Nonlinear electron dynamics of gold ultrathin films induced by intense terahertz waves
Linear and nonlinear electron dynamics of polycrystalline gold (Au) ultrathin films with thicknesses ranging from 1.4 to 5.8 nm were investigated via transmittance terahertz (THz) spectroscopy with intense electric field transients. We prepared ultrathin films with low surface roughness formed on a...
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| Veröffentlicht in: | Applied physics letters 2014-12, Vol.105 (24) |
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| container_title | Applied physics letters |
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| creator | Minami, Yasuo Takeda, Jun Dao, Thang Duy Nagao, Tadaaki Kitajima, Masahiro Katayama, Ikufumi |
| description | Linear and nonlinear electron dynamics of polycrystalline gold (Au) ultrathin films with thicknesses ranging from 1.4 to 5.8 nm were investigated via transmittance terahertz (THz) spectroscopy with intense electric field transients. We prepared ultrathin films with low surface roughness formed on a Si–(7 × 7) reconstructed surface, leading to the observation of monotonic decrease in THz transmittance with respect to film thickness. Furthermore, at all tested thicknesses, the transmittance decreased nonlinearly by 10%–30% with the application if high-intensity THz electric fields. Based on a Drude-model analysis, we found a significant decrease in the damping constant induced by the THz electric field, indicating that electrons are driven beyond the polycrystalline grain boundaries in Au thin films, and consequently leading to the suppression of the electron–boundary scattering rate. |
| doi_str_mv | 10.1063/1.4904883 |
| format | Article |
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We prepared ultrathin films with low surface roughness formed on a Si–(7 × 7) reconstructed surface, leading to the observation of monotonic decrease in THz transmittance with respect to film thickness. Furthermore, at all tested thicknesses, the transmittance decreased nonlinearly by 10%–30% with the application if high-intensity THz electric fields. 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We prepared ultrathin films with low surface roughness formed on a Si–(7 × 7) reconstructed surface, leading to the observation of monotonic decrease in THz transmittance with respect to film thickness. Furthermore, at all tested thicknesses, the transmittance decreased nonlinearly by 10%–30% with the application if high-intensity THz electric fields. 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We prepared ultrathin films with low surface roughness formed on a Si–(7 × 7) reconstructed surface, leading to the observation of monotonic decrease in THz transmittance with respect to film thickness. Furthermore, at all tested thicknesses, the transmittance decreased nonlinearly by 10%–30% with the application if high-intensity THz electric fields. Based on a Drude-model analysis, we found a significant decrease in the damping constant induced by the THz electric field, indicating that electrons are driven beyond the polycrystalline grain boundaries in Au thin films, and consequently leading to the suppression of the electron–boundary scattering rate.</abstract><cop>Melville</cop><pub>American Institute of Physics</pub><doi>10.1063/1.4904883</doi><orcidid>https://orcid.org/0000-0002-3382-9160</orcidid><oa>free_for_read</oa></addata></record> |
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| language | eng |
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| source | AIP Journals Complete; Alma/SFX Local Collection |
| subjects | ABSORPTION SPECTROSCOPY Applied physics CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY DAMPING ELECTRIC FIELDS Electronics ELECTRONS Film thickness GOLD GRAIN BOUNDARIES Nonlinear dynamics NONLINEAR PROBLEMS POLYCRYSTALS ROUGHNESS Surface roughness SURFACES Terahertz frequencies THIN FILMS TRANSIENTS Transmittance |
| title | Nonlinear electron dynamics of gold ultrathin films induced by intense terahertz waves |
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