$In situ examination of oxygen non-stoichiometry in La{sub 0.80}Sr{sub 0.20}CoO{sub 3−δ} thin films at intermediate and low temperatures by x-ray diffraction$

In situ examination of oxygen non-stoichiometry in La{sub 0.80}Sr{sub 0.20}CoO{sub 3−δ} thin films at intermediate and low temperatures by x-ray diffraction

Structural evolution of epitaxial La{sub 0.80}Sr{sub 0.20}CoO{sub 3−δ} thin films under chemical and voltage stimuli was examined in situ using X-ray diffraction. The changes in lattice parameter (chemical expansivity) were used to quantify oxygen reduction reaction processes and vacancy concentrati...

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Veröffentlicht in:	Applied physics letters 2014-04, Vol.104 (16)
Hauptverfasser:	Biegalski, M. D., Belianinov, A., Kalinin, S. V., Crumlin, E., Mutoro, E., Shao-Horn, Y.
Format:	Artikel
Sprache:	eng
Schlagworte:	AMORPHOUS STATE CARBON MONOXIDE LANTHANUM LATTICE PARAMETERS MATERIALS SCIENCE OXYGEN STOICHIOMETRY STRONTIUM THIN FILMS VACANCIES X-RAY DIFFRACTION
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