Electron-Impact Water-Jet Microfocus Source for Water-Window Microscopy

We demonstrate high-brightness operation of an electron-impact water-jet-anode soft x-ray source with an increased power loading of 15 times compared to our previously published results, with a corresponding increase in similar to 525-eV x-ray intensity of 6.4 times. This has been accomplished by im...

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Bibliographische Detailangaben
Hauptverfasser:	Skoglund, P, Lundstrom, U, Vogt, U, Takman, P, Hertz, H M
Format:	Tagungsbericht
Sprache:	eng
Schlagworte:	07 ISOTOPES AND RADIATION SOURCES ABSORPTION BEAM OPTICS BEAM TRANSPORT BEAMS BRIGHTNESS ELECTROMAGNETIC RADIATION ELECTRON BEAMS ENERGY RANGE EV RANGE FOCUSING IONIZING RADIATIONS LEPTON BEAMS OPERATION OPTICAL PROPERTIES OPTIMIZATION PARTICLE ACCELERATORS PARTICLE BEAMS PHOTON BEAMS PHYSICAL PROPERTIES RADIATION SOURCES RADIATIONS SOFT X RADIATION SORPTION SPECTRA X RADIATION X-RAY SOURCES X-RAY SPECTRA
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