Nanopipette combined with quartz tuning fork-atomic force microscope for force spectroscopy/microscopy and liquid delivery-based nanofabrication

This paper introduces a nanopipette combined with a quartz tuning fork-atomic force microscope system (nanopipette/QTF-AFM), and describes experimental and theoretical investigations of the nanoscale materials used. The system offers several advantages over conventional cantilever-based AFM and QTF-...

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Veröffentlicht in:	Review of scientific instruments 2014-03, Vol.85 (3), p.033702-033702
Hauptverfasser:	An, Sangmin, Lee, Kunyoung, Kim, Bongsu, Noh, Haneol, Kim, Jongwoo, Kwon, Soyoung, Lee, Manhee, Hong, Mun-Heon, Jhe, Wonho
Format:	Artikel
Sprache:	eng
Schlagworte:	Atomic force microscopes ATOMIC FORCE MICROSCOPY Electric contacts FABRICATION MATERIALS SCIENCE Microscopes Microscopy Microscopy, Atomic Force - instrumentation Microscopy, Atomic Force - methods Nanofabrication NANOSCIENCE AND NANOTECHNOLOGY NANOSTRUCTURES Nanostructures - chemistry Nanotechnology - instrumentation Nanotechnology - methods Q factors QUALITY FACTOR QUARTZ Scientific apparatus & instruments SPECTROSCOPY Spectrum analysis Surface properties TUNING
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