Characteristics of the MBE1 End-Station at PNC/XOR

An end-station for in-situ characterization of thin films at the PNC/XOR undulator beamline, Sector 20 of the Advanced Photon Source, is detailed. The ability to study films in-situ on a beamline enables examination of surfaces and interfaces on freshly-prepared films, without the influence of a cap...

Ausführliche Beschreibung

Bibliographische Detailangaben

Hauptverfasser:	Gordon, R A, Crozier, E D, Jiang, D-T, Shoults, J, Barg, B, Budnik, P S
Format:	Tagungsbericht
Sprache:	eng
Schlagworte:	ABSORPTION SPECTROSCOPY ADVANCED PHOTON SOURCE FINE STRUCTURE INTERFACES LAYERS MATERIALS SCIENCE MOLECULAR BEAM EPITAXY PNC POLARIZATION REFLECTIVITY THIN FILMS WIGGLER MAGNETS X RADIATION X-RAY SPECTRA X-RAY SPECTROSCOPY
Online-Zugang:	Volltext
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