The characterisation of lead-free thick-film resistors on different low temperature Co-fired ceramics substrates
[Display omitted] ► Lead free thick film resistors based on ruthenium oxide were developed. ► The compatibility of resistors with different LTCC substrates was evaluated. ► The interactions between resistors and glassy LTCC substrates were not detected. ► Electrical characteristics were comparable w...
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| Veröffentlicht in: | Materials research bulletin 2012-12, Vol.47 (12), p.4131-4136 |
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| container_title | Materials research bulletin |
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| creator | Hrovat, Marko Kielbasinski, Konrad Makarovič, Kostja Belavič, Darko Jakubowska, Malgorzata |
| description | [Display omitted]
► Lead free thick film resistors based on ruthenium oxide were developed. ► The compatibility of resistors with different LTCC substrates was evaluated. ► The interactions between resistors and glassy LTCC substrates were not detected. ► Electrical characteristics were comparable with commercial thick film resistors.
Lead-free thick-film resistors were synthesised and investigated. The thick-film resistor materials with nominal sheet resistivities from 50ohm/sq. to 50kohm/sq. were prepared using combinations of two lead-free glasses with reflow temperatures at 940°C and 1240°C, respectively, and two RuO2 powders (fine-grained and coarse-grained RuO2). The thick-film resistors were printed and fired on alumina and on low temperature co-fired ceramics substrates and fired at 850°C and 950°C. The fired resistors were investigated by X-ray powder diffraction, by scanning electron microscopy and by energy dispersive X-ray analysis. The sheet resistivities, temperature coefficients of resistivity, gauge factors and noise indices were measured. |
| doi_str_mv | 10.1016/j.materresbull.2012.08.066 |
| format | Article |
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► Lead free thick film resistors based on ruthenium oxide were developed. ► The compatibility of resistors with different LTCC substrates was evaluated. ► The interactions between resistors and glassy LTCC substrates were not detected. ► Electrical characteristics were comparable with commercial thick film resistors.
Lead-free thick-film resistors were synthesised and investigated. The thick-film resistor materials with nominal sheet resistivities from 50ohm/sq. to 50kohm/sq. were prepared using combinations of two lead-free glasses with reflow temperatures at 940°C and 1240°C, respectively, and two RuO2 powders (fine-grained and coarse-grained RuO2). The thick-film resistors were printed and fired on alumina and on low temperature co-fired ceramics substrates and fired at 850°C and 950°C. The fired resistors were investigated by X-ray powder diffraction, by scanning electron microscopy and by energy dispersive X-ray analysis. The sheet resistivities, temperature coefficients of resistivity, gauge factors and noise indices were measured.</description><identifier>ISSN: 0025-5408</identifier><identifier>EISSN: 1873-4227</identifier><identifier>DOI: 10.1016/j.materresbull.2012.08.066</identifier><language>eng</language><publisher>United States: Elsevier Ltd</publisher><subject>A. Ceramics ; ALUMINIUM OXIDES ; C. Electron microscopy ; C. X-ray diffraction ; CERAMICS ; D. Electrical properties ; D. Microstructure ; ELECTRICAL PROPERTIES ; MATERIALS SCIENCE ; MICROSTRUCTURE ; RESISTORS ; RUTHENIUM OXIDES ; SCANNING ELECTRON MICROSCOPY ; SUBSTRATES ; TEMPERATURE COEFFICIENT ; X RADIATION ; X-RAY DIFFRACTION</subject><ispartof>Materials research bulletin, 2012-12, Vol.47 (12), p.4131-4136</ispartof><rights>2012 Elsevier Ltd</rights><lds50>peer_reviewed</lds50><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-c352t-49bf686a4421c62567ad3b7ce73a99e766c605a84d9af743245ef88002abc5fa3</citedby><cites>FETCH-LOGICAL-c352t-49bf686a4421c62567ad3b7ce73a99e766c605a84d9af743245ef88002abc5fa3</cites></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://dx.doi.org/10.1016/j.materresbull.2012.08.066$$EHTML$$P50$$Gelsevier$$H</linktohtml><link.rule.ids>230,314,780,784,885,3550,27924,27925,45995</link.rule.ids><backlink>$$Uhttps://www.osti.gov/biblio/22215661$$D View this record in Osti.gov$$Hfree_for_read</backlink></links><search><creatorcontrib>Hrovat, Marko</creatorcontrib><creatorcontrib>Kielbasinski, Konrad</creatorcontrib><creatorcontrib>Makarovič, Kostja</creatorcontrib><creatorcontrib>Belavič, Darko</creatorcontrib><creatorcontrib>Jakubowska, Malgorzata</creatorcontrib><title>The characterisation of lead-free thick-film resistors on different low temperature Co-fired ceramics substrates</title><title>Materials research bulletin</title><description>[Display omitted]
► Lead free thick film resistors based on ruthenium oxide were developed. ► The compatibility of resistors with different LTCC substrates was evaluated. ► The interactions between resistors and glassy LTCC substrates were not detected. ► Electrical characteristics were comparable with commercial thick film resistors.
Lead-free thick-film resistors were synthesised and investigated. The thick-film resistor materials with nominal sheet resistivities from 50ohm/sq. to 50kohm/sq. were prepared using combinations of two lead-free glasses with reflow temperatures at 940°C and 1240°C, respectively, and two RuO2 powders (fine-grained and coarse-grained RuO2). The thick-film resistors were printed and fired on alumina and on low temperature co-fired ceramics substrates and fired at 850°C and 950°C. The fired resistors were investigated by X-ray powder diffraction, by scanning electron microscopy and by energy dispersive X-ray analysis. The sheet resistivities, temperature coefficients of resistivity, gauge factors and noise indices were measured.</description><subject>A. Ceramics</subject><subject>ALUMINIUM OXIDES</subject><subject>C. Electron microscopy</subject><subject>C. X-ray diffraction</subject><subject>CERAMICS</subject><subject>D. Electrical properties</subject><subject>D. Microstructure</subject><subject>ELECTRICAL PROPERTIES</subject><subject>MATERIALS SCIENCE</subject><subject>MICROSTRUCTURE</subject><subject>RESISTORS</subject><subject>RUTHENIUM OXIDES</subject><subject>SCANNING ELECTRON MICROSCOPY</subject><subject>SUBSTRATES</subject><subject>TEMPERATURE COEFFICIENT</subject><subject>X RADIATION</subject><subject>X-RAY DIFFRACTION</subject><issn>0025-5408</issn><issn>1873-4227</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2012</creationdate><recordtype>article</recordtype><recordid>eNqNkE9PAyEQxYnRxFr9DkTPuwLLAvVm6t-kiZd6Jiw7pNTdpQGq8dtLUw8ePU0y85v38h5C15TUlFBxu61HkyFGSN1-GGpGKKuJqokQJ2hGlWwqzpg8RTNCWFu1nKhzdJHSlhDClZQztFtvANuNicYWHZ9M9mHCweEBTF-5CIDzxtuPyvlhxMXHpxxiwgXqvXMQYcp4CF84w7iDaPI-Al6GgkfosS2b0duE075LuVwhXaIzZ4YEV79zjt6fHtfLl2r19vy6vF9VtmlZrviic0IJwzmjVrBWSNM3nbQgG7NYgBTCCtIaxfuFcZI3jLfglCoxTWdbZ5o5ujnqhpS9TtZnsBsbpgls1owx2gpBC3V3pGwMKUVwehf9aOK3pkQfGtZb_bdhfWhYE6VLw-X54fgMJcenh3iwgclCX8IXlz74_8j8AI85jhk</recordid><startdate>20121201</startdate><enddate>20121201</enddate><creator>Hrovat, Marko</creator><creator>Kielbasinski, Konrad</creator><creator>Makarovič, Kostja</creator><creator>Belavič, Darko</creator><creator>Jakubowska, Malgorzata</creator><general>Elsevier Ltd</general><scope>AAYXX</scope><scope>CITATION</scope><scope>OTOTI</scope></search><sort><creationdate>20121201</creationdate><title>The characterisation of lead-free thick-film resistors on different low temperature Co-fired ceramics substrates</title><author>Hrovat, Marko ; Kielbasinski, Konrad ; Makarovič, Kostja ; Belavič, Darko ; Jakubowska, Malgorzata</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c352t-49bf686a4421c62567ad3b7ce73a99e766c605a84d9af743245ef88002abc5fa3</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2012</creationdate><topic>A. Ceramics</topic><topic>ALUMINIUM OXIDES</topic><topic>C. Electron microscopy</topic><topic>C. X-ray diffraction</topic><topic>CERAMICS</topic><topic>D. Electrical properties</topic><topic>D. Microstructure</topic><topic>ELECTRICAL PROPERTIES</topic><topic>MATERIALS SCIENCE</topic><topic>MICROSTRUCTURE</topic><topic>RESISTORS</topic><topic>RUTHENIUM OXIDES</topic><topic>SCANNING ELECTRON MICROSCOPY</topic><topic>SUBSTRATES</topic><topic>TEMPERATURE COEFFICIENT</topic><topic>X RADIATION</topic><topic>X-RAY DIFFRACTION</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Hrovat, Marko</creatorcontrib><creatorcontrib>Kielbasinski, Konrad</creatorcontrib><creatorcontrib>Makarovič, Kostja</creatorcontrib><creatorcontrib>Belavič, Darko</creatorcontrib><creatorcontrib>Jakubowska, Malgorzata</creatorcontrib><collection>CrossRef</collection><collection>OSTI.GOV</collection><jtitle>Materials research bulletin</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Hrovat, Marko</au><au>Kielbasinski, Konrad</au><au>Makarovič, Kostja</au><au>Belavič, Darko</au><au>Jakubowska, Malgorzata</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>The characterisation of lead-free thick-film resistors on different low temperature Co-fired ceramics substrates</atitle><jtitle>Materials research bulletin</jtitle><date>2012-12-01</date><risdate>2012</risdate><volume>47</volume><issue>12</issue><spage>4131</spage><epage>4136</epage><pages>4131-4136</pages><issn>0025-5408</issn><eissn>1873-4227</eissn><abstract>[Display omitted]
► Lead free thick film resistors based on ruthenium oxide were developed. ► The compatibility of resistors with different LTCC substrates was evaluated. ► The interactions between resistors and glassy LTCC substrates were not detected. ► Electrical characteristics were comparable with commercial thick film resistors.
Lead-free thick-film resistors were synthesised and investigated. The thick-film resistor materials with nominal sheet resistivities from 50ohm/sq. to 50kohm/sq. were prepared using combinations of two lead-free glasses with reflow temperatures at 940°C and 1240°C, respectively, and two RuO2 powders (fine-grained and coarse-grained RuO2). The thick-film resistors were printed and fired on alumina and on low temperature co-fired ceramics substrates and fired at 850°C and 950°C. The fired resistors were investigated by X-ray powder diffraction, by scanning electron microscopy and by energy dispersive X-ray analysis. The sheet resistivities, temperature coefficients of resistivity, gauge factors and noise indices were measured.</abstract><cop>United States</cop><pub>Elsevier Ltd</pub><doi>10.1016/j.materresbull.2012.08.066</doi><tpages>6</tpages></addata></record> |
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| subjects | A. Ceramics ALUMINIUM OXIDES C. Electron microscopy C. X-ray diffraction CERAMICS D. Electrical properties D. Microstructure ELECTRICAL PROPERTIES MATERIALS SCIENCE MICROSTRUCTURE RESISTORS RUTHENIUM OXIDES SCANNING ELECTRON MICROSCOPY SUBSTRATES TEMPERATURE COEFFICIENT X RADIATION X-RAY DIFFRACTION |
| title | The characterisation of lead-free thick-film resistors on different low temperature Co-fired ceramics substrates |
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