On the Sn loss from thin films of the material system Cu-Zn-Sn-S in high vacuum

In this paper the Sn loss from thin films of the material system Cu-Zn-Sn-S and the subsystems Cu-Sn-S and Sn-S in high vacuum is investigated. A combination of in situ x-ray diffractometry and x-ray fluorescence (XRF) at a synchrotron light source allowed identifying phases, which tend to decompose...

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Veröffentlicht in:	Journal of applied physics 2010-01, Vol.107 (1), p.013516-013516-6
Hauptverfasser:	Weber, A., Mainz, R., Schock, H. W.
Format:	Artikel
Sprache:	eng
Schlagworte:	ANNEALING CHALCOGENIDES CHEMICAL ANALYSIS COHERENT SCATTERING COPPER COMPOUNDS DEPOSITION DIFFRACTION ELEMENTS EVAPORATION HEAT TREATMENTS INORGANIC, ORGANIC, PHYSICAL AND ANALYTICAL CHEMISTRY LOSSES MATERIALS MATERIALS SCIENCE METALS NONDESTRUCTIVE ANALYSIS PHASE STABILITY PHASE STUDIES PHASE TRANSFORMATIONS SCATTERING SEMICONDUCTOR MATERIALS STABILITY SULFIDES SULFUR COMPOUNDS SURFACE COATING THIN FILMS TIN TIN COMPOUNDS TIN SULFIDES TRANSITION ELEMENT COMPOUNDS VACUUM COATING X-RAY DIFFRACTION X-RAY EMISSION ANALYSIS X-RAY FLUORESCENCE ANALYSIS ZINC COMPOUNDS
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