A multi-crystal wavelength dispersive x-ray spectrometer
A multi-crystal wavelength dispersive hard x-ray spectrometer with high-energy resolution and large solid angle collection is described. The instrument is specifically designed for time-resolved applications of x-ray emission spectroscopy (XES) and x-ray Raman scattering (XRS) at X-ray Free Electron...
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| Veröffentlicht in: | Review of scientific instruments 2012-07, Vol.83 (7) |
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| creator | Alonso-Mori, Roberto Montanez, Paul Delor, James Bergmann, Uwe Kern, Jan Physical Biosciences Division, Lawrence Berkeley National Laboratory, Berkeley, California 94720-8099 Sokaras, Dimosthenis Weng, Tsu-Chien Nordlund, Dennis Tran, Rosalie Yachandra, Vittal K. Yano, Junko |
| description | A multi-crystal wavelength dispersive hard x-ray spectrometer with high-energy resolution and large solid angle collection is described. The instrument is specifically designed for time-resolved applications of x-ray emission spectroscopy (XES) and x-ray Raman scattering (XRS) at X-ray Free Electron Lasers (XFEL) and synchrotron radiation facilities. It also simplifies resonant inelastic x-ray scattering (RIXS) studies of the whole 2d RIXS plane. The spectrometer is based on the Von Hamos geometry. This dispersive setup enables an XES or XRS spectrum to be measured in a single-shot mode, overcoming the scanning needs of the Rowland circle spectrometers. In conjunction with the XFEL temporal profile and high-flux, it is a powerful tool for studying the dynamics of time-dependent systems. Photo-induced processes and fast catalytic reaction kinetics, ranging from femtoseconds to milliseconds, will be resolvable in a wide array of systems circumventing radiation damage. |
| doi_str_mv | 10.1063/1.4737630 |
| format | Article |
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The instrument is specifically designed for time-resolved applications of x-ray emission spectroscopy (XES) and x-ray Raman scattering (XRS) at X-ray Free Electron Lasers (XFEL) and synchrotron radiation facilities. It also simplifies resonant inelastic x-ray scattering (RIXS) studies of the whole 2d RIXS plane. The spectrometer is based on the Von Hamos geometry. This dispersive setup enables an XES or XRS spectrum to be measured in a single-shot mode, overcoming the scanning needs of the Rowland circle spectrometers. In conjunction with the XFEL temporal profile and high-flux, it is a powerful tool for studying the dynamics of time-dependent systems. 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The instrument is specifically designed for time-resolved applications of x-ray emission spectroscopy (XES) and x-ray Raman scattering (XRS) at X-ray Free Electron Lasers (XFEL) and synchrotron radiation facilities. It also simplifies resonant inelastic x-ray scattering (RIXS) studies of the whole 2d RIXS plane. The spectrometer is based on the Von Hamos geometry. This dispersive setup enables an XES or XRS spectrum to be measured in a single-shot mode, overcoming the scanning needs of the Rowland circle spectrometers. In conjunction with the XFEL temporal profile and high-flux, it is a powerful tool for studying the dynamics of time-dependent systems. Photo-induced processes and fast catalytic reaction kinetics, ranging from femtoseconds to milliseconds, will be resolvable in a wide array of systems circumventing radiation damage.</abstract><cop>United States</cop><doi>10.1063/1.4737630</doi></addata></record> |
| fulltext | fulltext |
| identifier | ISSN: 0034-6748 |
| ispartof | Review of scientific instruments, 2012-07, Vol.83 (7) |
| issn | 0034-6748 1089-7623 |
| language | eng |
| recordid | cdi_osti_scitechconnect_22093654 |
| source | AIP Journals Complete; AIP Digital Archive; Alma/SFX Local Collection |
| subjects | CRYSTALS EMISSION SPECTRA EMISSION SPECTROSCOPY ENERGY RESOLUTION FREE ELECTRON LASERS HARD X RADIATION INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY RAMAN EFFECT RAMAN SPECTROSCOPY SOLIDS SYNCHROTRON RADIATION TIME DEPENDENCE TIME RESOLUTION WAVELENGTHS X-RAY DIFFRACTION X-RAY LASERS X-RAY SPECTRA X-RAY SPECTROMETERS |
| title | A multi-crystal wavelength dispersive x-ray spectrometer |
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