Sub-nanosecond time-resolved ambient-pressure X-ray photoelectron spectroscopy setup for pulsed and constant wave X-ray light sources

An apparatus for sub-nanosecond time-resolved ambient-pressure X-ray photoelectron spectroscopy studies with pulsed and constant wave X-ray light sources is presented. A differentially pumped hemispherical electron analyzer is equipped with a delay-line detector that simultaneously records the posit...

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Veröffentlicht in:	Review of scientific instruments 2014-09, Vol.85 (9), p.093102-093102
Hauptverfasser:	Shavorskiy, Andrey, Neppl, Stefan, Slaughter, Daniel S, Cryan, James P, Siefermann, Katrin R, Weise, Fabian, Lin, Ming-Fu, Bacellar, Camila, Ziemkiewicz, Michael P, Zegkinoglou, Ioannis, Fraund, Matthew W, Khurmi, Champak, Hertlein, Marcus P, Wright, Travis W, Huse, Nils, Schoenlein, Robert W, Tyliszczak, Tolek, Coslovich, Giacomo, Robinson, Joseph, Kaindl, Robert A, Rude, Bruce S, Ölsner, Andreas, Mähl, Sven, Bluhm, Hendrik, Gessner, Oliver
Format:	Artikel
Sprache:	eng
Schlagworte:	ACCURACY Automobile industry Coding Computer simulation COMPUTERIZED SIMULATION Dependence Electron trajectories ELECTRONS ELECTROSTATIC LENSES Emittance Entrances EV RANGE INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY KINETIC ENERGY LASERS Lenses LIGHT SOURCES LIOUVILLE THEOREM Photoelectron spectroscopy Photoelectrons Retarding SILICON SPATIAL RESOLUTION Spectrum analysis TIME DELAY TIME RESOLUTION TIME-OF-FLIGHT METHOD Trajectory analysis X ray photoelectron spectroscopy X ray sources X ray spectra
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