Characterizing structural and vibrational properties of nanoparticles embedded in silica with XAS, SAXS and auxiliary techniques
Synchrotron-based techniques were combined with conventional analysis methods to probe in detail the structural and vibrational properties of nanoparticles grown in a silica matrix by ion implantation and thermal annealing, as well as the evolution of such properties as a function of nanoparticle si...
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| creator | Araujo, Leandro L Kluth, Patrick Giulian, Raquel Sprouster, David J Johannessen, Bernt an, Garry J Cookson, David J Ridgway, Mark C |
| description | Synchrotron-based techniques were combined with conventional analysis methods to probe in detail the structural and vibrational properties of nanoparticles grown in a silica matrix by ion implantation and thermal annealing, as well as the evolution of such properties as a function of nanoparticle size. This original approach was successfully applied for several elemental nanoparticles (Au, Co, Cu, Ge, Pt) and the outcomes for Ge are reported here, illustrating the power of this combined methodology. The thorough analysis of XANES, EXAFS, SAXS, TEM and Raman data for Ge nanoparticles with mean diameters between 4 and 9 nm revealed that the peculiar properties of embedded Ge nanoparticles, like the existence of amorphous Ge layers between the silica matrix and the crystalline nanoparticle core, are strongly dependent on particle size and mainly governed by the variation in the surface area-to-volume ratio. Such detailed information provides valuable input for the efficient planning of technological applications. |
| doi_str_mv | 10.1063/1.3086205 |
| format | Conference Proceeding |
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Kluth, Patrick ; Giulian, Raquel ; Sprouster, David J ; Johannessen, Bernt ; an, Garry J ; Cookson, David J ; Ridgway, Mark C</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-o214t-64f1b0cf7db64c6edf2290edec7d4c701312331d1b410455f1f6cd0eca4a16d83</frbrgroupid><rsrctype>conference_proceedings</rsrctype><prefilter>conference_proceedings</prefilter><language>eng</language><creationdate>2009</creationdate><topic>ABSORPTION SPECTROSCOPY</topic><topic>ANNEALING</topic><topic>COBALT</topic><topic>COPPER</topic><topic>FINE STRUCTURE</topic><topic>GERMANIUM</topic><topic>GOLD</topic><topic>ION IMPLANTATION</topic><topic>LAYERS</topic><topic>MATERIALS SCIENCE</topic><topic>NANOSTRUCTURES</topic><topic>PARTICLE SIZE</topic><topic>PARTICLES</topic><topic>PLATINUM</topic><topic>SILICA</topic><topic>SMALL ANGLE SCATTERING</topic><topic>SURFACE AREA</topic><topic>TRANSMISSION ELECTRON MICROSCOPY</topic><topic>X-RAY DIFFRACTION</topic><topic>X-RAY SPECTROSCOPY</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Araujo, Leandro L</creatorcontrib><creatorcontrib>Kluth, Patrick</creatorcontrib><creatorcontrib>Giulian, Raquel</creatorcontrib><creatorcontrib>Sprouster, David J</creatorcontrib><creatorcontrib>Johannessen, Bernt</creatorcontrib><creatorcontrib>an, Garry J</creatorcontrib><creatorcontrib>Cookson, David J</creatorcontrib><creatorcontrib>Ridgway, Mark C</creatorcontrib><collection>Engineered Materials Abstracts</collection><collection>Solid State and Superconductivity Abstracts</collection><collection>METADEX</collection><collection>Technology Research Database</collection><collection>Materials Research Database</collection><collection>Advanced Technologies Database with Aerospace</collection><collection>OSTI.GOV</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Araujo, Leandro L</au><au>Kluth, Patrick</au><au>Giulian, Raquel</au><au>Sprouster, David J</au><au>Johannessen, Bernt</au><au>an, Garry J</au><au>Cookson, David J</au><au>Ridgway, Mark C</au><format>book</format><genre>proceeding</genre><ristype>CONF</ristype><atitle>Characterizing structural and vibrational properties of nanoparticles embedded in silica with XAS, SAXS and auxiliary techniques</atitle><btitle>AIP conference proceedings</btitle><date>2009-01-01</date><risdate>2009</risdate><volume>1092</volume><issue>1</issue><spage>125</spage><epage>126</epage><pages>125-126</pages><issn>0094-243X</issn><eissn>1551-7616</eissn><isbn>0735406251</isbn><isbn>9780735406254</isbn><abstract>Synchrotron-based techniques were combined with conventional analysis methods to probe in detail the structural and vibrational properties of nanoparticles grown in a silica matrix by ion implantation and thermal annealing, as well as the evolution of such properties as a function of nanoparticle size. 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| fulltext | fulltext |
| identifier | ISSN: 0094-243X |
| ispartof | AIP conference proceedings, 2009, Vol.1092 (1), p.125-126 |
| issn | 0094-243X 1551-7616 |
| language | eng |
| recordid | cdi_osti_scitechconnect_21260222 |
| source | AIP Journals Complete |
| subjects | ABSORPTION SPECTROSCOPY ANNEALING COBALT COPPER FINE STRUCTURE GERMANIUM GOLD ION IMPLANTATION LAYERS MATERIALS SCIENCE NANOSTRUCTURES PARTICLE SIZE PARTICLES PLATINUM SILICA SMALL ANGLE SCATTERING SURFACE AREA TRANSMISSION ELECTRON MICROSCOPY X-RAY DIFFRACTION X-RAY SPECTROSCOPY |
| title | Characterizing structural and vibrational properties of nanoparticles embedded in silica with XAS, SAXS and auxiliary techniques |
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