Bulk sensitive hard x-ray photoemission electron microscopy
Hard x-ray photoelectron spectroscopy (HAXPES) has now matured into a well-established technique as a bulk sensitive probe of the electronic structure due to the larger escape depth of the highly energetic electrons. In order to enable HAXPES studies with high lateral resolution, we have set up a de...
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| Veröffentlicht in: | Review of scientific instruments 2014-11, Vol.85 (11), p.113704-113704 |
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| creator | Patt, M Wiemann, C Weber, N Escher, M Gloskovskii, A Drube, W Merkel, M Schneider, C M |
| description | Hard x-ray photoelectron spectroscopy (HAXPES) has now matured into a well-established technique as a bulk sensitive probe of the electronic structure due to the larger escape depth of the highly energetic electrons. In order to enable HAXPES studies with high lateral resolution, we have set up a dedicated energy-filtered hard x-ray photoemission electron microscope (HAXPEEM) working with electron kinetic energies up to 10 keV. It is based on the NanoESCA design and also preserves the performance of the instrument in the low and medium energy range. In this way, spectromicroscopy can be performed from threshold to hard x-ray photoemission. The high potential of the HAXPEEM approach for the investigation of buried layers and structures has been shown already on a layered and structured SrTiO3 sample. Here, we present results of experiments with test structures to elaborate the imaging and spectroscopic performance of the instrument and show the capabilities of the method to image bulk properties. Additionally, we introduce a method to determine the effective attenuation length of photoelectrons in a direct photoemission experiment. |
| doi_str_mv | 10.1063/1.4902141 |
| format | Article |
| fullrecord | <record><control><sourceid>proquest_osti_</sourceid><recordid>TN_cdi_osti_scitechconnect_22392233</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>1628881477</sourcerecordid><originalsourceid>FETCH-LOGICAL-c442t-52bf20ea6a2210493b4a440ca0b5c0fead77ebc9110a3a6ec87c10f4ce802eee3</originalsourceid><addsrcrecordid>eNpFkM1Lw0AQxRdRbK0e_Ack4EUPqTO7my88afELCl70vGy2E5qaZOtuIva_d0urDgwzhx-P9x5j5whThFTc4FQWwFHiARsj5EWcpVwcsjGAkHGayXzETrxfQZgE8ZiNeCIFIGZjdns_NB-Rp87Xff1F0VK7RfQdO72J1kvbW2pr72vbRdSQ6V142to4641db07ZUaUbT2f7O2Hvjw9vs-d4_vr0Mrubx0ZK3scJLysOpFPNOYIsRCm1lGA0lImBivQiy6g0BSJooVMyeWYQKmkoB05EYsIud7rW97Xypu7JLI3tuuBIcS6KsCJQVztq7eznQL5XwbqhptEd2cErTHme5yiz7F_wD13ZwXUhg-LI0wQEogzU9Y7a5vWOKrV2davdRiGobe8K1b73wF7sFYeypcUf-Vu0-AFurnsh</addsrcrecordid><sourcetype>Open Access Repository</sourcetype><iscdi>true</iscdi><recordtype>article</recordtype><pqid>2126503114</pqid></control><display><type>article</type><title>Bulk sensitive hard x-ray photoemission electron microscopy</title><source>AIP Journals Complete</source><source>Alma/SFX Local Collection</source><creator>Patt, M ; Wiemann, C ; Weber, N ; Escher, M ; Gloskovskii, A ; Drube, W ; Merkel, M ; Schneider, C M</creator><creatorcontrib>Patt, M ; Wiemann, C ; Weber, N ; Escher, M ; Gloskovskii, A ; Drube, W ; Merkel, M ; Schneider, C M</creatorcontrib><description>Hard x-ray photoelectron spectroscopy (HAXPES) has now matured into a well-established technique as a bulk sensitive probe of the electronic structure due to the larger escape depth of the highly energetic electrons. In order to enable HAXPES studies with high lateral resolution, we have set up a dedicated energy-filtered hard x-ray photoemission electron microscope (HAXPEEM) working with electron kinetic energies up to 10 keV. It is based on the NanoESCA design and also preserves the performance of the instrument in the low and medium energy range. In this way, spectromicroscopy can be performed from threshold to hard x-ray photoemission. The high potential of the HAXPEEM approach for the investigation of buried layers and structures has been shown already on a layered and structured SrTiO3 sample. Here, we present results of experiments with test structures to elaborate the imaging and spectroscopic performance of the instrument and show the capabilities of the method to image bulk properties. Additionally, we introduce a method to determine the effective attenuation length of photoelectrons in a direct photoemission experiment.</description><identifier>ISSN: 0034-6748</identifier><identifier>EISSN: 1089-7623</identifier><identifier>DOI: 10.1063/1.4902141</identifier><identifier>PMID: 25430117</identifier><language>eng</language><publisher>United States: American Institute of Physics</publisher><subject>Attenuation ; Buried structures ; DEPTH ; DESIGN ; ELECTRON MICROSCOPES ; ELECTRON MICROSCOPY ; ELECTRONIC STRUCTURE ; Electrons ; FILTERS ; HARD X RADIATION ; INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY ; KEV RANGE 01-10 ; KINETIC ENERGY ; LENGTH ; Photoelectric emission ; PHOTOELECTRON SPECTROSCOPY ; Photoelectrons ; PHOTOEMISSION ; RESOLUTION ; Scientific apparatus & instruments ; STRONTIUM TITANATES ; X ray spectra</subject><ispartof>Review of scientific instruments, 2014-11, Vol.85 (11), p.113704-113704</ispartof><rights>2014 AIP Publishing LLC.</rights><lds50>peer_reviewed</lds50><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-c442t-52bf20ea6a2210493b4a440ca0b5c0fead77ebc9110a3a6ec87c10f4ce802eee3</citedby><cites>FETCH-LOGICAL-c442t-52bf20ea6a2210493b4a440ca0b5c0fead77ebc9110a3a6ec87c10f4ce802eee3</cites></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><link.rule.ids>230,314,776,780,881,27903,27904</link.rule.ids><backlink>$$Uhttps://www.ncbi.nlm.nih.gov/pubmed/25430117$$D View this record in MEDLINE/PubMed$$Hfree_for_read</backlink><backlink>$$Uhttps://www.osti.gov/biblio/22392233$$D View this record in Osti.gov$$Hfree_for_read</backlink></links><search><creatorcontrib>Patt, M</creatorcontrib><creatorcontrib>Wiemann, C</creatorcontrib><creatorcontrib>Weber, N</creatorcontrib><creatorcontrib>Escher, M</creatorcontrib><creatorcontrib>Gloskovskii, A</creatorcontrib><creatorcontrib>Drube, W</creatorcontrib><creatorcontrib>Merkel, M</creatorcontrib><creatorcontrib>Schneider, C M</creatorcontrib><title>Bulk sensitive hard x-ray photoemission electron microscopy</title><title>Review of scientific instruments</title><addtitle>Rev Sci Instrum</addtitle><description>Hard x-ray photoelectron spectroscopy (HAXPES) has now matured into a well-established technique as a bulk sensitive probe of the electronic structure due to the larger escape depth of the highly energetic electrons. In order to enable HAXPES studies with high lateral resolution, we have set up a dedicated energy-filtered hard x-ray photoemission electron microscope (HAXPEEM) working with electron kinetic energies up to 10 keV. It is based on the NanoESCA design and also preserves the performance of the instrument in the low and medium energy range. In this way, spectromicroscopy can be performed from threshold to hard x-ray photoemission. The high potential of the HAXPEEM approach for the investigation of buried layers and structures has been shown already on a layered and structured SrTiO3 sample. Here, we present results of experiments with test structures to elaborate the imaging and spectroscopic performance of the instrument and show the capabilities of the method to image bulk properties. Additionally, we introduce a method to determine the effective attenuation length of photoelectrons in a direct photoemission experiment.</description><subject>Attenuation</subject><subject>Buried structures</subject><subject>DEPTH</subject><subject>DESIGN</subject><subject>ELECTRON MICROSCOPES</subject><subject>ELECTRON MICROSCOPY</subject><subject>ELECTRONIC STRUCTURE</subject><subject>Electrons</subject><subject>FILTERS</subject><subject>HARD X RADIATION</subject><subject>INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY</subject><subject>KEV RANGE 01-10</subject><subject>KINETIC ENERGY</subject><subject>LENGTH</subject><subject>Photoelectric emission</subject><subject>PHOTOELECTRON SPECTROSCOPY</subject><subject>Photoelectrons</subject><subject>PHOTOEMISSION</subject><subject>RESOLUTION</subject><subject>Scientific apparatus & instruments</subject><subject>STRONTIUM TITANATES</subject><subject>X ray spectra</subject><issn>0034-6748</issn><issn>1089-7623</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2014</creationdate><recordtype>article</recordtype><recordid>eNpFkM1Lw0AQxRdRbK0e_Ack4EUPqTO7my88afELCl70vGy2E5qaZOtuIva_d0urDgwzhx-P9x5j5whThFTc4FQWwFHiARsj5EWcpVwcsjGAkHGayXzETrxfQZgE8ZiNeCIFIGZjdns_NB-Rp87Xff1F0VK7RfQdO72J1kvbW2pr72vbRdSQ6V142to4641db07ZUaUbT2f7O2Hvjw9vs-d4_vr0Mrubx0ZK3scJLysOpFPNOYIsRCm1lGA0lImBivQiy6g0BSJooVMyeWYQKmkoB05EYsIud7rW97Xypu7JLI3tuuBIcS6KsCJQVztq7eznQL5XwbqhptEd2cErTHme5yiz7F_wD13ZwXUhg-LI0wQEogzU9Y7a5vWOKrV2davdRiGobe8K1b73wF7sFYeypcUf-Vu0-AFurnsh</recordid><startdate>20141101</startdate><enddate>20141101</enddate><creator>Patt, M</creator><creator>Wiemann, C</creator><creator>Weber, N</creator><creator>Escher, M</creator><creator>Gloskovskii, A</creator><creator>Drube, W</creator><creator>Merkel, M</creator><creator>Schneider, C M</creator><general>American Institute of Physics</general><scope>NPM</scope><scope>AAYXX</scope><scope>CITATION</scope><scope>8FD</scope><scope>H8D</scope><scope>L7M</scope><scope>7X8</scope><scope>OTOTI</scope></search><sort><creationdate>20141101</creationdate><title>Bulk sensitive hard x-ray photoemission electron microscopy</title><author>Patt, M ; Wiemann, C ; Weber, N ; Escher, M ; Gloskovskii, A ; Drube, W ; Merkel, M ; Schneider, C M</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c442t-52bf20ea6a2210493b4a440ca0b5c0fead77ebc9110a3a6ec87c10f4ce802eee3</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2014</creationdate><topic>Attenuation</topic><topic>Buried structures</topic><topic>DEPTH</topic><topic>DESIGN</topic><topic>ELECTRON MICROSCOPES</topic><topic>ELECTRON MICROSCOPY</topic><topic>ELECTRONIC STRUCTURE</topic><topic>Electrons</topic><topic>FILTERS</topic><topic>HARD X RADIATION</topic><topic>INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY</topic><topic>KEV RANGE 01-10</topic><topic>KINETIC ENERGY</topic><topic>LENGTH</topic><topic>Photoelectric emission</topic><topic>PHOTOELECTRON SPECTROSCOPY</topic><topic>Photoelectrons</topic><topic>PHOTOEMISSION</topic><topic>RESOLUTION</topic><topic>Scientific apparatus & instruments</topic><topic>STRONTIUM TITANATES</topic><topic>X ray spectra</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Patt, M</creatorcontrib><creatorcontrib>Wiemann, C</creatorcontrib><creatorcontrib>Weber, N</creatorcontrib><creatorcontrib>Escher, M</creatorcontrib><creatorcontrib>Gloskovskii, A</creatorcontrib><creatorcontrib>Drube, W</creatorcontrib><creatorcontrib>Merkel, M</creatorcontrib><creatorcontrib>Schneider, C M</creatorcontrib><collection>PubMed</collection><collection>CrossRef</collection><collection>Technology Research Database</collection><collection>Aerospace Database</collection><collection>Advanced Technologies Database with Aerospace</collection><collection>MEDLINE - Academic</collection><collection>OSTI.GOV</collection><jtitle>Review of scientific instruments</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Patt, M</au><au>Wiemann, C</au><au>Weber, N</au><au>Escher, M</au><au>Gloskovskii, A</au><au>Drube, W</au><au>Merkel, M</au><au>Schneider, C M</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Bulk sensitive hard x-ray photoemission electron microscopy</atitle><jtitle>Review of scientific instruments</jtitle><addtitle>Rev Sci Instrum</addtitle><date>2014-11-01</date><risdate>2014</risdate><volume>85</volume><issue>11</issue><spage>113704</spage><epage>113704</epage><pages>113704-113704</pages><issn>0034-6748</issn><eissn>1089-7623</eissn><abstract>Hard x-ray photoelectron spectroscopy (HAXPES) has now matured into a well-established technique as a bulk sensitive probe of the electronic structure due to the larger escape depth of the highly energetic electrons. In order to enable HAXPES studies with high lateral resolution, we have set up a dedicated energy-filtered hard x-ray photoemission electron microscope (HAXPEEM) working with electron kinetic energies up to 10 keV. It is based on the NanoESCA design and also preserves the performance of the instrument in the low and medium energy range. In this way, spectromicroscopy can be performed from threshold to hard x-ray photoemission. The high potential of the HAXPEEM approach for the investigation of buried layers and structures has been shown already on a layered and structured SrTiO3 sample. Here, we present results of experiments with test structures to elaborate the imaging and spectroscopic performance of the instrument and show the capabilities of the method to image bulk properties. Additionally, we introduce a method to determine the effective attenuation length of photoelectrons in a direct photoemission experiment.</abstract><cop>United States</cop><pub>American Institute of Physics</pub><pmid>25430117</pmid><doi>10.1063/1.4902141</doi><tpages>1</tpages><oa>free_for_read</oa></addata></record> |
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| ispartof | Review of scientific instruments, 2014-11, Vol.85 (11), p.113704-113704 |
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| source | AIP Journals Complete; Alma/SFX Local Collection |
| subjects | Attenuation Buried structures DEPTH DESIGN ELECTRON MICROSCOPES ELECTRON MICROSCOPY ELECTRONIC STRUCTURE Electrons FILTERS HARD X RADIATION INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY KEV RANGE 01-10 KINETIC ENERGY LENGTH Photoelectric emission PHOTOELECTRON SPECTROSCOPY Photoelectrons PHOTOEMISSION RESOLUTION Scientific apparatus & instruments STRONTIUM TITANATES X ray spectra |
| title | Bulk sensitive hard x-ray photoemission electron microscopy |
| url | https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-01-27T14%3A46%3A00IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-proquest_osti_&rft_val_fmt=info:ofi/fmt:kev:mtx:journal&rft.genre=article&rft.atitle=Bulk%20sensitive%20hard%20x-ray%20photoemission%20electron%20microscopy&rft.jtitle=Review%20of%20scientific%20instruments&rft.au=Patt,%20M&rft.date=2014-11-01&rft.volume=85&rft.issue=11&rft.spage=113704&rft.epage=113704&rft.pages=113704-113704&rft.issn=0034-6748&rft.eissn=1089-7623&rft_id=info:doi/10.1063/1.4902141&rft_dat=%3Cproquest_osti_%3E1628881477%3C/proquest_osti_%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_pqid=2126503114&rft_id=info:pmid/25430117&rfr_iscdi=true |