X-ray conversion of ultra-short laser pulses on a solid sample: Role of electron waves excited in the pre-plasma

Flat silicon samples were irradiated with 40 fs, 800 nm laser pulses at an intensity at the best focus of 2·1018 Wcm−2, in the presence of a pre-plasma on the sample surface. X-ray emission in the spectral range from 2 to 30 keV was detected inside and outside the plane of incidence, while varying p...

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