The correlation between electron density and anchoring strength in the inorganic vertical alignment layer

The relationship between the liquid crystal (LC) alignment and the density of the silicon oxide alignment layer was studied by theoretical and experimental approaches. The thin films were deposited by various methods and conditions, and then their densities were analyzed by x-ray reflectivity measur...

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Veröffentlicht in:	Applied physics letters 2009-08, Vol.95 (8)
Hauptverfasser:	Hwang, Byoung Har, Yoo, Young Bum, Oh, Jin Young, Chae, Soo Sang, Baik, Hong Koo, Lee, Se Jong, Song, Kie Moon
Format:	Artikel
Sprache:	eng
Schlagworte:	DEPOSITION ELECTRON DENSITY LAYERS LIQUID CRYSTALS MATERIALS SCIENCE REFLECTIVITY SILICON OXIDES SPUTTERING THIN FILMS
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