Control of plasma uniformity in a capacitive discharge using two very high frequency power sources
Very high frequency (VHF) capacitively coupled plasma (CCP) discharges are being employed for dielectric etching due to VHF's various benefits including low plasma potential, high electron density, and controllable dissociation. If the plasma is generated using multiple VHF sources, one can exp...
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Veröffentlicht in: | Journal of applied physics 2009-08, Vol.106 (3), p.033301-033301-7 |
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Hauptverfasser: | , , , |
Format: | Artikel |
Sprache: | eng |
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