Time-and-polarization-resolved acoustic microscopy of surface and subsurface cracks

Time-and-polarization-resolved acoustic microscopy of surface and subsurface cracks

Time-and-polarization-resolved acoustic microscopy with an improved-spatial-resolution line-focus transducer of simply reduced active element width is applied to characterize surface and subsurface cracks. From acoustic images obtained from scanning cracks in different transverse directions and orie...

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Hauptverfasser: Xiang, Dan, Hsu, Nelson N., Blessing, Gerald V.
Format: Tagungsbericht
Sprache:eng
Schlagworte:
ACOUSTIC MICROSCOPY
CRACKS
MATERIALS SCIENCE
NONDESTRUCTIVE TESTING
POLARIZATION
SPATIAL RESOLUTION
SPECTROSCOPY
STAINLESS STEELS
SURFACES
TIME RESOLUTION
TRANSDUCERS
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creator Xiang, Dan
Hsu, Nelson N.
Blessing, Gerald V.
description Time-and-polarization-resolved acoustic microscopy with an improved-spatial-resolution line-focus transducer of simply reduced active element width is applied to characterize surface and subsurface cracks. From acoustic images obtained from scanning cracks in different transverse directions and orientations, the presence, orientation, length and depth of cracks are induced.
doi_str_mv 10.1063/1.1302052
format Conference Proceeding
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identifier ISSN: 0094-243X
ispartof AIP conference proceedings, 1999, Vol.497 (1)
issn 0094-243X
1551-7616
language eng
recordid cdi_osti_scitechconnect_21207692
source AIP Journals Complete
subjects ACOUSTIC MICROSCOPY
CRACKS
MATERIALS SCIENCE
NONDESTRUCTIVE TESTING
POLARIZATION
SPATIAL RESOLUTION
SPECTROSCOPY
STAINLESS STEELS
SURFACES
TIME RESOLUTION
TRANSDUCERS
title Time-and-polarization-resolved acoustic microscopy of surface and subsurface cracks
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