X-ray small-angle scattering from sputtered CeO{sub 2}/C bilayers

Surface and interface morphology of cerium oxide/carbon bilayers used as thin-film catalysts is studied by grazing-incidence small-angle x-ray scattering, scanning electron microscopy, and atomic-force microscopy, and the dependence of the structural parameters on the thicknesses of the constituting...

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Veröffentlicht in:	Journal of applied physics 2013-01, Vol.113 (2)
Hauptverfasser:	Haviar, S., Dubau, M., Khalakhan, I., Vorokhta, M., Matolinova, I., Matolin, V., Vales, V., Endres, J., Holy, V., Buljan, M., Bernstorff, S.
Format:	Artikel
Sprache:	eng
Schlagworte:	ATOMIC FORCE MICROSCOPY CARBON CATALYSTS CERIUM OXIDES CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY DEPOSITION INTERFACES LAYERS METALS SCANNING ELECTRON MICROSCOPY SMALL ANGLE SCATTERING SPUTTERING SURFACES THICKNESS THIN FILMS X RADIATION X-RAY DIFFRACTION
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Beschreibung
Zusammenfassung:	Surface and interface morphology of cerium oxide/carbon bilayers used as thin-film catalysts is studied by grazing-incidence small-angle x-ray scattering, scanning electron microscopy, and atomic-force microscopy, and the dependence of the structural parameters on the thicknesses of the constituting layers is investigated. The applicability of x-ray scattering and its advantages over standard analytical methods are discussed.
ISSN:	0021-8979 1089-7550
DOI:	10.1063/1.4773446