IBIXFIT: A Tool For The Analysis Of Microcalorimeter PIXE Spectra
PIXE analysis software has been for long mainly tuned to the needs of Si(Li) detector based spectra analysis and quantification methods based on K alpha or L alpha X-ray lines. Still, recent evidences related to the study of relative line intensities and new developments in detection equipment, name...
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| creator | Taborda, A Alves, L C Barradas, N P Chaves, P C Reis, MA |
| description | PIXE analysis software has been for long mainly tuned to the needs of Si(Li) detector based spectra analysis and quantification methods based on K alpha or L alpha X-ray lines. Still, recent evidences related to the study of relative line intensities and new developments in detection equipment, namely the emergence of commercial microcalorimeter based X-ray detectors, have brought up the possibility that in the near future PIXE will become more than just major lines quantification. A main issue that became evident as a consequence of this was the need to be able to fit PIXE spectra without prior knowledge of relative line intensities. Considering new developments it may be necessary to generalize PIXE to a wider notion of ion beam induced X-ray (IBIX) emission, to include the quantification of processes such as Radiative Auger Emission. In order to answer to this need, the IBIXFIT code was created based much on the Bayesian Inference and Simulated Annealing routines implemented in the Datafurnace code [1]. In this presentation, the IBIXFIT is used to fit a microcalorimeter spectrum of a BaxSr(1-x)TiO3 thin film sample and the specific possibility of selecting between fixed and free line ratios combined with other specificities of the IBIXFIT algorithm are shown to be essential to overcome the problems faced. |
| doi_str_mv | 10.1063/1.3586103 |
| format | Conference Proceeding |
| fullrecord | <record><control><sourceid>proquest_osti_</sourceid><recordid>TN_cdi_osti_scitechconnect_21513365</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>1448714115</sourcerecordid><originalsourceid>FETCH-LOGICAL-o216t-b475e3a65e25e050dd0ae95a8d7252ab7ed5e3851cff381b9d0f6aa891f3ddf23</originalsourceid><addsrcrecordid>eNotj0tLw0AcxBcfYKk9-A0WvHhJ3f9u9uUtllYDlQpG6C1s90EjabZm00O_vYE6lznMj2EGoQcgcyCCPcOccSWAsCs0Ac4hkwLENZppqYhkPCdKA7tBE0J0ntGcbe_QLKUfMkoLpRWdoKJ8LbersnrBBa5ibPEq9rjae1x0pj2nJuFNwB-N7aM1beybgx98jz_L7RJ_Hb0denOPboNpk5_9-xR9r5bV4j1bb97KRbHOIgUxZLtccs-M4J5yTzhxjhivuVFOUk7NTno35oqDDYEp2GlHgjBmfBCYc4GyKXq89MY0NHWyzeDt3sauG1fUFDgwJvhIPV2oYx9_Tz4N9aFJ1ret6Xw8pRryXEnIATj7A9MfWdo</addsrcrecordid><sourcetype>Open Access Repository</sourcetype><iscdi>true</iscdi><recordtype>conference_proceeding</recordtype><pqid>1448714115</pqid></control><display><type>conference_proceeding</type><title>IBIXFIT: A Tool For The Analysis Of Microcalorimeter PIXE Spectra</title><source>AIP Journals Complete</source><creator>Taborda, A ; Alves, L C ; Barradas, N P ; Chaves, P C ; Reis, MA</creator><creatorcontrib>Taborda, A ; Alves, L C ; Barradas, N P ; Chaves, P C ; Reis, MA</creatorcontrib><description>PIXE analysis software has been for long mainly tuned to the needs of Si(Li) detector based spectra analysis and quantification methods based on K alpha or L alpha X-ray lines. Still, recent evidences related to the study of relative line intensities and new developments in detection equipment, namely the emergence of commercial microcalorimeter based X-ray detectors, have brought up the possibility that in the near future PIXE will become more than just major lines quantification. A main issue that became evident as a consequence of this was the need to be able to fit PIXE spectra without prior knowledge of relative line intensities. Considering new developments it may be necessary to generalize PIXE to a wider notion of ion beam induced X-ray (IBIX) emission, to include the quantification of processes such as Radiative Auger Emission. In order to answer to this need, the IBIXFIT code was created based much on the Bayesian Inference and Simulated Annealing routines implemented in the Datafurnace code [1]. In this presentation, the IBIXFIT is used to fit a microcalorimeter spectrum of a BaxSr(1-x)TiO3 thin film sample and the specific possibility of selecting between fixed and free line ratios combined with other specificities of the IBIXFIT algorithm are shown to be essential to overcome the problems faced.</description><identifier>ISSN: 0094-243X</identifier><identifier>ISBN: 9780735408913</identifier><identifier>ISBN: 0735408912</identifier><identifier>EISSN: 1551-7616</identifier><identifier>DOI: 10.1063/1.3586103</identifier><language>eng</language><publisher>United States</publisher><subject>ALGORITHMS ; ALKALINE EARTH METAL COMPOUNDS ; ANNEALING ; ATOMIC AND MOLECULAR PHYSICS ; Augers ; BARIUM COMPOUNDS ; BEAMS ; CHALCOGENIDES ; CHEMICAL ANALYSIS ; DETECTION ; Detectors ; ELECTROMAGNETIC RADIATION ; EMISSION ; HEAT TREATMENTS ; Inference ; ION BEAMS ; IONIZATION ; IONIZING RADIATIONS ; LI-DRIFTED DETECTORS ; LI-DRIFTED SI DETECTORS ; MATHEMATICAL LOGIC ; MEASURING INSTRUMENTS ; Microcalorimeters ; NONDESTRUCTIVE ANALYSIS ; OXIDES ; OXYGEN COMPOUNDS ; PIXE ANALYSIS ; RADIATION DETECTION ; RADIATION DETECTORS ; RADIATIONS ; SEMICONDUCTOR DETECTORS ; SENSORS ; SI SEMICONDUCTOR DETECTORS ; SIMULATION ; SPECIFICITY ; SPECTRA ; Spectral lines ; STRONTIUM COMPOUNDS ; THIN FILMS ; TITANATES ; TITANIUM COMPOUNDS ; TITANIUM OXIDES ; TRANSITION ELEMENT COMPOUNDS ; X RADIATION ; X-RAY DETECTION ; X-RAY EMISSION ANALYSIS ; X-rays</subject><ispartof>AIP conference proceedings, 2011, Vol.1336 (1)</ispartof><lds50>peer_reviewed</lds50><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><link.rule.ids>230,314,780,784,885,27924,27925</link.rule.ids><backlink>$$Uhttps://www.osti.gov/biblio/21513365$$D View this record in Osti.gov$$Hfree_for_read</backlink></links><search><creatorcontrib>Taborda, A</creatorcontrib><creatorcontrib>Alves, L C</creatorcontrib><creatorcontrib>Barradas, N P</creatorcontrib><creatorcontrib>Chaves, P C</creatorcontrib><creatorcontrib>Reis, MA</creatorcontrib><title>IBIXFIT: A Tool For The Analysis Of Microcalorimeter PIXE Spectra</title><title>AIP conference proceedings</title><description>PIXE analysis software has been for long mainly tuned to the needs of Si(Li) detector based spectra analysis and quantification methods based on K alpha or L alpha X-ray lines. Still, recent evidences related to the study of relative line intensities and new developments in detection equipment, namely the emergence of commercial microcalorimeter based X-ray detectors, have brought up the possibility that in the near future PIXE will become more than just major lines quantification. A main issue that became evident as a consequence of this was the need to be able to fit PIXE spectra without prior knowledge of relative line intensities. Considering new developments it may be necessary to generalize PIXE to a wider notion of ion beam induced X-ray (IBIX) emission, to include the quantification of processes such as Radiative Auger Emission. In order to answer to this need, the IBIXFIT code was created based much on the Bayesian Inference and Simulated Annealing routines implemented in the Datafurnace code [1]. In this presentation, the IBIXFIT is used to fit a microcalorimeter spectrum of a BaxSr(1-x)TiO3 thin film sample and the specific possibility of selecting between fixed and free line ratios combined with other specificities of the IBIXFIT algorithm are shown to be essential to overcome the problems faced.</description><subject>ALGORITHMS</subject><subject>ALKALINE EARTH METAL COMPOUNDS</subject><subject>ANNEALING</subject><subject>ATOMIC AND MOLECULAR PHYSICS</subject><subject>Augers</subject><subject>BARIUM COMPOUNDS</subject><subject>BEAMS</subject><subject>CHALCOGENIDES</subject><subject>CHEMICAL ANALYSIS</subject><subject>DETECTION</subject><subject>Detectors</subject><subject>ELECTROMAGNETIC RADIATION</subject><subject>EMISSION</subject><subject>HEAT TREATMENTS</subject><subject>Inference</subject><subject>ION BEAMS</subject><subject>IONIZATION</subject><subject>IONIZING RADIATIONS</subject><subject>LI-DRIFTED DETECTORS</subject><subject>LI-DRIFTED SI DETECTORS</subject><subject>MATHEMATICAL LOGIC</subject><subject>MEASURING INSTRUMENTS</subject><subject>Microcalorimeters</subject><subject>NONDESTRUCTIVE ANALYSIS</subject><subject>OXIDES</subject><subject>OXYGEN COMPOUNDS</subject><subject>PIXE ANALYSIS</subject><subject>RADIATION DETECTION</subject><subject>RADIATION DETECTORS</subject><subject>RADIATIONS</subject><subject>SEMICONDUCTOR DETECTORS</subject><subject>SENSORS</subject><subject>SI SEMICONDUCTOR DETECTORS</subject><subject>SIMULATION</subject><subject>SPECIFICITY</subject><subject>SPECTRA</subject><subject>Spectral lines</subject><subject>STRONTIUM COMPOUNDS</subject><subject>THIN FILMS</subject><subject>TITANATES</subject><subject>TITANIUM COMPOUNDS</subject><subject>TITANIUM OXIDES</subject><subject>TRANSITION ELEMENT COMPOUNDS</subject><subject>X RADIATION</subject><subject>X-RAY DETECTION</subject><subject>X-RAY EMISSION ANALYSIS</subject><subject>X-rays</subject><issn>0094-243X</issn><issn>1551-7616</issn><isbn>9780735408913</isbn><isbn>0735408912</isbn><fulltext>true</fulltext><rsrctype>conference_proceeding</rsrctype><creationdate>2011</creationdate><recordtype>conference_proceeding</recordtype><recordid>eNotj0tLw0AcxBcfYKk9-A0WvHhJ3f9u9uUtllYDlQpG6C1s90EjabZm00O_vYE6lznMj2EGoQcgcyCCPcOccSWAsCs0Ac4hkwLENZppqYhkPCdKA7tBE0J0ntGcbe_QLKUfMkoLpRWdoKJ8LbersnrBBa5ibPEq9rjae1x0pj2nJuFNwB-N7aM1beybgx98jz_L7RJ_Hb0denOPboNpk5_9-xR9r5bV4j1bb97KRbHOIgUxZLtccs-M4J5yTzhxjhivuVFOUk7NTno35oqDDYEp2GlHgjBmfBCYc4GyKXq89MY0NHWyzeDt3sauG1fUFDgwJvhIPV2oYx9_Tz4N9aFJ1ret6Xw8pRryXEnIATj7A9MfWdo</recordid><startdate>20110101</startdate><enddate>20110101</enddate><creator>Taborda, A</creator><creator>Alves, L C</creator><creator>Barradas, N P</creator><creator>Chaves, P C</creator><creator>Reis, MA</creator><scope>7U5</scope><scope>8FD</scope><scope>H8D</scope><scope>L7M</scope><scope>OTOTI</scope></search><sort><creationdate>20110101</creationdate><title>IBIXFIT: A Tool For The Analysis Of Microcalorimeter PIXE Spectra</title><author>Taborda, A ; Alves, L C ; Barradas, N P ; Chaves, P C ; Reis, MA</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-o216t-b475e3a65e25e050dd0ae95a8d7252ab7ed5e3851cff381b9d0f6aa891f3ddf23</frbrgroupid><rsrctype>conference_proceedings</rsrctype><prefilter>conference_proceedings</prefilter><language>eng</language><creationdate>2011</creationdate><topic>ALGORITHMS</topic><topic>ALKALINE EARTH METAL COMPOUNDS</topic><topic>ANNEALING</topic><topic>ATOMIC AND MOLECULAR PHYSICS</topic><topic>Augers</topic><topic>BARIUM COMPOUNDS</topic><topic>BEAMS</topic><topic>CHALCOGENIDES</topic><topic>CHEMICAL ANALYSIS</topic><topic>DETECTION</topic><topic>Detectors</topic><topic>ELECTROMAGNETIC RADIATION</topic><topic>EMISSION</topic><topic>HEAT TREATMENTS</topic><topic>Inference</topic><topic>ION BEAMS</topic><topic>IONIZATION</topic><topic>IONIZING RADIATIONS</topic><topic>LI-DRIFTED DETECTORS</topic><topic>LI-DRIFTED SI DETECTORS</topic><topic>MATHEMATICAL LOGIC</topic><topic>MEASURING INSTRUMENTS</topic><topic>Microcalorimeters</topic><topic>NONDESTRUCTIVE ANALYSIS</topic><topic>OXIDES</topic><topic>OXYGEN COMPOUNDS</topic><topic>PIXE ANALYSIS</topic><topic>RADIATION DETECTION</topic><topic>RADIATION DETECTORS</topic><topic>RADIATIONS</topic><topic>SEMICONDUCTOR DETECTORS</topic><topic>SENSORS</topic><topic>SI SEMICONDUCTOR DETECTORS</topic><topic>SIMULATION</topic><topic>SPECIFICITY</topic><topic>SPECTRA</topic><topic>Spectral lines</topic><topic>STRONTIUM COMPOUNDS</topic><topic>THIN FILMS</topic><topic>TITANATES</topic><topic>TITANIUM COMPOUNDS</topic><topic>TITANIUM OXIDES</topic><topic>TRANSITION ELEMENT COMPOUNDS</topic><topic>X RADIATION</topic><topic>X-RAY DETECTION</topic><topic>X-RAY EMISSION ANALYSIS</topic><topic>X-rays</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Taborda, A</creatorcontrib><creatorcontrib>Alves, L C</creatorcontrib><creatorcontrib>Barradas, N P</creatorcontrib><creatorcontrib>Chaves, P C</creatorcontrib><creatorcontrib>Reis, MA</creatorcontrib><collection>Solid State and Superconductivity Abstracts</collection><collection>Technology Research Database</collection><collection>Aerospace Database</collection><collection>Advanced Technologies Database with Aerospace</collection><collection>OSTI.GOV</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Taborda, A</au><au>Alves, L C</au><au>Barradas, N P</au><au>Chaves, P C</au><au>Reis, MA</au><format>book</format><genre>proceeding</genre><ristype>CONF</ristype><atitle>IBIXFIT: A Tool For The Analysis Of Microcalorimeter PIXE Spectra</atitle><btitle>AIP conference proceedings</btitle><date>2011-01-01</date><risdate>2011</risdate><volume>1336</volume><issue>1</issue><issn>0094-243X</issn><eissn>1551-7616</eissn><isbn>9780735408913</isbn><isbn>0735408912</isbn><abstract>PIXE analysis software has been for long mainly tuned to the needs of Si(Li) detector based spectra analysis and quantification methods based on K alpha or L alpha X-ray lines. Still, recent evidences related to the study of relative line intensities and new developments in detection equipment, namely the emergence of commercial microcalorimeter based X-ray detectors, have brought up the possibility that in the near future PIXE will become more than just major lines quantification. A main issue that became evident as a consequence of this was the need to be able to fit PIXE spectra without prior knowledge of relative line intensities. Considering new developments it may be necessary to generalize PIXE to a wider notion of ion beam induced X-ray (IBIX) emission, to include the quantification of processes such as Radiative Auger Emission. In order to answer to this need, the IBIXFIT code was created based much on the Bayesian Inference and Simulated Annealing routines implemented in the Datafurnace code [1]. In this presentation, the IBIXFIT is used to fit a microcalorimeter spectrum of a BaxSr(1-x)TiO3 thin film sample and the specific possibility of selecting between fixed and free line ratios combined with other specificities of the IBIXFIT algorithm are shown to be essential to overcome the problems faced.</abstract><cop>United States</cop><doi>10.1063/1.3586103</doi></addata></record> |
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| subjects | ALGORITHMS ALKALINE EARTH METAL COMPOUNDS ANNEALING ATOMIC AND MOLECULAR PHYSICS Augers BARIUM COMPOUNDS BEAMS CHALCOGENIDES CHEMICAL ANALYSIS DETECTION Detectors ELECTROMAGNETIC RADIATION EMISSION HEAT TREATMENTS Inference ION BEAMS IONIZATION IONIZING RADIATIONS LI-DRIFTED DETECTORS LI-DRIFTED SI DETECTORS MATHEMATICAL LOGIC MEASURING INSTRUMENTS Microcalorimeters NONDESTRUCTIVE ANALYSIS OXIDES OXYGEN COMPOUNDS PIXE ANALYSIS RADIATION DETECTION RADIATION DETECTORS RADIATIONS SEMICONDUCTOR DETECTORS SENSORS SI SEMICONDUCTOR DETECTORS SIMULATION SPECIFICITY SPECTRA Spectral lines STRONTIUM COMPOUNDS THIN FILMS TITANATES TITANIUM COMPOUNDS TITANIUM OXIDES TRANSITION ELEMENT COMPOUNDS X RADIATION X-RAY DETECTION X-RAY EMISSION ANALYSIS X-rays |
| title | IBIXFIT: A Tool For The Analysis Of Microcalorimeter PIXE Spectra |
| url | https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2024-12-23T19%3A35%3A47IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-proquest_osti_&rft_val_fmt=info:ofi/fmt:kev:mtx:book&rft.genre=proceeding&rft.atitle=IBIXFIT:%20A%20Tool%20For%20The%20Analysis%20Of%20Microcalorimeter%20PIXE%20Spectra&rft.btitle=AIP%20conference%20proceedings&rft.au=Taborda,%20A&rft.date=2011-01-01&rft.volume=1336&rft.issue=1&rft.issn=0094-243X&rft.eissn=1551-7616&rft.isbn=9780735408913&rft.isbn_list=0735408912&rft_id=info:doi/10.1063/1.3586103&rft_dat=%3Cproquest_osti_%3E1448714115%3C/proquest_osti_%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_pqid=1448714115&rft_id=info:pmid/&rfr_iscdi=true |