Simultaneous imaging electron- and ion-feature Thomson scattering measurements of radiatively heated Xe

Uniform density and temperature Xe plasmas have been produced over >4 mm scale-lengths using x-rays generated in a cylindrical Pb cavity. The cavity is 750 μm in depth and diameter, and is heated by a 300 J, 2 ns square, 1054 nm laser pulse focused to a spot size of 200 μm at the cavity entrance....

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Veröffentlicht in:Review of scientific instruments 2012-10, Vol.83 (10), p.10E348-10E348
Hauptverfasser: Pollock, B B, Meinecke, J, Kuschel, S, Ross, J S, Shaw, J L, Stoafer, C, Divol, L, Tynan, G R, Glenzer, S H
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container_end_page 10E348
container_issue 10
container_start_page 10E348
container_title Review of scientific instruments
container_volume 83
creator Pollock, B B
Meinecke, J
Kuschel, S
Ross, J S
Shaw, J L
Stoafer, C
Divol, L
Tynan, G R
Glenzer, S H
description Uniform density and temperature Xe plasmas have been produced over >4 mm scale-lengths using x-rays generated in a cylindrical Pb cavity. The cavity is 750 μm in depth and diameter, and is heated by a 300 J, 2 ns square, 1054 nm laser pulse focused to a spot size of 200 μm at the cavity entrance. The plasma is characterized by simultaneous imaging Thomson scattering measurements from both the electron and ion scattering features. The electron feature measurement determines the spatial electron density and temperature profile, and using these parameters as constraints in the ion feature analysis allows an accurate determination of the charge state of the Xe ions. The Thomson scattering probe beam is 40 J, 200 ps, and 527 nm, and is focused to a 100 μm spot size at the entrance of the Pb cavity. Each system has a spatial resolution of 25 μm, a temporal resolution of 200 ps (as determined by the probe duration), and a spectral resolution of 2 nm for the electron feature system and 0.025 nm for the ion feature system. The experiment is performed in a Xe filled target chamber at a neutral pressure of 3-10 Torr, and the x-rays produced in the Pb ionize and heat the Xe to a charge state of 20±4 at up to 200 eV electron temperatures.
doi_str_mv 10.1063/1.4740526
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ispartof Review of scientific instruments, 2012-10, Vol.83 (10), p.10E348-10E348
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source AIP Journals Complete; AIP Digital Archive; Alma/SFX Local Collection
subjects 70 PLASMA PHYSICS AND FUSION TECHNOLOGY
BEAMS
Charge
CHARGE STATES
ELECTRON DENSITY
ELECTRON TEMPERATURE
Entrances
Holes
Imaging
INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY
ION TEMPERATURE
LASER RADIATION
Lead (metal)
PLASMA
PLASMA DENSITY
PLASMA DIAGNOSTICS
PLASMA PRODUCTION
Plasmas
SPATIAL RESOLUTION
TARGET CHAMBERS
THOMSON SCATTERING
X RADIATION
X-rays
XENON IONS
title Simultaneous imaging electron- and ion-feature Thomson scattering measurements of radiatively heated Xe
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