Characterization of the local crystallinity via reflectance of very slow electrons
The reflectance of very slow electrons from solids and its electron energy dependence are shown as characteristic for the crystal system and its spatial orientation so they can serve, e.g., to fingerprinting the orientation of grains in polycrystals. Measurements on single crystals and polycrystals...
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| Veröffentlicht in: | Applied physics letters 2012-06, Vol.100 (26), p.261602 |
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| container_issue | 26 |
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| container_title | Applied physics letters |
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| creator | Pokorná, Z. Mikmeková, Š. Müllerová, I. Frank, L. |
| description | The reflectance of very slow electrons from solids and its electron energy dependence are shown as characteristic for the crystal system and its spatial orientation so they can serve, e.g., to fingerprinting the orientation of grains in polycrystals. Measurements on single crystals and polycrystals are validated via electron backscatter diffraction analyses. Sensitivity of the method to fine details of crystallinity is demonstrated. |
| doi_str_mv | 10.1063/1.4729879 |
| format | Article |
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Measurements on single crystals and polycrystals are validated via electron backscatter diffraction analyses. Sensitivity of the method to fine details of crystallinity is demonstrated.</abstract><cop>United States</cop><doi>10.1063/1.4729879</doi></addata></record> |
| fulltext | fulltext |
| identifier | ISSN: 0003-6951 |
| ispartof | Applied physics letters, 2012-06, Vol.100 (26), p.261602 |
| issn | 0003-6951 1077-3118 |
| language | eng |
| recordid | cdi_osti_scitechconnect_22080406 |
| source | AIP Journals Complete; AIP Digital Archive; Alma/SFX Local Collection |
| subjects | BACKSCATTERING CHANNELING CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY CRYSTAL STRUCTURE ELECTRON DIFFRACTION ENERGY DEPENDENCE MICROSTRUCTURE MONOCRYSTALS POLYCRYSTALS REFLECTIVITY SENSITIVITY SOLIDS |
| title | Characterization of the local crystallinity via reflectance of very slow electrons |
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