In-situ ellipsometric characterization of the growth of porous anisotropic nanocrystalline ZnO layers

ZnO films have increasingly been in the spotlight due to their largely varied electro-physical and optical properties. For several applications, porous anisotropic nanocrystalline layers are especially interesting. To study the growth kinetics of such films during different fabrication processes, a...

Ausführliche Beschreibung