Electron impact collision strengths in Si IX, Si X, and Si XI
Electron impact collision strengths among 560 levels of Si IX, 320 levels of Si X, and 350 levels of Si XI have been calculated using the Flexible Atomic Code of Gu [M.F. Gu, Astrophys. J. 582 (2003) 1241]. Collision strengths Ω at 10 scattered electron energies, namely 10, 50, 100, 200, 400, 600, 8...
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creator | Liang, Guiyun Zhao, Gang Zeng, Jiaolong |
description | Electron impact collision strengths among 560 levels of Si IX, 320 levels of Si X, and 350 levels of Si XI have been calculated using the Flexible Atomic Code of Gu [M.F. Gu, Astrophys. J. 582 (2003) 1241]. Collision strengths
Ω at 10 scattered electron energies, namely 10, 50, 100, 200, 400, 600, 800, 1000, 1500, and 2000
eV, are reported. Assuming a Maxwellian energy distribution, effective collision strengths
ϒ are obtained on a finer electron temperature grid of 0.5, 1.0, 2.0, 3.0, 4.0, 5.0, and 6.0
MK, which covers the typical temperature range of astrophysical hot plasmas. Additionally, radiative rates
A and weighted oscillator strengths
gf are given for the more probable transitions among these levels. Comparisons of our results with available predictions reported in earlier literature are made and the accuracy of the data is assessed. Most transitions exhibit a good agreement, but large differences in
gf appear for a few cases, which are due to the different configuration interactions included in different theoretical calculations. For excitations among levels of the ground and lower excited configurations, large discrepancies of
ϒ may have resulted from the consideration of resonance effects in earlier works. |
doi_str_mv | 10.1016/j.adt.2006.12.001 |
format | Article |
fullrecord | <record><control><sourceid>elsevier_osti_</sourceid><recordid>TN_cdi_osti_scitechconnect_20976805</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><els_id>S0092640X06000751</els_id><sourcerecordid>S0092640X06000751</sourcerecordid><originalsourceid>FETCH-LOGICAL-c275t-aab03975ae1051626a5c73cdfa41524d1df205d9f2c765883e3cffb139a51cc43</originalsourceid><addsrcrecordid>eNp9UMFKAzEQDaJgrX6AtwWv7jqT3WR3EQ9SqhYKHlToLaSTrE1pd0sSBP_erPXsZd4wvPd48xi7RigQUN5tC21iwQFkgbwAwBM2QWgh52mcsglAy3NZweqcXYSwTQSsZDNhD_OdpeiHPnP7g6aY0bDbueDSIURv-8-4CZnrszeXLVa3I6Spe_O7LS7ZWad3wV794ZR9PM3fZy_58vV5MXtc5sRrEXOt11C2tdAWQaDkUguqSzKdrlDwyqDpOAjTdpxqKZqmtCV13RrLVgskqsopuzn6DiE6FchFSxsa-j5lV-nDWjYgEguPLPJDCN526uDdXvtvhaDGltRWpZbU2JJCrlIJSXN_1NgU_8tZP7rbnqxxfjQ3g_tH_QNGiG0F</addsrcrecordid><sourcetype>Open Access Repository</sourcetype><iscdi>true</iscdi><recordtype>article</recordtype></control><display><type>article</type><title>Electron impact collision strengths in Si IX, Si X, and Si XI</title><source>Elsevier ScienceDirect Journals</source><creator>Liang, Guiyun ; Zhao, Gang ; Zeng, Jiaolong</creator><creatorcontrib>Liang, Guiyun ; Zhao, Gang ; Zeng, Jiaolong</creatorcontrib><description>Electron impact collision strengths among 560 levels of Si IX, 320 levels of Si X, and 350 levels of Si XI have been calculated using the Flexible Atomic Code of Gu [M.F. Gu, Astrophys. J. 582 (2003) 1241]. Collision strengths
Ω at 10 scattered electron energies, namely 10, 50, 100, 200, 400, 600, 800, 1000, 1500, and 2000
eV, are reported. Assuming a Maxwellian energy distribution, effective collision strengths
ϒ are obtained on a finer electron temperature grid of 0.5, 1.0, 2.0, 3.0, 4.0, 5.0, and 6.0
MK, which covers the typical temperature range of astrophysical hot plasmas. Additionally, radiative rates
A and weighted oscillator strengths
gf are given for the more probable transitions among these levels. Comparisons of our results with available predictions reported in earlier literature are made and the accuracy of the data is assessed. Most transitions exhibit a good agreement, but large differences in
gf appear for a few cases, which are due to the different configuration interactions included in different theoretical calculations. For excitations among levels of the ground and lower excited configurations, large discrepancies of
ϒ may have resulted from the consideration of resonance effects in earlier works.</description><identifier>ISSN: 0092-640X</identifier><identifier>EISSN: 1090-2090</identifier><identifier>DOI: 10.1016/j.adt.2006.12.001</identifier><language>eng</language><publisher>United States: Elsevier Inc</publisher><subject>CONFIGURATION INTERACTION ; ELECTRON BEAMS ; ELECTRON COLLISIONS ; ELECTRON TEMPERATURE ; ENERGY SPECTRA ; EV RANGE ; EXCITATION ; HOT PLASMA ; KEV RANGE 01-10 ; NUCLEAR DATA COLLECTIONS ; NUCLEAR PHYSICS AND RADIATION PHYSICS ; OSCILLATOR STRENGTHS ; SILICON ; TEMPERATURE RANGE OVER 4000 K</subject><ispartof>Atomic data and nuclear data tables, 2007, Vol.93 (3), p.375-536</ispartof><rights>2007 Elsevier Inc.</rights><lds50>peer_reviewed</lds50><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-c275t-aab03975ae1051626a5c73cdfa41524d1df205d9f2c765883e3cffb139a51cc43</citedby><cites>FETCH-LOGICAL-c275t-aab03975ae1051626a5c73cdfa41524d1df205d9f2c765883e3cffb139a51cc43</cites></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://dx.doi.org/10.1016/j.adt.2006.12.001$$EHTML$$P50$$Gelsevier$$H</linktohtml><link.rule.ids>230,314,778,782,883,3539,4012,27906,27907,27908,45978</link.rule.ids><backlink>$$Uhttps://www.osti.gov/biblio/20976805$$D View this record in Osti.gov$$Hfree_for_read</backlink></links><search><creatorcontrib>Liang, Guiyun</creatorcontrib><creatorcontrib>Zhao, Gang</creatorcontrib><creatorcontrib>Zeng, Jiaolong</creatorcontrib><title>Electron impact collision strengths in Si IX, Si X, and Si XI</title><title>Atomic data and nuclear data tables</title><description>Electron impact collision strengths among 560 levels of Si IX, 320 levels of Si X, and 350 levels of Si XI have been calculated using the Flexible Atomic Code of Gu [M.F. Gu, Astrophys. J. 582 (2003) 1241]. Collision strengths
Ω at 10 scattered electron energies, namely 10, 50, 100, 200, 400, 600, 800, 1000, 1500, and 2000
eV, are reported. Assuming a Maxwellian energy distribution, effective collision strengths
ϒ are obtained on a finer electron temperature grid of 0.5, 1.0, 2.0, 3.0, 4.0, 5.0, and 6.0
MK, which covers the typical temperature range of astrophysical hot plasmas. Additionally, radiative rates
A and weighted oscillator strengths
gf are given for the more probable transitions among these levels. Comparisons of our results with available predictions reported in earlier literature are made and the accuracy of the data is assessed. Most transitions exhibit a good agreement, but large differences in
gf appear for a few cases, which are due to the different configuration interactions included in different theoretical calculations. For excitations among levels of the ground and lower excited configurations, large discrepancies of
ϒ may have resulted from the consideration of resonance effects in earlier works.</description><subject>CONFIGURATION INTERACTION</subject><subject>ELECTRON BEAMS</subject><subject>ELECTRON COLLISIONS</subject><subject>ELECTRON TEMPERATURE</subject><subject>ENERGY SPECTRA</subject><subject>EV RANGE</subject><subject>EXCITATION</subject><subject>HOT PLASMA</subject><subject>KEV RANGE 01-10</subject><subject>NUCLEAR DATA COLLECTIONS</subject><subject>NUCLEAR PHYSICS AND RADIATION PHYSICS</subject><subject>OSCILLATOR STRENGTHS</subject><subject>SILICON</subject><subject>TEMPERATURE RANGE OVER 4000 K</subject><issn>0092-640X</issn><issn>1090-2090</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2007</creationdate><recordtype>article</recordtype><recordid>eNp9UMFKAzEQDaJgrX6AtwWv7jqT3WR3EQ9SqhYKHlToLaSTrE1pd0sSBP_erPXsZd4wvPd48xi7RigQUN5tC21iwQFkgbwAwBM2QWgh52mcsglAy3NZweqcXYSwTQSsZDNhD_OdpeiHPnP7g6aY0bDbueDSIURv-8-4CZnrszeXLVa3I6Spe_O7LS7ZWad3wV794ZR9PM3fZy_58vV5MXtc5sRrEXOt11C2tdAWQaDkUguqSzKdrlDwyqDpOAjTdpxqKZqmtCV13RrLVgskqsopuzn6DiE6FchFSxsa-j5lV-nDWjYgEguPLPJDCN526uDdXvtvhaDGltRWpZbU2JJCrlIJSXN_1NgU_8tZP7rbnqxxfjQ3g_tH_QNGiG0F</recordid><startdate>2007</startdate><enddate>2007</enddate><creator>Liang, Guiyun</creator><creator>Zhao, Gang</creator><creator>Zeng, Jiaolong</creator><general>Elsevier Inc</general><scope>AAYXX</scope><scope>CITATION</scope><scope>OTOTI</scope></search><sort><creationdate>2007</creationdate><title>Electron impact collision strengths in Si IX, Si X, and Si XI</title><author>Liang, Guiyun ; Zhao, Gang ; Zeng, Jiaolong</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c275t-aab03975ae1051626a5c73cdfa41524d1df205d9f2c765883e3cffb139a51cc43</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2007</creationdate><topic>CONFIGURATION INTERACTION</topic><topic>ELECTRON BEAMS</topic><topic>ELECTRON COLLISIONS</topic><topic>ELECTRON TEMPERATURE</topic><topic>ENERGY SPECTRA</topic><topic>EV RANGE</topic><topic>EXCITATION</topic><topic>HOT PLASMA</topic><topic>KEV RANGE 01-10</topic><topic>NUCLEAR DATA COLLECTIONS</topic><topic>NUCLEAR PHYSICS AND RADIATION PHYSICS</topic><topic>OSCILLATOR STRENGTHS</topic><topic>SILICON</topic><topic>TEMPERATURE RANGE OVER 4000 K</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Liang, Guiyun</creatorcontrib><creatorcontrib>Zhao, Gang</creatorcontrib><creatorcontrib>Zeng, Jiaolong</creatorcontrib><collection>CrossRef</collection><collection>OSTI.GOV</collection><jtitle>Atomic data and nuclear data tables</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Liang, Guiyun</au><au>Zhao, Gang</au><au>Zeng, Jiaolong</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Electron impact collision strengths in Si IX, Si X, and Si XI</atitle><jtitle>Atomic data and nuclear data tables</jtitle><date>2007</date><risdate>2007</risdate><volume>93</volume><issue>3</issue><spage>375</spage><epage>536</epage><pages>375-536</pages><issn>0092-640X</issn><eissn>1090-2090</eissn><abstract>Electron impact collision strengths among 560 levels of Si IX, 320 levels of Si X, and 350 levels of Si XI have been calculated using the Flexible Atomic Code of Gu [M.F. Gu, Astrophys. J. 582 (2003) 1241]. Collision strengths
Ω at 10 scattered electron energies, namely 10, 50, 100, 200, 400, 600, 800, 1000, 1500, and 2000
eV, are reported. Assuming a Maxwellian energy distribution, effective collision strengths
ϒ are obtained on a finer electron temperature grid of 0.5, 1.0, 2.0, 3.0, 4.0, 5.0, and 6.0
MK, which covers the typical temperature range of astrophysical hot plasmas. Additionally, radiative rates
A and weighted oscillator strengths
gf are given for the more probable transitions among these levels. Comparisons of our results with available predictions reported in earlier literature are made and the accuracy of the data is assessed. Most transitions exhibit a good agreement, but large differences in
gf appear for a few cases, which are due to the different configuration interactions included in different theoretical calculations. For excitations among levels of the ground and lower excited configurations, large discrepancies of
ϒ may have resulted from the consideration of resonance effects in earlier works.</abstract><cop>United States</cop><pub>Elsevier Inc</pub><doi>10.1016/j.adt.2006.12.001</doi><tpages>162</tpages></addata></record> |
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subjects | CONFIGURATION INTERACTION ELECTRON BEAMS ELECTRON COLLISIONS ELECTRON TEMPERATURE ENERGY SPECTRA EV RANGE EXCITATION HOT PLASMA KEV RANGE 01-10 NUCLEAR DATA COLLECTIONS NUCLEAR PHYSICS AND RADIATION PHYSICS OSCILLATOR STRENGTHS SILICON TEMPERATURE RANGE OVER 4000 K |
title | Electron impact collision strengths in Si IX, Si X, and Si XI |
url | https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-01-17T06%3A28%3A29IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-elsevier_osti_&rft_val_fmt=info:ofi/fmt:kev:mtx:journal&rft.genre=article&rft.atitle=Electron%20impact%20collision%20strengths%20in%20Si%20IX,%20Si%20X,%20and%20Si%20XI&rft.jtitle=Atomic%20data%20and%20nuclear%20data%20tables&rft.au=Liang,%20Guiyun&rft.date=2007&rft.volume=93&rft.issue=3&rft.spage=375&rft.epage=536&rft.pages=375-536&rft.issn=0092-640X&rft.eissn=1090-2090&rft_id=info:doi/10.1016/j.adt.2006.12.001&rft_dat=%3Celsevier_osti_%3ES0092640X06000751%3C/elsevier_osti_%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_id=info:pmid/&rft_els_id=S0092640X06000751&rfr_iscdi=true |