECTION</subject><subject>Dijkstra algorithm</subject><subject>Disorientation</subject><subject>EBSD</subject><subject>Electron back scatter diffraction</subject><subject>ELECTRON DIFFRACTION</subject><subject>Engineering Sciences</subject><subject>Exact sciences and technology</subject><subject>Filtering</subject><subject>Filtration</subject><subject>GRAIN BOUNDARIES</subject><subject>Grain Boundary Completion</subject><subject>KIKUCHI LINES</subject><subject>low-angle boundaries</subject><subject>Material chemistry</subject><subject>MATERIALS SCIENCE</subject><subject>NOISE</subject><subject>ORIENTATION</subject><subject>Phase diagrams and microstructures developed by solidification and solid-solid phase transformations</subject><subject>Physics</subject><subject>RESOLUTION</subject><subject>Solidification</subject><subject>Sub-grain</subject><issn>1044-5803</issn><issn>1873-4189</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2014</creationdate><recordtype>article</recordtype><recordid>eNqFkU1v1DAQhiMEEqXwE5AiISQ4ZPFXbOeESmlppZU4AGczcSZdr7L2YjtF_fd1lKVXTjN655l3NDNV9ZaSDSVUftpvDpDtDuKGESqKtiFEPavOqFa8EVR3z0tOhGhaTfjL6lVKe0KI1FSdVb9vB_TZjc5CdsHXYazT3Dd3EZxPNfihnsLfEu8mrPsw-wGiw1T3-BBKLe9wqc0TxDpiCtP8z-Tqy4-v9QGO6XX1YoQp4ZtTPK9-XV_9vLxptt-_3V5ebBsrNM3NSFnLuBK0ExKYRaKF4IhaIetpO6BCxXWnJOeqpX3hesklghXD0EtlR35evVt9Q8rOJOsy2p0N3qPNhjFBuCS8UB9XageTOUZ3gPhgAjhzc7E1i0ZoS7jW-p4W9sPKHmP4M2PK5uCSxWkCj2FOhkpZ7twKKQvarqiNIaWI45M3JWb5kdmb04_M8qNFLr2l7_1pBCQL0xjBW5eemllHWsFYV7jPK4flgvcO47IgeouDi8t-Q3D_mfQIDLOoAQ</recordid><startdate>20141201</startdate><enddate>20141201</enddate><creator>Germain, L.</creator><creator>Kratsch, D.</creator><creator>Salib, M.</creator><creator>Gey, N.</creator><general>Elsevier Inc</general><general>Elsevier</general><scope>IQODW</scope><scope>AAYXX</scope><scope>CITATION</scope><scope>7SR</scope><scope>8BQ</scope><scope>8FD</scope><scope>JG9</scope><scope>1XC</scope><scope>VOOES</scope><scope>OTOTI</scope><orcidid>https://orcid.org/0000-0002-7738-6445</orcidid><orcidid>https://orcid.org/0009-0004-0266-0499</orcidid></search><sort><creationdate>20141201</creationdate><title>Identification of sub-grains and low angle boundaries beyond the angular resolution of EBSD maps</title><author>Germain, L. ; Kratsch, D. ; Salib, M. ; Gey, N.</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c481t-f12523741946a2ce08443ee87e2b15de7e73897633751b741b636eac4ddb67cf3</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2014</creationdate><topic>ALGORITHMS</topic><topic>ALGrId</topic><topic>Angular resolution</topic><topic>BACKSCATTERING</topic><topic>Boundaries</topic><topic>Chemical Sciences</topic><topic>Cross-disciplinary physics: materials science; rheology</topic><topic>DETECTION</topic><topic>Dijkstra algorithm</topic><topic>Disorientation</topic><topic>EBSD</topic><topic>Electron back scatter diffraction</topic><topic>ELECTRON DIFFRACTION</topic><topic>Engineering Sciences</topic><topic>Exact sciences and technology</topic><topic>Filtering</topic><topic>Filtration</topic><topic>GRAIN BOUNDARIES</topic><topic>Grain Boundary Completion</topic><topic>KIKUCHI LINES</topic><topic>low-angle boundaries</topic><topic>Material chemistry</topic><topic>MATERIALS SCIENCE</topic><topic>NOISE</topic><topic>ORIENTATION</topic><topic>Phase diagrams and microstructures developed by solidification and solid-solid phase transformations</topic><topic>Physics</topic><topic>RESOLUTION</topic><topic>Solidification</topic><topic>Sub-grain</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Germain, L.</creatorcontrib><creatorcontrib>Kratsch, D.</creatorcontrib><creatorcontrib>Salib, M.</creatorcontrib><creatorcontrib>Gey, N.</creatorcontrib><collection>Pascal-Francis</collection><collection>CrossRef</collection><collection>Engineered Materials Abstracts</collection><collection>METADEX</collection><collection>Technology Research Database</collection><collection>Materials Research Database</collection><collection>Hyper Article en Ligne (HAL)</collection><collection>Hyper Article en Ligne (HAL) (Open Access)</collection><collection>OSTI.GOV</collection><jtitle>Materials characterization</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Germain, L.</au><au>Kratsch, D.</au><au>Salib, M.</au><au>Gey, N.</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Identification of sub-grains and low angle boundaries beyond the angular resolution of EBSD maps</atitle><jtitle>Materials characterization</jtitle><date>2014-12-01</date><risdate>2014</risdate><volume>98</volume><spage>66</spage><epage>72</epage><pages>66-72</pages><issn>1044-5803</issn><eissn>1873-4189</eissn><abstract>A new method called ALGrId (Anti-Leak GRain IDentification) is proposed for the detection of sub-grains beyond the relative angular resolution of Electron Backscatter Diffraction maps. It does not use any additional information such as Kikuchi Pattern Quality map nor need data filtering. It uses a modified Dijkstra algorithm which seeks the continuous set of boundaries having the highest average disorientation angle.
[Display omitted]
•ALGrId is a new method to identify sub-grains and low angle boundaries in EBSD maps.•Unlike classical methods, ALGrId works even beyond the relative angular resolution.•If the orientation noise peaks at 0.7°, ALGrid detects 0.4°-boundaries correctly.•In the same example, the classical algorithm identifies 1.1°-boundaries only.</abstract><cop>New York, NY</cop><pub>Elsevier Inc</pub><doi>10.1016/j.matchar.2014.10.007</doi><tpages>7</tpages><orcidid>https://orcid.org/0000-0002-7738-6445</orcidid><orcidid>https://orcid.org/0009-0004-0266-0499</orcidid><oa>free_for_read</oa></addata></record> |
| fulltext | fulltext |
| identifier | ISSN: 1044-5803 |
| ispartof | Materials characterization, 2014-12, Vol.98, p.66-72 |
| issn | 1044-5803 1873-4189 |
| language | eng |
| recordid | cdi_osti_scitechconnect_22403603 |
| source | Elsevier ScienceDirect Journals |
| subjects | ALGORITHMS ALGrId Angular resolution BACKSCATTERING Boundaries Chemical Sciences Cross-disciplinary physics: materials science rheology DETECTION Dijkstra algorithm Disorientation EBSD Electron back scatter diffraction ELECTRON DIFFRACTION Engineering Sciences Exact sciences and technology Filtering Filtration GRAIN BOUNDARIES Grain Boundary Completion KIKUCHI LINES low-angle boundaries Material chemistry MATERIALS SCIENCE NOISE ORIENTATION Phase diagrams and microstructures developed by solidification and solid-solid phase transformations Physics RESOLUTION Solidification Sub-grain |
| title | Identification of sub-grains and low angle boundaries beyond the angular resolution of EBSD maps |
| url | https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-02-09T19%3A05%3A34IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-proquest_osti_&rft_val_fmt=info:ofi/fmt:kev:mtx:journal&rft.genre=article&rft.atitle=Identification%20of%20sub-grains%20and%20low%20angle%20boundaries%20beyond%20the%20angular%20resolution%20of%20EBSD%20maps&rft.jtitle=Materials%20characterization&rft.au=Germain,%20L.&rft.date=2014-12-01&rft.volume=98&rft.spage=66&rft.epage=72&rft.pages=66-72&rft.issn=1044-5803&rft.eissn=1873-4189&rft_id=info:doi/10.1016/j.matchar.2014.10.007&rft_dat=%3Cproquest_osti_%3E1660075466%3C/proquest_osti_%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_pqid=1660075466&rft_id=info:pmid/&rft_els_id=S104458031400299X&rfr_iscdi=true |