Dielectric and transport properties of thin films precipitated from sols with silicon nanoparticles

Dielectric properties of thin films precipitated on solid substrates from colloidal solutions containing silicon nanoparticles (average diameter is 10 nm) are studied by optical ellipsometry and impedance-spectroscopy. In the optical region, the values of real ɛ′ and imaginary ɛ″ components of the c...

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Veröffentlicht in:	Semiconductors (Woodbury, N.Y.) N.Y.), 2011-08, Vol.45 (8), p.1038-1048
Hauptverfasser:	Kononov, N. N., Dorofeev, S. G., Ishchenko, A. A., Mironov, R. A., Plotnichenko, V. G., Dianov, E. M.
Format:	Artikel
Sprache:	eng
Schlagworte:	ACCURACY Analysis COMPUTERIZED SIMULATION Dielectric films DIELECTRIC MATERIALS Dielectrics ELECTRIC CHARGES Electric properties Electrical conductivity ELLIPSOMETRY FREQUENCY DEPENDENCE Low-Dimensional Systems Magnetic Materials Magnetism MATERIALS SCIENCE Nanoparticles NANOSTRUCTURES OXYGEN PARTICLES PERMITTIVITY Physics Physics and Astronomy POROUS MATERIALS Quantum Phenomena Semiconductor Structures SILICON SILICON OXIDES SOLIDS SOLS SOLUTIONS SPECTROSCOPY SUBSTRATES THIN FILMS VOIDS
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