Topological size effect in tin-dioxide cluster films produced by reactive sputtering

The optical properties of tin-dioxide nanofilms produced by reactive sputtering are studied by the internal reflection technique and modulation polarimetry. The angular and spectral characteristics of the reflection coefficients R s 2 and R p 2 are studied for linear-polarized radiations, for which...

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Veröffentlicht in:	Semiconductors (Woodbury, N.Y.) N.Y.), 2013-07, Vol.47 (7), p.925-929
Hauptverfasser:	Maksimenko, L. S., Matyash, I. E., Mishchuk, O. N., Rudenko, S. P., Serdega, B. K.
Format:	Artikel
Sprache:	eng
Schlagworte:	ATOMIC FORCE MICROSCOPY INCIDENCE ANGLE Interfaces Magnetic Materials Magnetism MATERIALS SCIENCE MODULATION OPTICAL PROPERTIES Physics Physics and Astronomy POLARIMETRY REFLECTION SPUTTERING SURFACES Thin Films TIN OXIDES TOPOLOGY
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