A method to determine fault vectors in 4H-SiC from stacking sequences observed on high resolution transmission electron microscopy images
A new method has been developed to determine the fault vectors associated with stacking faults in 4H-SiC from their stacking sequences observed on high resolution TEM images. This method, analogous to the Burgers circuit technique for determination of dislocation Burgers vector, involves determinati...
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| Veröffentlicht in: | Journal of applied physics 2014-09, Vol.116 (10) |
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| container_title | Journal of applied physics |
| container_volume | 116 |
| creator | Wu, Fangzhen Wang, Huanhuan Raghothamachar, Balaji Dudley, Michael Mueller, Stephan G. Chung, Gil Sanchez, Edward K. Hansen, Darren Loboda, Mark J. Zhang, Lihua Su, Dong Kisslinger, Kim Stach, Eric |
| description | A new method has been developed to determine the fault vectors associated with stacking faults in 4H-SiC from their stacking sequences observed on high resolution TEM images. This method, analogous to the Burgers circuit technique for determination of dislocation Burgers vector, involves determination of the vectors required in the projection of the perfect lattice to correct the deviated path constructed in the faulted material. Results for several different stacking faults were compared with fault vectors determined from X-ray topographic contrast analysis and were found to be consistent. This technique is expected to applicable to all structures comprising corner shared tetrahedra. |
| doi_str_mv | 10.1063/1.4895136 |
| format | Article |
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| identifier | ISSN: 0021-8979 |
| ispartof | Journal of applied physics, 2014-09, Vol.116 (10) |
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| language | eng |
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| source | AIP Journals Complete; Alma/SFX Local Collection |
| subjects | BURGERS VECTOR CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY DISLOCATIONS RESOLUTION SILICON CARBIDES STACKING FAULTS TRANSMISSION ELECTRON MICROSCOPY X RADIATION |
| title | A method to determine fault vectors in 4H-SiC from stacking sequences observed on high resolution transmission electron microscopy images |
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