Multiparameter double hole contrast detail phantom: Ability to detect image displacement due to off position anode stem
Contrast Detail phantom is a quality control tool to analyze the performance of imaging devices. Currently, its function is solely to evaluate the contrast detail characteristic of imaging system. It consists of drilled hole which gives effect to the penetration of x-ray beam divergence to pass thro...
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| creator | Pauzi, Nur Farahana Majid, Zafri Azran Abdul Sapuan, Abdul Halim Junet, Laila Kalidah Azemin, Mohd Zulfaezal Che |
| description | Contrast Detail phantom is a quality control tool to analyze the performance of imaging devices. Currently, its function is solely to evaluate the contrast detail characteristic of imaging system. It consists of drilled hole which gives effect to the penetration of x-ray beam divergence to pass through the base of each hole. This effect will lead to false appearance of image from its original location but it does not being visualized in the radiograph. In this study, a new design of Contrast Detail phantom’s hole which consists of double hole construction has been developed. It can detect the image displacement which is due to off position of anode stem from its original location. The double hole differs from previous milled hole, whereby it consists of combination of different hole diameters. Small hole diameter (3 mm) is positioned on top of larger hole diameter (10 mm). The thickness of double hole acrylic blocks is 13 mm. Result revealed` that, Multiparameter Double Hole Contrast Detail phantom can visualize the shifted flaw image quality produced by x-ray machine due to improper position of the anode stem which is attached to rotor and stator. The effective focal spot of x-ray beam also has been shifted from the center of collimator as a result of off-position anode stem. As a conclusion, the new design of double hole Contrast Detail phantom able to measure those parameters in a well manner. |
| doi_str_mv | 10.1063/1.4915207 |
| format | Conference Proceeding |
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Currently, its function is solely to evaluate the contrast detail characteristic of imaging system. It consists of drilled hole which gives effect to the penetration of x-ray beam divergence to pass through the base of each hole. This effect will lead to false appearance of image from its original location but it does not being visualized in the radiograph. In this study, a new design of Contrast Detail phantom’s hole which consists of double hole construction has been developed. It can detect the image displacement which is due to off position of anode stem from its original location. The double hole differs from previous milled hole, whereby it consists of combination of different hole diameters. Small hole diameter (3 mm) is positioned on top of larger hole diameter (10 mm). The thickness of double hole acrylic blocks is 13 mm. Result revealed` that, Multiparameter Double Hole Contrast Detail phantom can visualize the shifted flaw image quality produced by x-ray machine due to improper position of the anode stem which is attached to rotor and stator. The effective focal spot of x-ray beam also has been shifted from the center of collimator as a result of off-position anode stem. As a conclusion, the new design of double hole Contrast Detail phantom able to measure those parameters in a well manner.</description><identifier>ISSN: 0094-243X</identifier><identifier>EISSN: 1551-7616</identifier><identifier>DOI: 10.1063/1.4915207</identifier><language>eng</language><publisher>Melville: American Institute of Physics</publisher><subject>Anode effect ; ANODES ; CLASSICAL AND QUANTUM MECHANICS, GENERAL PHYSICS ; Collimation ; COLLIMATORS ; DEFECTS ; DESIGN ; Divergence ; Image contrast ; Image detection ; Image quality ; PHANTOMS ; PHOTON BEAMS ; QUALITY CONTROL ; Radiographs ; ROTORS ; STATORS ; X RADIATION</subject><ispartof>AIP conference proceedings, 2015, Vol.1657 (1)</ispartof><rights>2015 AIP Publishing LLC.</rights><lds50>peer_reviewed</lds50><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><link.rule.ids>230,309,310,314,780,784,789,790,885,23930,23931,25140,27924,27925</link.rule.ids><backlink>$$Uhttps://www.osti.gov/biblio/22391536$$D View this record in Osti.gov$$Hfree_for_read</backlink></links><search><creatorcontrib>Pauzi, Nur Farahana</creatorcontrib><creatorcontrib>Majid, Zafri Azran Abdul</creatorcontrib><creatorcontrib>Sapuan, Abdul Halim</creatorcontrib><creatorcontrib>Junet, Laila Kalidah</creatorcontrib><creatorcontrib>Azemin, Mohd Zulfaezal Che</creatorcontrib><title>Multiparameter double hole contrast detail phantom: Ability to detect image displacement due to off position anode stem</title><title>AIP conference proceedings</title><description>Contrast Detail phantom is a quality control tool to analyze the performance of imaging devices. Currently, its function is solely to evaluate the contrast detail characteristic of imaging system. It consists of drilled hole which gives effect to the penetration of x-ray beam divergence to pass through the base of each hole. This effect will lead to false appearance of image from its original location but it does not being visualized in the radiograph. In this study, a new design of Contrast Detail phantom’s hole which consists of double hole construction has been developed. It can detect the image displacement which is due to off position of anode stem from its original location. The double hole differs from previous milled hole, whereby it consists of combination of different hole diameters. Small hole diameter (3 mm) is positioned on top of larger hole diameter (10 mm). The thickness of double hole acrylic blocks is 13 mm. Result revealed` that, Multiparameter Double Hole Contrast Detail phantom can visualize the shifted flaw image quality produced by x-ray machine due to improper position of the anode stem which is attached to rotor and stator. The effective focal spot of x-ray beam also has been shifted from the center of collimator as a result of off-position anode stem. As a conclusion, the new design of double hole Contrast Detail phantom able to measure those parameters in a well manner.</description><subject>Anode effect</subject><subject>ANODES</subject><subject>CLASSICAL AND QUANTUM MECHANICS, GENERAL PHYSICS</subject><subject>Collimation</subject><subject>COLLIMATORS</subject><subject>DEFECTS</subject><subject>DESIGN</subject><subject>Divergence</subject><subject>Image contrast</subject><subject>Image detection</subject><subject>Image quality</subject><subject>PHANTOMS</subject><subject>PHOTON BEAMS</subject><subject>QUALITY CONTROL</subject><subject>Radiographs</subject><subject>ROTORS</subject><subject>STATORS</subject><subject>X RADIATION</subject><issn>0094-243X</issn><issn>1551-7616</issn><fulltext>true</fulltext><rsrctype>conference_proceeding</rsrctype><creationdate>2015</creationdate><recordtype>conference_proceeding</recordtype><recordid>eNpFkEtLxDAUhYMoOD4W_oOA6455N3E3DL5gxI2CuyFpbpwMbVObFPHf20HBzT2Le87luwehK0qWlCh-Q5fCUMlIfYQWVEpa1YqqY7QgxIiKCf5-is5y3hPCTF3rBfp6ntoSBzvaDgqM2KfJtYB3aR5N6stoc8Eeio0tHna2L6m7xSsX21i-cUmHFTQFx85-APYxD61toIN-Dk1wMKQQ8JByLDH12PbJA84Fugt0Emyb4fJPz9Hb_d3r-rHavDw8rVebKjFNS-Wt4U54CwE8154Ac9YqZ4J0jZAskKBIACW9lk4FUwcitFEhON1IA0Tzc3T9ezflEre5iTPubn6sn6m3jPG5LK7-XcOYPifIZbtP09jPYFtGmdBEiZrxH470a_Q</recordid><startdate>20150424</startdate><enddate>20150424</enddate><creator>Pauzi, Nur Farahana</creator><creator>Majid, Zafri Azran Abdul</creator><creator>Sapuan, Abdul Halim</creator><creator>Junet, Laila Kalidah</creator><creator>Azemin, Mohd Zulfaezal Che</creator><general>American Institute of Physics</general><scope>8FD</scope><scope>H8D</scope><scope>L7M</scope><scope>OTOTI</scope></search><sort><creationdate>20150424</creationdate><title>Multiparameter double hole contrast detail phantom: Ability to detect image displacement due to off position anode stem</title><author>Pauzi, Nur Farahana ; Majid, Zafri Azran Abdul ; Sapuan, Abdul Halim ; Junet, Laila Kalidah ; Azemin, Mohd Zulfaezal Che</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-o281t-da93b4daefed38d0e2baa6b9f5bc452f0f60fe65d85b6f97f04896ffb8c59e083</frbrgroupid><rsrctype>conference_proceedings</rsrctype><prefilter>conference_proceedings</prefilter><language>eng</language><creationdate>2015</creationdate><topic>Anode effect</topic><topic>ANODES</topic><topic>CLASSICAL AND QUANTUM MECHANICS, GENERAL PHYSICS</topic><topic>Collimation</topic><topic>COLLIMATORS</topic><topic>DEFECTS</topic><topic>DESIGN</topic><topic>Divergence</topic><topic>Image contrast</topic><topic>Image detection</topic><topic>Image quality</topic><topic>PHANTOMS</topic><topic>PHOTON BEAMS</topic><topic>QUALITY CONTROL</topic><topic>Radiographs</topic><topic>ROTORS</topic><topic>STATORS</topic><topic>X RADIATION</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Pauzi, Nur Farahana</creatorcontrib><creatorcontrib>Majid, Zafri Azran Abdul</creatorcontrib><creatorcontrib>Sapuan, Abdul Halim</creatorcontrib><creatorcontrib>Junet, Laila Kalidah</creatorcontrib><creatorcontrib>Azemin, Mohd Zulfaezal Che</creatorcontrib><collection>Technology Research Database</collection><collection>Aerospace Database</collection><collection>Advanced Technologies Database with Aerospace</collection><collection>OSTI.GOV</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Pauzi, Nur Farahana</au><au>Majid, Zafri Azran Abdul</au><au>Sapuan, Abdul Halim</au><au>Junet, Laila Kalidah</au><au>Azemin, Mohd Zulfaezal Che</au><format>book</format><genre>proceeding</genre><ristype>CONF</ristype><atitle>Multiparameter double hole contrast detail phantom: Ability to detect image displacement due to off position anode stem</atitle><btitle>AIP conference proceedings</btitle><date>2015-04-24</date><risdate>2015</risdate><volume>1657</volume><issue>1</issue><issn>0094-243X</issn><eissn>1551-7616</eissn><abstract>Contrast Detail phantom is a quality control tool to analyze the performance of imaging devices. Currently, its function is solely to evaluate the contrast detail characteristic of imaging system. It consists of drilled hole which gives effect to the penetration of x-ray beam divergence to pass through the base of each hole. This effect will lead to false appearance of image from its original location but it does not being visualized in the radiograph. In this study, a new design of Contrast Detail phantom’s hole which consists of double hole construction has been developed. It can detect the image displacement which is due to off position of anode stem from its original location. The double hole differs from previous milled hole, whereby it consists of combination of different hole diameters. Small hole diameter (3 mm) is positioned on top of larger hole diameter (10 mm). The thickness of double hole acrylic blocks is 13 mm. Result revealed` that, Multiparameter Double Hole Contrast Detail phantom can visualize the shifted flaw image quality produced by x-ray machine due to improper position of the anode stem which is attached to rotor and stator. The effective focal spot of x-ray beam also has been shifted from the center of collimator as a result of off-position anode stem. As a conclusion, the new design of double hole Contrast Detail phantom able to measure those parameters in a well manner.</abstract><cop>Melville</cop><pub>American Institute of Physics</pub><doi>10.1063/1.4915207</doi></addata></record> |
| fulltext | fulltext |
| identifier | ISSN: 0094-243X |
| ispartof | AIP conference proceedings, 2015, Vol.1657 (1) |
| issn | 0094-243X 1551-7616 |
| language | eng |
| recordid | cdi_osti_scitechconnect_22391536 |
| source | AIP Journals Complete |
| subjects | Anode effect ANODES CLASSICAL AND QUANTUM MECHANICS, GENERAL PHYSICS Collimation COLLIMATORS DEFECTS DESIGN Divergence Image contrast Image detection Image quality PHANTOMS PHOTON BEAMS QUALITY CONTROL Radiographs ROTORS STATORS X RADIATION |
| title | Multiparameter double hole contrast detail phantom: Ability to detect image displacement due to off position anode stem |
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