Refractive optical elements and optical system for high energy x-ray microscopy

In material science, X-ray radiation with photon energies above 25 keV is used because of its penetration into high density materials. Research of the inner structure of novel materials, such as electrodes in high power batteries for engines, require X-ray microscopes operating in the hard X-ray ene...

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Hauptverfasser: Simon, M., Altapova, V., Baumbach, T., Kluge, M., Last, A., Marschall, F., Mohr, J., Nazmov, V., Vogt, H., Karlsruhe Institute of Technology, Laboratory for Applications of Synchrotron Radiation, Engesser Strasse 15, 76131 Karlsruhe, Karlsruhe Institute of Technology, Institute of Microstructure Technology, Hermann-von-Helmholtz-Platz 1, 76344 Eggenstein-Leopoldshafen
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container_volume 1437
creator Simon, M.
Altapova, V.
Baumbach, T.
Kluge, M.
Last, A.
Marschall, F.
Mohr, J.
Nazmov, V.
Vogt, H.
Karlsruhe Institute of Technology, Laboratory for Applications of Synchrotron Radiation, Engesser Strasse 15, 76131 Karlsruhe
Karlsruhe Institute of Technology, Institute of Microstructure Technology, Hermann-von-Helmholtz-Platz 1, 76344 Eggenstein-Leopoldshafen
description In material science, X-ray radiation with photon energies above 25 keV is used because of its penetration into high density materials. Research of the inner structure of novel materials, such as electrodes in high power batteries for engines, require X-ray microscopes operating in the hard X-ray energy range. A flexible X-ray microscope for hard X-rays with photon energies higher than 25 keV will be realized at the synchrotron source ANKA in Karlsruhe, Germany. The device will use refractive X-ray lenses as condenser as well as objective lenses.
doi_str_mv 10.1063/1.3703354
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source AIP Journals Complete
subjects ELECTRODES
HARD X RADIATION
INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY
KEV RANGE
LENSES
MICROANALYSIS
MICROSCOPES
MICROSCOPY
MICROSTRUCTURE
OPTICAL SYSTEMS
SYNCHROTRON RADIATION SOURCES
title Refractive optical elements and optical system for high energy x-ray microscopy
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