Note: Direct measurement of the point-to-point resolution for microns-thick specimens in the ultrahigh-voltage electron microscope
We report on a direct measurement method and results of the point-to-point resolution for microns-thick amorphous specimens in the ultrahigh-voltage electron microscope (ultra-HVEM). We first obtain the ultra-HVEM images of nanometer gold particles with different sizes on the top surfaces of the thi...
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| Veröffentlicht in: | Review of scientific instruments 2011-06, Vol.82 (6), p.066101-066101-3 |
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| container_issue | 6 |
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| container_title | Review of scientific instruments |
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| creator | Wang, Fang Cao, Meng Zhang, Hai-Bo Nishi, Ryuji Takaoka, Akio |
| description | We report on a direct measurement method and results of the point-to-point resolution for microns-thick amorphous specimens in the ultrahigh-voltage electron microscope (ultra-HVEM). We first obtain the ultra-HVEM images of nanometer gold particles with different sizes on the top surfaces of the thick epoxy-resin specimens. Based on the Rayleigh criterion, the point-to-point resolution is then determined as the minimum distance between centers of two resolvable tangent gold particles. Some values of resolution are accordingly acquired for the specimens with different thicknesses at the accelerating voltage of 2 MV, for example, 18.5 nm and 28.4 nm for the 5 μm and 8 μm thick epoxy-resin specimens, respectively. The presented method and results provide a reliable and useful approach to quantifying and comparing the achievable spatial resolution for the thick specimens imaged in the mode of transmission electron including the scanning transmission electron microscope. |
| doi_str_mv | 10.1063/1.3597672 |
| format | Article |
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We first obtain the ultra-HVEM images of nanometer gold particles with different sizes on the top surfaces of the thick epoxy-resin specimens. Based on the Rayleigh criterion, the point-to-point resolution is then determined as the minimum distance between centers of two resolvable tangent gold particles. Some values of resolution are accordingly acquired for the specimens with different thicknesses at the accelerating voltage of 2 MV, for example, 18.5 nm and 28.4 nm for the 5 μm and 8 μm thick epoxy-resin specimens, respectively. The presented method and results provide a reliable and useful approach to quantifying and comparing the achievable spatial resolution for the thick specimens imaged in the mode of transmission electron including the scanning transmission electron microscope.</description><identifier>ISSN: 0034-6748</identifier><identifier>EISSN: 1089-7623</identifier><identifier>DOI: 10.1063/1.3597672</identifier><identifier>PMID: 21721736</identifier><identifier>CODEN: RSINAK</identifier><language>eng</language><publisher>United States: American Institute of Physics</publisher><subject>ELECTRIC POTENTIAL ; ELECTRON MICROSCOPES ; EPOXIDES ; GOLD ; INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY ; RESINS ; SPATIAL RESOLUTION ; SURFACES ; THICKNESS ; TRANSMISSION ELECTRON MICROSCOPY</subject><ispartof>Review of scientific instruments, 2011-06, Vol.82 (6), p.066101-066101-3</ispartof><rights>2011 American Institute of Physics</rights><lds50>peer_reviewed</lds50><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-c366t-4d2d54358e64167dc75f1194d69253b379245330ea258bf2f0f1c0404d1f3ba63</citedby><cites>FETCH-LOGICAL-c366t-4d2d54358e64167dc75f1194d69253b379245330ea258bf2f0f1c0404d1f3ba63</cites></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://pubs.aip.org/rsi/article-lookup/doi/10.1063/1.3597672$$EHTML$$P50$$Gscitation$$H</linktohtml><link.rule.ids>230,314,780,784,794,885,1558,4510,27923,27924,76155,76161</link.rule.ids><backlink>$$Uhttps://www.ncbi.nlm.nih.gov/pubmed/21721736$$D View this record in MEDLINE/PubMed$$Hfree_for_read</backlink><backlink>$$Uhttps://www.osti.gov/biblio/22062373$$D View this record in Osti.gov$$Hfree_for_read</backlink></links><search><creatorcontrib>Wang, Fang</creatorcontrib><creatorcontrib>Cao, Meng</creatorcontrib><creatorcontrib>Zhang, Hai-Bo</creatorcontrib><creatorcontrib>Nishi, Ryuji</creatorcontrib><creatorcontrib>Takaoka, Akio</creatorcontrib><title>Note: Direct measurement of the point-to-point resolution for microns-thick specimens in the ultrahigh-voltage electron microscope</title><title>Review of scientific instruments</title><addtitle>Rev Sci Instrum</addtitle><description>We report on a direct measurement method and results of the point-to-point resolution for microns-thick amorphous specimens in the ultrahigh-voltage electron microscope (ultra-HVEM). We first obtain the ultra-HVEM images of nanometer gold particles with different sizes on the top surfaces of the thick epoxy-resin specimens. Based on the Rayleigh criterion, the point-to-point resolution is then determined as the minimum distance between centers of two resolvable tangent gold particles. Some values of resolution are accordingly acquired for the specimens with different thicknesses at the accelerating voltage of 2 MV, for example, 18.5 nm and 28.4 nm for the 5 μm and 8 μm thick epoxy-resin specimens, respectively. The presented method and results provide a reliable and useful approach to quantifying and comparing the achievable spatial resolution for the thick specimens imaged in the mode of transmission electron including the scanning transmission electron microscope.</description><subject>ELECTRIC POTENTIAL</subject><subject>ELECTRON MICROSCOPES</subject><subject>EPOXIDES</subject><subject>GOLD</subject><subject>INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY</subject><subject>RESINS</subject><subject>SPATIAL RESOLUTION</subject><subject>SURFACES</subject><subject>THICKNESS</subject><subject>TRANSMISSION ELECTRON MICROSCOPY</subject><issn>0034-6748</issn><issn>1089-7623</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2011</creationdate><recordtype>article</recordtype><recordid>eNp1kU2P1SAYhYnROHdGF_4BQ-LCuGDkq9CauDDj-JFMdKNrwqUvU7QtFaiJW3-5dHp1JyGBxXMOL-cg9ITRS0aVeMkuRdNppfk9dGC07YhWXNxHB0qFJErL9gyd5_yN1tUw9hCdcabrFuqAfn-KBV7htyGBK3gCm9cEE8wFR4_LAHiJYS6kRHJ3wQlyHNcS4ox9THgKLsU5kzIE9x3nBVyo4ozDfCdex5LsEG4H8jOOxd4ChrG-UyW7Mru4wCP0wNsxw-PTeYG-vrv-cvWB3Hx-__HqzQ1xQqlCZM_7RoqmBSWZ0r3TjWesk73qeCOOQndcNkJQsLxpj5576pmjksqeeXG0SlygZ7tvzCWY7EIBN7g4z3UiwzmtmWlRqec7taT4Y4VczBSyg3G0M8Q1m7bG2UmuZCVf7OT2kZzAmyWFyaZfhlGz9WKYOfVS2acn1_U4Qf-P_FtEBV7vwDaX3fL9v9tWmdkbM6fGxB-bsp2-</recordid><startdate>20110601</startdate><enddate>20110601</enddate><creator>Wang, Fang</creator><creator>Cao, Meng</creator><creator>Zhang, Hai-Bo</creator><creator>Nishi, Ryuji</creator><creator>Takaoka, Akio</creator><general>American Institute of Physics</general><scope>NPM</scope><scope>AAYXX</scope><scope>CITATION</scope><scope>7X8</scope><scope>OTOTI</scope></search><sort><creationdate>20110601</creationdate><title>Note: Direct measurement of the point-to-point resolution for microns-thick specimens in the ultrahigh-voltage electron microscope</title><author>Wang, Fang ; Cao, Meng ; Zhang, Hai-Bo ; Nishi, Ryuji ; Takaoka, Akio</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c366t-4d2d54358e64167dc75f1194d69253b379245330ea258bf2f0f1c0404d1f3ba63</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2011</creationdate><topic>ELECTRIC POTENTIAL</topic><topic>ELECTRON MICROSCOPES</topic><topic>EPOXIDES</topic><topic>GOLD</topic><topic>INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY</topic><topic>RESINS</topic><topic>SPATIAL RESOLUTION</topic><topic>SURFACES</topic><topic>THICKNESS</topic><topic>TRANSMISSION ELECTRON MICROSCOPY</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Wang, Fang</creatorcontrib><creatorcontrib>Cao, Meng</creatorcontrib><creatorcontrib>Zhang, Hai-Bo</creatorcontrib><creatorcontrib>Nishi, Ryuji</creatorcontrib><creatorcontrib>Takaoka, Akio</creatorcontrib><collection>PubMed</collection><collection>CrossRef</collection><collection>MEDLINE - Academic</collection><collection>OSTI.GOV</collection><jtitle>Review of scientific instruments</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Wang, Fang</au><au>Cao, Meng</au><au>Zhang, Hai-Bo</au><au>Nishi, Ryuji</au><au>Takaoka, Akio</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Note: Direct measurement of the point-to-point resolution for microns-thick specimens in the ultrahigh-voltage electron microscope</atitle><jtitle>Review of scientific instruments</jtitle><addtitle>Rev Sci Instrum</addtitle><date>2011-06-01</date><risdate>2011</risdate><volume>82</volume><issue>6</issue><spage>066101</spage><epage>066101-3</epage><pages>066101-066101-3</pages><issn>0034-6748</issn><eissn>1089-7623</eissn><coden>RSINAK</coden><abstract>We report on a direct measurement method and results of the point-to-point resolution for microns-thick amorphous specimens in the ultrahigh-voltage electron microscope (ultra-HVEM). We first obtain the ultra-HVEM images of nanometer gold particles with different sizes on the top surfaces of the thick epoxy-resin specimens. Based on the Rayleigh criterion, the point-to-point resolution is then determined as the minimum distance between centers of two resolvable tangent gold particles. Some values of resolution are accordingly acquired for the specimens with different thicknesses at the accelerating voltage of 2 MV, for example, 18.5 nm and 28.4 nm for the 5 μm and 8 μm thick epoxy-resin specimens, respectively. The presented method and results provide a reliable and useful approach to quantifying and comparing the achievable spatial resolution for the thick specimens imaged in the mode of transmission electron including the scanning transmission electron microscope.</abstract><cop>United States</cop><pub>American Institute of Physics</pub><pmid>21721736</pmid><doi>10.1063/1.3597672</doi><tpages>1</tpages></addata></record> |
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| ispartof | Review of scientific instruments, 2011-06, Vol.82 (6), p.066101-066101-3 |
| issn | 0034-6748 1089-7623 |
| language | eng |
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| source | AIP Journals Complete; AIP Digital Archive; Alma/SFX Local Collection |
| subjects | ELECTRIC POTENTIAL ELECTRON MICROSCOPES EPOXIDES GOLD INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY RESINS SPATIAL RESOLUTION SURFACES THICKNESS TRANSMISSION ELECTRON MICROSCOPY |
| title | Note: Direct measurement of the point-to-point resolution for microns-thick specimens in the ultrahigh-voltage electron microscope |
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