Atomistic simulation of damage production by atomic and molecular ion irradiation in GaN

We have studied defect production during single atomic and molecular ion irradiation having an energy of 50 eV/amu in GaN by molecular dynamics simulations. Enhanced defect recombination is found in GaN, in accordance with experimental data. Instantaneous damage shows non-linearity with different mo...

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Veröffentlicht in:Journal of applied physics 2012-08, Vol.112 (4)
Hauptverfasser: Ullah, M. W., Kuronen, A., Nordlund, K., Djurabekova, F., Karaseov, P. A., Titov, A. I.
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Sprache:eng
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