Ion and electron beam nanofabrication of the which-way double-slit experiment in a transmission electron microscope
We have realized a which-way experiment closely resembling the original Feynman's proposal exploiting focused ion beam milling to prepare two nanoslits and electron beam induced deposition to grow, selectively over one of them, electron transparent layers of low atomic number amorphous material...
Gespeichert in:
| Veröffentlicht in: | Applied physics letters 2010-12, Vol.97 (26), p.263101-263101-3 |
|---|---|
| Hauptverfasser: | , , |
| Format: | Artikel |
| Sprache: | eng |
| Schlagworte: | |
| Online-Zugang: | Volltext |
| Tags: |
Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
|
| container_end_page | 263101-3 |
|---|---|
| container_issue | 26 |
| container_start_page | 263101 |
| container_title | Applied physics letters |
| container_volume | 97 |
| creator | Frabboni, Stefano Gazzadi, Gian Carlo Pozzi, Giulio |
| description | We have realized a which-way experiment closely resembling the original Feynman's proposal exploiting focused ion beam milling to prepare two nanoslits and electron beam induced deposition to grow, selectively over one of them, electron transparent layers of low atomic number amorphous material to realize a which-way detector for high energy electrons. By carrying out the experiment in an electron microscope equipped with an energy filter, we show that the inelastic scattering of electron transmitted through amorphous layers of different thicknesses provides the control of the dissipative interaction process responsible for the localization phenomena which cancels out the interference effects. |
| doi_str_mv | 10.1063/1.3529947 |
| format | Article |
| fullrecord | <record><control><sourceid>scitation_osti_</sourceid><recordid>TN_cdi_osti_scitechconnect_21518228</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>apl</sourcerecordid><originalsourceid>FETCH-LOGICAL-c378t-761b9d1d6f87f74fd2458f937766b4a4465f3bb1f14fa59ce9122c0e4de4d5403</originalsourceid><addsrcrecordid>eNp1kE1LAzEQhoMoWKsH_0HAk4etmXxsdi-CFD8KBS96Dtlswka2m7KJ1P57s7Z6EwLDDE9eZh6EroEsgJTsDhZM0Lrm8gTNgEhZMIDqFM0IIawoawHn6CLGj9wKytgMxVUYsB5abHtr0pibxuoNHvQQnG5Gb3TyeRgcTp3Fu86brtjpPW7DZ9PbIvY-Yfu1taPf2CFhn8NwGvUQNz7G6edf7sabMUQTtvYSnTndR3t1rHP0_vT4tnwp1q_Pq-XDujBMVqmQJTR1C23pKukkdy3lonI1k7IsG645L4VjTQMOuNOiNrYGSg2xvM1PcMLm6OaQG2LyKhqfrOlMGIa8kaIgoKK0ytTtgZrWi6N1apuP0eNeAVGTUwXq6DSz9wd2Cvsx8z-cxaosVv0KUFks-wa99H_m</addsrcrecordid><sourcetype>Open Access Repository</sourcetype><iscdi>true</iscdi><recordtype>article</recordtype></control><display><type>article</type><title>Ion and electron beam nanofabrication of the which-way double-slit experiment in a transmission electron microscope</title><source>AIP Journals Complete</source><source>AIP Digital Archive</source><source>Alma/SFX Local Collection</source><creator>Frabboni, Stefano ; Gazzadi, Gian Carlo ; Pozzi, Giulio</creator><creatorcontrib>Frabboni, Stefano ; Gazzadi, Gian Carlo ; Pozzi, Giulio</creatorcontrib><description>We have realized a which-way experiment closely resembling the original Feynman's proposal exploiting focused ion beam milling to prepare two nanoslits and electron beam induced deposition to grow, selectively over one of them, electron transparent layers of low atomic number amorphous material to realize a which-way detector for high energy electrons. By carrying out the experiment in an electron microscope equipped with an energy filter, we show that the inelastic scattering of electron transmitted through amorphous layers of different thicknesses provides the control of the dissipative interaction process responsible for the localization phenomena which cancels out the interference effects.</description><identifier>ISSN: 0003-6951</identifier><identifier>EISSN: 1077-3118</identifier><identifier>DOI: 10.1063/1.3529947</identifier><identifier>CODEN: APPLAB</identifier><language>eng</language><publisher>United States: American Institute of Physics</publisher><subject>AMORPHOUS STATE ; ATOMIC NUMBER ; BEAMS ; CHARGED PARTICLES ; CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY ; DEPOSITION ; DIMENSIONS ; ELECTRON BEAMS ; ELECTRON MICROSCOPES ; ELECTRON MICROSCOPY ; ELECTRON SPECTROSCOPY ; ELECTRONS ; ELEMENTARY PARTICLES ; ENERGY-LOSS SPECTROSCOPY ; FERMIONS ; INELASTIC SCATTERING ; INTERACTIONS ; INTERFERENCE ; ION BEAMS ; IONS ; LAYERS ; LEPTON BEAMS ; LEPTONS ; MICROSCOPES ; MICROSCOPY ; NANOSCIENCE AND NANOTECHNOLOGY ; NANOSTRUCTURES ; PARTICLE BEAMS ; SCATTERING ; SPECTROSCOPY ; THICKNESS ; TRANSMISSION ELECTRON MICROSCOPY</subject><ispartof>Applied physics letters, 2010-12, Vol.97 (26), p.263101-263101-3</ispartof><rights>2010 American Institute of Physics</rights><lds50>peer_reviewed</lds50><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-c378t-761b9d1d6f87f74fd2458f937766b4a4465f3bb1f14fa59ce9122c0e4de4d5403</citedby><cites>FETCH-LOGICAL-c378t-761b9d1d6f87f74fd2458f937766b4a4465f3bb1f14fa59ce9122c0e4de4d5403</cites></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://pubs.aip.org/apl/article-lookup/doi/10.1063/1.3529947$$EHTML$$P50$$Gscitation$$H</linktohtml><link.rule.ids>230,314,780,784,794,885,1559,4512,27924,27925,76384,76390</link.rule.ids><backlink>$$Uhttps://www.osti.gov/biblio/21518228$$D View this record in Osti.gov$$Hfree_for_read</backlink></links><search><creatorcontrib>Frabboni, Stefano</creatorcontrib><creatorcontrib>Gazzadi, Gian Carlo</creatorcontrib><creatorcontrib>Pozzi, Giulio</creatorcontrib><title>Ion and electron beam nanofabrication of the which-way double-slit experiment in a transmission electron microscope</title><title>Applied physics letters</title><description>We have realized a which-way experiment closely resembling the original Feynman's proposal exploiting focused ion beam milling to prepare two nanoslits and electron beam induced deposition to grow, selectively over one of them, electron transparent layers of low atomic number amorphous material to realize a which-way detector for high energy electrons. By carrying out the experiment in an electron microscope equipped with an energy filter, we show that the inelastic scattering of electron transmitted through amorphous layers of different thicknesses provides the control of the dissipative interaction process responsible for the localization phenomena which cancels out the interference effects.</description><subject>AMORPHOUS STATE</subject><subject>ATOMIC NUMBER</subject><subject>BEAMS</subject><subject>CHARGED PARTICLES</subject><subject>CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY</subject><subject>DEPOSITION</subject><subject>DIMENSIONS</subject><subject>ELECTRON BEAMS</subject><subject>ELECTRON MICROSCOPES</subject><subject>ELECTRON MICROSCOPY</subject><subject>ELECTRON SPECTROSCOPY</subject><subject>ELECTRONS</subject><subject>ELEMENTARY PARTICLES</subject><subject>ENERGY-LOSS SPECTROSCOPY</subject><subject>FERMIONS</subject><subject>INELASTIC SCATTERING</subject><subject>INTERACTIONS</subject><subject>INTERFERENCE</subject><subject>ION BEAMS</subject><subject>IONS</subject><subject>LAYERS</subject><subject>LEPTON BEAMS</subject><subject>LEPTONS</subject><subject>MICROSCOPES</subject><subject>MICROSCOPY</subject><subject>NANOSCIENCE AND NANOTECHNOLOGY</subject><subject>NANOSTRUCTURES</subject><subject>PARTICLE BEAMS</subject><subject>SCATTERING</subject><subject>SPECTROSCOPY</subject><subject>THICKNESS</subject><subject>TRANSMISSION ELECTRON MICROSCOPY</subject><issn>0003-6951</issn><issn>1077-3118</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2010</creationdate><recordtype>article</recordtype><recordid>eNp1kE1LAzEQhoMoWKsH_0HAk4etmXxsdi-CFD8KBS96Dtlswka2m7KJ1P57s7Z6EwLDDE9eZh6EroEsgJTsDhZM0Lrm8gTNgEhZMIDqFM0IIawoawHn6CLGj9wKytgMxVUYsB5abHtr0pibxuoNHvQQnG5Gb3TyeRgcTp3Fu86brtjpPW7DZ9PbIvY-Yfu1taPf2CFhn8NwGvUQNz7G6edf7sabMUQTtvYSnTndR3t1rHP0_vT4tnwp1q_Pq-XDujBMVqmQJTR1C23pKukkdy3lonI1k7IsG645L4VjTQMOuNOiNrYGSg2xvM1PcMLm6OaQG2LyKhqfrOlMGIa8kaIgoKK0ytTtgZrWi6N1apuP0eNeAVGTUwXq6DSz9wd2Cvsx8z-cxaosVv0KUFks-wa99H_m</recordid><startdate>20101227</startdate><enddate>20101227</enddate><creator>Frabboni, Stefano</creator><creator>Gazzadi, Gian Carlo</creator><creator>Pozzi, Giulio</creator><general>American Institute of Physics</general><scope>AAYXX</scope><scope>CITATION</scope><scope>OTOTI</scope></search><sort><creationdate>20101227</creationdate><title>Ion and electron beam nanofabrication of the which-way double-slit experiment in a transmission electron microscope</title><author>Frabboni, Stefano ; Gazzadi, Gian Carlo ; Pozzi, Giulio</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c378t-761b9d1d6f87f74fd2458f937766b4a4465f3bb1f14fa59ce9122c0e4de4d5403</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2010</creationdate><topic>AMORPHOUS STATE</topic><topic>ATOMIC NUMBER</topic><topic>BEAMS</topic><topic>CHARGED PARTICLES</topic><topic>CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY</topic><topic>DEPOSITION</topic><topic>DIMENSIONS</topic><topic>ELECTRON BEAMS</topic><topic>ELECTRON MICROSCOPES</topic><topic>ELECTRON MICROSCOPY</topic><topic>ELECTRON SPECTROSCOPY</topic><topic>ELECTRONS</topic><topic>ELEMENTARY PARTICLES</topic><topic>ENERGY-LOSS SPECTROSCOPY</topic><topic>FERMIONS</topic><topic>INELASTIC SCATTERING</topic><topic>INTERACTIONS</topic><topic>INTERFERENCE</topic><topic>ION BEAMS</topic><topic>IONS</topic><topic>LAYERS</topic><topic>LEPTON BEAMS</topic><topic>LEPTONS</topic><topic>MICROSCOPES</topic><topic>MICROSCOPY</topic><topic>NANOSCIENCE AND NANOTECHNOLOGY</topic><topic>NANOSTRUCTURES</topic><topic>PARTICLE BEAMS</topic><topic>SCATTERING</topic><topic>SPECTROSCOPY</topic><topic>THICKNESS</topic><topic>TRANSMISSION ELECTRON MICROSCOPY</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Frabboni, Stefano</creatorcontrib><creatorcontrib>Gazzadi, Gian Carlo</creatorcontrib><creatorcontrib>Pozzi, Giulio</creatorcontrib><collection>CrossRef</collection><collection>OSTI.GOV</collection><jtitle>Applied physics letters</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Frabboni, Stefano</au><au>Gazzadi, Gian Carlo</au><au>Pozzi, Giulio</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Ion and electron beam nanofabrication of the which-way double-slit experiment in a transmission electron microscope</atitle><jtitle>Applied physics letters</jtitle><date>2010-12-27</date><risdate>2010</risdate><volume>97</volume><issue>26</issue><spage>263101</spage><epage>263101-3</epage><pages>263101-263101-3</pages><issn>0003-6951</issn><eissn>1077-3118</eissn><coden>APPLAB</coden><abstract>We have realized a which-way experiment closely resembling the original Feynman's proposal exploiting focused ion beam milling to prepare two nanoslits and electron beam induced deposition to grow, selectively over one of them, electron transparent layers of low atomic number amorphous material to realize a which-way detector for high energy electrons. By carrying out the experiment in an electron microscope equipped with an energy filter, we show that the inelastic scattering of electron transmitted through amorphous layers of different thicknesses provides the control of the dissipative interaction process responsible for the localization phenomena which cancels out the interference effects.</abstract><cop>United States</cop><pub>American Institute of Physics</pub><doi>10.1063/1.3529947</doi></addata></record> |
| fulltext | fulltext |
| identifier | ISSN: 0003-6951 |
| ispartof | Applied physics letters, 2010-12, Vol.97 (26), p.263101-263101-3 |
| issn | 0003-6951 1077-3118 |
| language | eng |
| recordid | cdi_osti_scitechconnect_21518228 |
| source | AIP Journals Complete; AIP Digital Archive; Alma/SFX Local Collection |
| subjects | AMORPHOUS STATE ATOMIC NUMBER BEAMS CHARGED PARTICLES CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY DEPOSITION DIMENSIONS ELECTRON BEAMS ELECTRON MICROSCOPES ELECTRON MICROSCOPY ELECTRON SPECTROSCOPY ELECTRONS ELEMENTARY PARTICLES ENERGY-LOSS SPECTROSCOPY FERMIONS INELASTIC SCATTERING INTERACTIONS INTERFERENCE ION BEAMS IONS LAYERS LEPTON BEAMS LEPTONS MICROSCOPES MICROSCOPY NANOSCIENCE AND NANOTECHNOLOGY NANOSTRUCTURES PARTICLE BEAMS SCATTERING SPECTROSCOPY THICKNESS TRANSMISSION ELECTRON MICROSCOPY |
| title | Ion and electron beam nanofabrication of the which-way double-slit experiment in a transmission electron microscope |
| url | https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2024-12-19T10%3A58%3A17IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-scitation_osti_&rft_val_fmt=info:ofi/fmt:kev:mtx:journal&rft.genre=article&rft.atitle=Ion%20and%20electron%20beam%20nanofabrication%20of%20the%20which-way%20double-slit%20experiment%20in%20a%20transmission%20electron%20microscope&rft.jtitle=Applied%20physics%20letters&rft.au=Frabboni,%20Stefano&rft.date=2010-12-27&rft.volume=97&rft.issue=26&rft.spage=263101&rft.epage=263101-3&rft.pages=263101-263101-3&rft.issn=0003-6951&rft.eissn=1077-3118&rft.coden=APPLAB&rft_id=info:doi/10.1063/1.3529947&rft_dat=%3Cscitation_osti_%3Eapl%3C/scitation_osti_%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_id=info:pmid/&rfr_iscdi=true |